"Enhancing Good-Die-in-Bad-Neighborhood Methodology with Wafer-Level Defect ..."

Ching-Min Liu et al. (2023)

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DOI: 10.1109/ITC51656.2023.00053

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Ching-Min Liu, Chia-Heng Yen, Shu-Wen Lee, Kai-Chiang Wu, Mango Chia-Tso Chao:
Enhancing Good-Die-in-Bad-Neighborhood Methodology with Wafer-Level Defect Pattern Information. ITC 2023: 357-366

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