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ORCIDJohn M. Carulli Jr.
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2020 – today
- 2024
[j9]Ke Huang
, Yu Liu, Nenad Korolija, John M. Carulli, Yiorgos Makris:
Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond. IEEE Des. Test 41(2): 15-22 (2024)- [c30]Matthew Nigh, John M. Carulli, Yiorgos Makris:
Generation and Quality Evaluation of Synthetic Process Control Monitoring Data. ITC 2024: 226-232
2010 – 2019
- 2017
- [j8]Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris:
Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(12): 2120-2133 (2017) - [c29]Chuanhe Jay Shan, Pietro Babighian, Yan Pan, John M. Carulli, Li-C. Wang:
Systematic defect detection methodology for volume diagnosis: A data mining perspective. ITC 2017: 1-10 - 2016
- [j7]Senthil Arasu, Mehrdad Nourani, John M. Carulli, Vijay Reddy:
Controlling Aging in Timing-Critical Paths. IEEE Des. Test 33(4): 82-91 (2016) - [c28]Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng:
Variation and failure characterization through pattern classification of test data from multiple test stages. ITC 2016: 1-10 - [c27]Yan Pan, Rao Desineni, Kannan Sekar, Atul Chittora, Sherwin Fernandes, Neerja Bawaskar, John M. Carulli:
Pylon: Towards an integrated customizable volume diagnosis infrastructure. ITC 2016: 1-9 - [c26]Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli:
Consistency in wafer based outlier screening. VTS 2016: 1-6 - 2015
- [j6]Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris:
Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models. IEEE Des. Test 32(1): 53-60 (2015) - [j5]Ke Huang, Yu Liu, Nenad Korolija, John M. Carulli, Yiorgos Makris:
Recycled IC Detection Based on Statistical Methods. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(6): 947-960 (2015) - [c25]Hugo R. Gonçalves, Xin Li, Miguel V. Correia, Vítor Tavares, John M. Carulli Jr., Kenneth M. Butler:
A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits. DATE 2015: 1042-1047 - [c24]Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris:
Yield prognosis for fab-to-fab product migration. VTS 2015: 1-6 - 2014
- [j4]Senthil Arasu, Mehrdad Nourani, Vijay Reddy, John M. Carulli Jr., Gautam Kapila, Min Chen:
Reliability improvement of logic and clock paths in power-efficient designs. ACM J. Emerg. Technol. Comput. Syst. 10(1): 3:1-3:23 (2014) - [j3]Ujjwal Guin, Ke Huang, Daniel DiMase, John M. Carulli, Mohammad Tehranipoor, Yiorgos Makris:
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain. Proc. IEEE 102(8): 1207-1228 (2014) - [c23]Senthil Arasu, Mehrdad Nourani, Frank Cano, John M. Carulli, Vijay Reddy:
Asymmetric aging of clock networks in power efficient designs. ISQED 2014: 484-486 - [c22]Ali Ahmadi, Ke Huang, Suriyaprakash Natarajan, John M. Carulli Jr., Yiorgos Makris:
Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation. ITC 2014: 1-10 - [c21]Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris:
IC laser trimming speed-up through wafer-level spatial correlation modeling. ITC 2014: 1-7 - [c20]Shanghang Zhang, Xin Li, Ronald D. Blanton, José Machado da Silva, John M. Carulli Jr., Kenneth M. Butler:
Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling. ITC 2014: 1-10 - [c19]Sounil Biswas, John M. Carulli, Dragoljub Gagi Drmanac, Arpan Bhattacherjee:
Innovative practices session 5C: Machine learning and data analysis in test. VTS 2014: 1 - [c18]John M. Carulli:
Special session 11B: ITRS adaptive test update. VTS 2014: 1 - 2013
- [c17]Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris:
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests. DATE 2013: 553-558 - [c16]Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris:
On combining alternate test with spatial correlation modeling in analog/RF ICs. ETS 2013: 1-6 - [c15]Senthil Arasu, Mehrdad Nourani, Vijay Reddy, John M. Carulli:
Performance entitlement by exploiting transistor's BTI recovery. ISQED 2013: 341-346 - [c14]Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy:
A design-for-reliability approach based on grading library cells for aging effects. ITC 2013: 1-7 - [c13]Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler:
Test data analytics - Exploring spatial and test-item correlations in production test data. ITC 2013: 1-10 - [c12]Ke Huang, John M. Carulli, Yiorgos Makris:
Counterfeit electronics: A rising threat in the semiconductor manufacturing industry. ITC 2013: 1-4 - [c11]Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris:
Process monitoring through wafer-level spatial variation decomposition. ITC 2013: 1-10 - [c10]Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee:
Predicting die-level process variations from wafer test data for analog devices: A feasibility study. LATW 2013: 1-6 - 2012
- [c9]Ke Huang, John M. Carulli Jr., Yiorgos Makris:
Parametric counterfeit IC detection via Support Vector Machines. DFT 2012: 7-12 - [c8]Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris:
Spatial correlation modeling for probe test cost reduction in RF devices. ICCAD 2012: 23-29 - [c7]Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris:
Spatial estimation of wafer measurement parameters using Gaussian process models. ITC 2012: 1-8 - 2011
- [c6]Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar:
Die-level adaptive test: Real-time test reordering and elimination. ITC 2011: 1-10 - 2010
- [c5]Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli:
Adapting to adaptive testing. DATE 2010: 556-561
2000 – 2009
- 2009
- [j2]Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch:
Multidimensional Test Escape Rate Modeling. IEEE Des. Test Comput. 26(5): 74-82 (2009) - [c4]Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger:
Quality improvement and cost reduction using statistical outlier methods. ICCD 2009: 64-69 - 2008
- [c3]Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena:
Modeling Test Escape Rate as a Function of Multiple Coverages. ITC 2008: 1-9 - 2006
- [j1]John M. Carulli Jr., Thomas J. Anderson:
The Impact of Multiple Failure Modes on Estimating Product Field Reliability. IEEE Des. Test Comput. 23(2): 118-126 (2006) - 2005
- [c2]John M. Carulli Jr., Thomas J. Anderson:
Test connections - tying application to process. ITC 2005: 8 - 2004
- [c1]Vijay Reddy, John M. Carulli, Anand T. Krishnan, William Bosch, Brendan Burgess:
Impact of Negative Bias Temperature Instability on Product Parametric Drift. ITC 2004: 148-155
Coauthor Index
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