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10.5555/792770.793721guideproceedingsArticle/Chapter ViewAbstractPublication PagesConference Proceedingsacm-pubtype
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Functional verification of the superscalar SH-4 microprocessor

Published: 23 February 1997 Publication History

Abstract

Functional verification of modern complex processors is a formidable and time consuming task. In spite of substantial manual effort, it is extremely difficult to systematically cover the corner cases of the control logic design, within a short processor design cycle. The SH4 processor is a dual issue superscalar RISC architecture with extensive hardware support for 3D graphics. We present the development of a semi automated methodology for functional verification. In particular, we elaborate a scheme to automatically generate test programs to verify the superscalar issue logic, bypass/multi bypass logic and stall logic, starting from the microarchitectural specification. Finally, we present the Random Test Generation methodology and the specific Random Test Generators.

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  1. Functional verification of the superscalar SH-4 microprocessor

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    cover image Guide Proceedings
    COMPCON '97: Proceedings of the 42nd IEEE International Computer Conference
    February 1997
    ISBN:0818678046

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    IEEE Computer Society

    United States

    Publication History

    Published: 23 February 1997

    Author Tags

    1. 3D graphics
    2. Random Test Generation methodology
    3. Random Test Generators
    4. SH4 processor
    5. automatic test program generation
    6. bypass/multi bypass logic
    7. computer testing
    8. control logic design
    9. dual issue superscalar RISC architecture
    10. functional verification
    11. hardware support
    12. microarchitectural specification
    13. modern complex processors
    14. semi automated methodology
    15. short processor design cycle
    16. stall logic
    17. superscalar SH-4 microprocessor
    18. superscalar issue logic

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