Location via proxy:   [ UP ]  
[Report a bug]   [Manage cookies]                

"Body diode reliability investigation of SiC power MOSFETs."

Asad Fayyaz, Gianpaolo Romano, Alberto Castellazzi (2016)

Details and statistics

DOI: 10.1016/J.MICROREL.2016.07.044

access: closed

type: Journal Article

metadata version: 2022-03-23