"Multidimensional Test Escape Rate Modeling."

Kenneth M. Butler et al. (2009)

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DOI: 10.1109/MDT.2009.118

access: closed

type: Journal Article

metadata version: 2020-05-17

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Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch:
Multidimensional Test Escape Rate Modeling. IEEE Des. Test Comput. 26(5): 74-82 (2009)

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