default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDChao-Wen Tseng
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2016
[j2]Chao-Wen Tseng, Yu-Chang Chen, Chua-Huang Huang:
A Design of GS1 EPCglobal Application Level Events Extension for IoT Applications. IEICE Trans. Inf. Syst. 99-D(1): 30-39 (2016)- 2014
- [c14]Chao-Wen Tseng, Chua-Huang Huang:
A uniform EPC scheme design of IEEE 1451 transducers for IoT applications. ICUFN 2014: 255-260 - [c13]Chao-Wen Tseng, Yu-Sheng Lin, Wei-Han Lu, Chua-Huang Huang:
Extending EPCglobal ALE middleware to integrate transducer capability of IEEE 1451 standards. ICUFN 2014: 289-294 - [c12]Chao-Wen Tseng, Yi-Ting Liao, Chua-Huang Huang:
Adding IEEE 1451 Transducer Capability to EPCglobal Information Service. iThings/GreenCom/CPSCom 2014: 264-271 - 2012
- [c11]Chao-Wen Tseng, Chih-Ming Chang, Chua-Huang Huang:
Complex sensing event process of IoT application based on epcglobal architecture and IEEE 1451. IOT 2012: 92-98
2000 – 2009
- 2008
- [j1]James Chien-Mo Li, Po-Chou Lin, Chih-Ming Chiang, Chuo-Jan Pan, Chao-Wen Tseng:
Effective and Economic Phase Noise Testing for Single-Chip TV Tuners. IEEE Trans. Instrum. Meas. 57(10): 2265-2272 (2008) - 2004
- [c10]Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra:
ELF-Murphy Data on Defects and Test Sets. VTS 2004: 16-22 - 2002
- [c9]Chao-Wen Tseng, James Li, Edward J. McCluskey:
Experimental Results for Slow-Speed Testing. VTS 2002: 37-42 - 2001
- [c8]Chao-Wen Tseng, Edward J. McCluskey:
Multiple-output propagation transition fault test. ITC 2001: 358-366 - [c7]Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey:
Testing for resistive opens and stuck opens. ITC 2001: 1049-1058 - [c6]Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh:
MINVDD Testing for Weak CMOS ICs. VTS 2001: 339-345 - [c5]Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson:
An Evaluation of Pseudo Random Testing for Detecting Real Defects. VTS 2001: 404-410 - 2000
- [c4]Edward J. McCluskey, Chao-Wen Tseng:
Stuck-fault tests vs. actual defects. ITC 2000: 336-343 - [c3]Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu:
Cold Delay Defect Screening. VTS 2000: 183-188
1990 – 1999
- 1998
- [c2]Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey:
Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. ITC 1998: 184-193 - [c1]Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey:
Experimental Results for IDDQ and VLV Testing. VTS 1998: 118-125
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-25 05:44 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
