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2020 – today
- 2023
[j20]Senling Wang
, Xihong Zhou, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima:
Test Point Insertion for Multi-Cycle Power-On Self-Test. ACM Trans. Design Autom. Electr. Syst. 28(3): 46:1-46:21 (2023)- [c13]Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima, Oussama Laouamri, Naveen Khanna, Jeff Mayer, Nilanjan Mukherjee:
A New Framework for RTL Test Points Insertion Facilitating a "Shift-Left DFT" Strategy. ITC 2023: 1-10 - 2021
- [c12]Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima:
A Power Reduction Method for Scan Testing in Ultra-Low Power Designs. ATS 2021: 141 - 2020
- [j19]Hanan T. Al-Awadhi, Tomoki Aono, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima:
FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST. IEICE Trans. Inf. Syst. 103-D(11): 2289-2301 (2020)
2010 – 2019
- 2019
- [j18]Tomoya Hatano, Junichi Kani, Yoichi Maeda:
Standardization and Technology Trends in Optical, Wireless and Virtualized Access Systems. IEICE Trans. Commun. 102-B(7): 1263-1269 (2019) - 2018
- [c11]Senling Wang, Tomoki Aono, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima:
Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST. ATS 2018: 155-160 - [c10]Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima:
Fault-detection-strengthened method to enable the POST for very-large automotive MCU in compliance with ISO26262. ETS 2018: 1-2 - [c9]Koji Asami, Yoshiro Tamura, Haruo Kobayashi, Jun Matsushima, Yoichi Maeda, Kazumi Hatayama:
Innovative practices on test in Japan. VTS 2018: 1 - 2017
- [c8]Yoichi Maeda, Jun Matsushima, Ron Press:
Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test. ATS 2017: 237-241 - [c7]Yoichi Maeda:
Active Learning with Dynamic Geometry Software. ICCSA (4) 2017: 228-239 - 2014
- [j17]Mostafa Hashem Sherif, Yoichi Maeda, Kai Jakobs, Martin Adolph:
Selected papers from the Fifth ITU Kaleidoscope Academic Conference [Series Editorial]. IEEE Commun. Mag. 52(1): 174-175 (2014) - 2013
- [j16]Mostafa Hashem Sherif, Yoichi Maeda:
Standards dynamics for digital broadcasting, internet address authentication, and low-rate personal area networks [Series Editorial]. IEEE Commun. Mag. 51(4): 56-57 (2013) - [j15]Mostafa Hashem Sherif, Yoichi Maeda:
Standards for efficient delivery of future services [Series Editorial]. IEEE Commun. Mag. 51(10): 74-75 (2013) - 2012
- [j14]Mostafa Hashem Sherif, Kai Jakobs, Martin Adolph, Yoichi Maeda:
The 4th ITU kaleidoscope conference "The fully networked human? innovations for future networks and services". IEEE Commun. Mag. 50(8): 135-136 (2012) - [c6]Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima, Masahiro Takakura:
An Effective At-Speed Scan Testing Approach Using Multiple-Timing Clock Waveforms. Asian Test Symposium 2012: 1 - 2010
- [j13]Frank J. Effenberger, Junichi Kani, Yoichi Maeda:
Standardization trends and prospective views on the next generation of broadband optical access systems. IEEE J. Sel. Areas Commun. 28(6): 773-780 (2010)
2000 – 2009
- 2008
- [j12]Yoichi Maeda, Koichi Asatani:
ITU-T international standards in information and communications technologies. IEEE Commun. Mag. 46(10): 94-95 (2008) - [j11]Kenji Nakanishi, Akihiro Otaka, Yoichi Maeda:
Standardization Activities on Broadband Access Systems. IEICE Trans. Commun. 91-B(8): 2454-2461 (2008) - [c5]Jun Matsushima, Yoichi Maeda, Masahiro Takakura:
CooLBIST: An Effective Approach of Test Power Reduction for LBIST. ATS 2008: 264 - 2007
- [j10]Yoichi Maeda, Geoff Thompson, Bilel Jamoussi:
Standardization Trends for Carrier-Class Ethernet in ITU-T and IEEE 802 [Guest Editorial]. IEEE Commun. Mag. 45(12): 110-111 (2007) - [c4]Yoichi Maeda:
Seven Types of Random Spherical Triangle in S n and Their Probabilities. KyotoCGGT 2007: 119-126 - 2006
- [j9]Yoichi Maeda:
Standardization trends of next generation optical access systems. IEEE Commun. Mag. 44(10): 30-31 (2006) - [j8]Yoichi Maeda:
Special Section on the Next Generation Ethernet Technologies. IEICE Trans. Commun. 89-B(3): 643 (2006) - [j7]Youichi Fukada, Takeshi Yasuda, Shuji Komatsu, Koichi Saito, Yoichi Maeda, Yasuyuki Okumura:
Adaptive Clock Recovery Method Utilizing Proportional-Integral-Derivative (PID) Control for Circuit Emulation. IEICE Trans. Commun. 89-B(3): 690-695 (2006) - 2005
- [j6]Yoichi Maeda, Brian Moore:
Standards for the next-generation network. IEEE Commun. Mag. 43(10): 33 (2005) - 2004
- [j5]Yoichi Maeda:
Guest editorial: Standards for virtual private networks. IEEE Commun. Mag. 42(6): 114-115 (2004) - [c3]Yoichi Maeda:
Visual Pascal Configuration and Quartic Surface. JCDCG 2004: 143-150 - 2003
- [j4]Yoichi Maeda:
QoS standards for ip-based networks. IEEE Commun. Mag. 41(6): 80 (2003) - 2002
- [c2]Yoichi Maeda:
Viewing Cube and Its Visual Angles. JCDCG 2002: 192-199 - [c1]Yoichi Maeda, Hiroshi Maehara:
Observing an Angle from Various Viewpoints. JCDCG 2002: 200-203 - 2001
- [j3]Yoichi Maeda, Reinhold Feigel:
A standardization plan for broadband access network transport. IEEE Commun. Mag. 39(7): 166-172 (2001) - [j2]Yoichi Maeda, Kenji Okada, David Faulkner:
FSAN OAN-WG and future issues for broadband optical access networks. IEEE Commun. Mag. 39(12): 126-132 (2001)
1990 – 1999
- 1998
- [j1]Koichi Asatani, Yoichi Maeda:
Access network architectural issues for future telecommunication networks. IEEE Commun. Mag. 36(8): 110-114 (1998)
Coauthor Index
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