"Fault Modeling for Digital MOS Integrated Circuits."

John P. Hayes (1984)

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DOI: 10.1109/TCAD.1984.1270076

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type: Journal Article

metadata version: 2020-09-24

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John P. Hayes:
Fault Modeling for Digital MOS Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 3(3): 200-208 (1984)

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