"Hierarchical test generation using precomputed tests for modules."

Brian T. Murray, John P. Hayes (1990)

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DOI: 10.1109/43.55189

access: closed

type: Journal Article

metadata version: 2020-09-24

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Brian T. Murray, John P. Hayes:
Hierarchical test generation using precomputed tests for modules. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(6): 594-603 (1990)

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