"Analysis and modeling of a digital CMOS circuit operation and reliability ..."

Ben Kaczer et al. (2002)

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DOI: 10.1016/S0026-2714(02)00026-4

access: closed

type: Journal Article

metadata version: 2022-05-09

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Ben Kaczer, Robin Degraeve, Mahmoud Rasras, An De Keersgieter, K. Van de Mieroop, Guido Groeseneken:
Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study. Microelectron. Reliab. 42(4-5): 555-564 (2002)

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