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ORCIDSoumendu Bhattacharya
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2010 – 2019
- 2013
[c24]Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee:
Predicting die-level process variations from wafer test data for analog devices: A feasibility study. LATW 2013: 1-6- 2012
- [j11]Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee:
Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures. IEEE Des. Test Comput. 29(1): 48-58 (2012) - [j10]Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya:
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(7): 1088-1101 (2012) - 2011
- [c23]Aritra Banerjee, Vishwanath Natarajan, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Soumendu Bhattacharya:
Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation. VLSI Design 2011: 274-279 - 2010
- [c22]Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee:
Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures. VTS 2010: 337-342
2000 – 2009
- 2009
- [j9]Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee:
Efficient EVM Testing of Wireless OFDM Transceivers Using Null Carriers. IEEE Trans. Very Large Scale Integr. Syst. 17(6): 803-814 (2009) - [c21]Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan:
Iterative built-in testing and tuning of mixed-signal/RF systems. ICCD 2009: 319-326 - 2008
- [j8]Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee:
System-Level Specification Testing Of Wireless Transceivers. IEEE Trans. Very Large Scale Integr. Syst. 16(3): 263-276 (2008) - [c20]Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee:
Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. VTS 2008: 175-180 - 2007
- [j7]Donghoon Han, Soumendu Bhattacharya, Abhijit Chatterjee:
Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection. IET Comput. Digit. Tech. 1(3): 170-179 (2007) - [j6]Ramakrishna Voorakaranam, Selim Sermet Akbay, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee:
Signature Testing of Analog and RF Circuits: Algorithms and Methodology. IEEE Trans. Circuits Syst. I Regul. Pap. 54-I(5): 1018-1031 (2007) - [c19]Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee:
Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors. VTS 2007: 125-130 - 2006
- [j5]Soumendu Bhattacharya, Abhijit Chatterjee:
A DFT Approach for Testing Embedded Systems Using DC Sensors. IEEE Des. Test Comput. 23(6): 464-475 (2006) - [j4]Soumendu Bhattacharya, Sankar Nair
, Abhijit Chatterjee:
An Accurate DNA Sensing and Diagnosis Methodology Using Fabricated Silicon Nanopores. IEEE Trans. Circuits Syst. I Regul. Pap. 53-I(11): 2377-2383 (2006) - [c18]Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee:
Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. ETS 2006: 35-42 - [c17]Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee:
Low Cost Parametric Failure Diagnosis of RF Transceivers. ETS 2006: 205-212 - [c16]Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee:
Probabilistic Error Correction in Linear Digital Filters Using Checksum Codes. LATW 2006: 192-197 - [c15]Soumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair:
Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms. VLSI Design 2006: 729-733 - [c14]Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee:
Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. VTS 2006: 192-199 - [c13]Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee:
Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction. VTS 2006: 208-213 - 2005
- [b1]Soumendu Bhattacharya:
Alternate Testing of Analog and RF Systems using Extracted Test Response Features. Georgia Institute of Technology, Atlanta, GA, USA, 2005 - [j3]Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee:
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. J. Electron. Test. 21(3): 323-339 (2005) - [j2]Soumendu Bhattacharya, Abhijit Chatterjee:
Optimized wafer-probe and assembled package test design for analog circuits. ACM Trans. Design Autom. Electr. Syst. 10(2): 303-329 (2005) - [c12]Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt:
On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). IOLTS 2005: 106-111 - [c11]Soumendu Bhattacharya, Rajarajan Senguttuvan, Abhijit Chatterjee:
Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF. ITC 2005: 10 - [c10]Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee:
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. VLSI Design 2005: 289-294 - [c9]Soumendu Bhattacharya, Abhijit Chatterjee:
Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices. VTS 2005: 137-142 - 2004
- [c8]Soumendu Bhattacharya, Abhijit Chatterjee:
A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits. Asian Test Symposium 2004: 68-73 - [c7]Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee:
Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. DATE 2004: 280-285 - [c6]Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee:
Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. DELTA 2004: 372-377 - [c5]Soumendu Bhattacharya, Abhijit Chatterjee:
Use of Embedded Sensors for Built-In-Test of RF Circuits. ITC 2004: 801-809 - [c4]Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee:
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. VTS 2004: 229-236 - 2003
- [c3]Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee:
Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. ITC 2003: 665-673 - [c2]Soumendu Bhattacharya, Abhijit Chatterjee:
High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost. VTS 2003: 89-100 - 2002
- [c1]Soumendu Bhattacharya, Abhijit Chatterjee:
Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models. DELTA 2002: 25-32
1990 – 1999
- 1993
- [j1]Abhijit Chatterjee, Partha Pratim Das, Soumendu Bhattacharya:
Visualization in linear programming using parallel coordinates. Pattern Recognit. 26(11): 1725-1736 (1993)
Coauthor Index
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