"A cost-effective scan architecture for scan testing with non-scan test ..."

Dong Xiang et al. (2003)

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DOI: 10.1145/775832.776022

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Dong Xiang, Shan Gu, Jia-Guang Sun, Yu-Liang Wu:
A cost-effective scan architecture for scan testing with non-scan test power and test application cost. DAC 2003: 744-747

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