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ORCID27th ETS 2022: Barcelona, Spain
- IEEE European Test Symposium, ETS 2022, Barcelona, Spain, May 23-27, 2022. IEEE 2022, ISBN 978-1-6654-6706-3
- Rezgar Sadeghi, Ehsan Akbari, Mohamad Ali Saber:
On-Chip Training of Crosstalk Predictors to Fit Uncertainties. 1-2 - S. Lapeyre, Nicolas Valette, Marc Merandat, Marie-Lise Flottes, Bruno Rouzeyre, Arnaud Virazel
:
A Lightweight, Plug-and-Play and Autonomous JTAG Authentication IP for Secure Device Testing. 1-4 - Alban Haynse Immanuel, Jeyendran Nithyanadam:
WLAN Rx PER Test Implementation in ATE. 1-4 - Likith Kumar Manchukonda, Karthikeyan Natarajan, Manish Arora:
Power Aware Test. 1 - Nooshin Nosrati, Seyedeh Maryam Ghasemi, Mahboobe Sadeghipour Roodsari, Zainalabedin Navabi:
Concurrent Error Detection for LSTM Accelerators. 1-2 - Jiebing Wu, Yongsheng Sun, Yuan Wang, Yukai Lin, Mingna Fan, Junlin Huang:
Research on Path Delay with BTI Recovery Effect. 1-4 - Troya Çagil Köylü, Said Hamdioui, Mottaqiallah Taouil:
Smart Redundancy Schemes for ANNs Against Fault Attacks. 1-2 - Tobias Kilian, Markus Hanel, Daniel Tille, Martin Huch, Ulf Schlichtmann:
Reducing Routing Overhead by Self-Enabling Functional Path Ring Oscillators. 1-6 - Nadun Sinhabahu, Jian-De Li, Katherine Shu-Min Li, Sying-Jyan Wang, Tsung-Yi Ho:
Trojan Insertions of Fully Programmable Valve Arrays. 1-2 - Francesco Angione, Davide Appello, J. Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, J. Guerrero, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli:
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. 1-10 - Abraham Steenhoek, Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Graph Theory Approach for Multi-site ATE Board Parameter Extraction. 1-2 - Riccardo Cantoro, Francesco Garau, Patrick Girard, Nima Kolahimahmoudi, Sandro Sartoni, Matteo Sonza Reorda, Arnaud Virazel:
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries. 1-2 - Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli:
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. 1-6 - Jonti Talukdar, Arjun Chaudhuri, Krishnendu Chakrabarty:
TaintLock: Preventing IP Theft through Lightweight Dynamic Scan Encryption using Taint Bits*. 1-6 - Mohamed Thouabtia, Alexander Stephan Oleszczuk, Thomas Girg, Martin Allinger:
Novel Method to Measure Common Mode Transient Immunity of Isolators. 1-2 - Sergio Vinagrero Gutierrez:
Memristor-based security primitives. 1-2 - Hongfei Wang, Zhanfei Wu, Wei Liu:
CNN-based Data-Model Co-Design for Efficient Test-termination Prediction. 1-6 - Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak:
X-Masking for In-System Deterministic Test. 1-6 - Zhe Zhang, Jan Lappas, André Lucas Chinazzo, Christian Weis, Zhihang Wu, Leibin Ni, Norbert Wehn, Mehdi B. Tahoori:
Machine learning based soft error rate estimation of pass transistor logic in high-speed communication. 1-4 - Anteneh Gebregiorgis, Artemis Zografou, Said Hamdioui:
RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs). 1-2 - Parvez Anwar Chanawala, Ian Hill, S. Arash Sheikholeslam, André Ivanov:
Prediction of Thermally Accelerated Aging Process at 28nm. 1-2 - Hussam Amrouch, Krishnendu Chakrabarty, Dirk Pflüger, Ilia Polian, Matthias Sauer, Matteo Sonza Reorda:
Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization. 1-6 - Sergio Vinagrero Gutierrez, Giorgio Di Natale, Elena-Ioana Vatajelu:
On-Line Reliability Estimation of Ring Oscillator PUF. 1-2 - Katharina Ruep, Daniel Große:
SpinalFuzz: Coverage-Guided Fuzzing for SpinalHDL Designs. 1-4 - Soyed Tuhin Ahmed, Mahta Mayahinia, Michael Hefenbrock, Christopher Münch, Mehdi B. Tahoori:
Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric. 1-2 - Gyohun Jeong, Sangmin Kim, Hyelyun Kim, Sunghee Lee:
A Novel Collaborative SSD Test Case Clustering Method Associating I/O Workload and Function Coverage. 1-2 - Florian Neugebauer, Stefan Holst, Ilia Polian:
On the Impact of Hardware Timing Errors on Stochastic Computing based Neural Networks. 1-6 - Arunkumar Vijayan, Mehdi B. Tahoori, Ewald Kintzli, Timm Lohmann, Juergen Hans Handl:
A Data-driven Approach for Fault Detection in the Alternator Unit of Automotive Systems. 1-4 - Andrew Dobis, Hans Jakob Damsgaard, Enrico Tolotto, Kasper Hesse, Tjark Petersen, Martin Schoeberl:
Enabling Coverage-Based Verification in Chisel. 1-6 - Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi B. Tahoori:
PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. 1-6 - Jayeeta Chaudhuri, Krishnendu Chakrabarty:
Detection of Malicious FPGA Bitstreams using CNN-Based Learning. 1-2 - Vahid Eftekhari Moghadam, Paolo Prinetto, Gianluca Roascio:
Real-Time Control-Flow Integrity for Multicore Mixed-Criticality IoT Systems. 1-4 - Zahra Paria Najafi-Haghi, Florian Klemme, Hussam Amrouch, Hans-Joachim Wunderlich:
On Extracting Reliability Information from Speed Binning. 1-4 - Paolo Bernardi, Giorgio Insinga, G. Paganini, Riccardo Cantoro, P. Beer, M. Coppetta, N. Mautone, G. Carnevale, Pierre Scaramuzza, Rudolf Ullmann:
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. 1-6 - Lucas Matana Luza, Frederic Wrobel, Luis Entrena, Luigi Dilillo:
Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices. 1-10 - Alexander Stephan Oleszczuk, Mohamed Thouabtia, Martin Allinger, Jürgen Röber, Robert Weigel:
Novel Design For Test (DFT) Concept to Check the Spectral Mask Compliance Defined in the IEEE Std. 802.15.6-2012 of Wireless-Body-Area-Network (WBAN) IC-Devices. 1-2 - J. Lefevre, P. Debaud, Patrick Girard, Arnaud Virazel:
A Generic Fast and Low Cost BIST Solution for CMOS Image Sensors. 1-2 - Marcel Merten, Sebastian Huhn, Rolf Drechsler:
Quality Assessment of RFET-based Logic Locking Protection Mechanisms using Formal Methods. 1-2 - Yogendra Sao, Anjum Riaz, Satyadev Ahlawat, Sk Subidh Ali:
Evaluating Security of New Locking SIB-based Architectures. 1-6 - William R. Eisenstadt, Mark Roos, Devin Morris, José Luis González-Jiménez, Christopery Mounet, Manuel J. Barragán, Gildas Léger, Florent Cilici, Estelle Lauga-Larroze, Salvador Mir, Sylvain Bourdel, Marc Margalef-Rovira, Issa Alaji, Haitham Ghanem, Guillaume Ducournau, Christophe Gaquière:
Special Session on RF/5G Test. 1-9 - Michail Moraitis, Elena Dubrova:
FPGA Design Deobfuscation by Iterative LUT Modifications at Bitstream Level. 1-2 - Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Maria Veiras Bolzani, Said Hamdioui:
Hierarchical Memory Diagnosis. 1-2 - Johanna Sepúlveda, Dominik Winkler:
Super Acceleration of Dilithium in MPSoCs Critical Environments. 1-4 - Vladimir A. Zivkovic, Michele Palazzi, Ming Chuen Alvan Lam, Mogens Isager:
AMS Test Vector Generation using AMS Verification and IEEE P1687.2. 1-4
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last updated on 2024-12-26 00:35 CET by the dblp team
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