"Analog Circuit Test using Transfer Function Coe .cient Estimates."

Zhen Guo, Jacob Savir (2003)

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DOI: 10.1109/TEST.2003.1271104

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Zhen Guo, Jacob Savir:
Analog Circuit Test using Transfer Function Coe .cient Estimates. ITC 2003: 1155-1163

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