"VLSI Functional Test Pattern Generation: A Design and Implementation."

Tonysheng Lin, Stephen Y. H. Su (1985)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-11-11

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Tonysheng Lin, Stephen Y. H. Su:
VLSI Functional Test Pattern Generation: A Design and Implementation. ITC 1985: 922-929

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