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2020 – today
- 2024
[c8]Jonathan Gaudet, Jan Burchard, Matthias Kampmann, Jean-François Côté, Tim Callahan, Hung Ho Chai, Ivy Ee Hsia Lim, Lori Schramm, Olga Przybysz, Marta Stepniewska, Sascha Ochsenknecht, Michal Olejarz, Martin Keim:
High-Bandwidth IJTAG over SSN. ITC 2024: 167-176- 2020
- [c7]Stefan Holst, Matthias Kampmann
, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, Xiaoqing Wen:
Logic Fault Diagnosis of Hidden Delay Defects. ITC 2020: 1-10
2010 – 2019
- 2019
- [j2]Matthias Kampmann, Michael A. Kochte, Chang Liu, Eric Schneider, Sybille Hellebrand, Hans-Joachim Wunderlich:
Built-In Test for Hidden Delay Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(10): 1956-1968 (2019) - 2018
- [j1]Matthias Kampmann, Sybille Hellebrand:
Design for Small Delay Test - A Simulation Study. Microelectron. Reliab. 80: 124-133 (2018) - [c6]Chang Liu, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, Hans-Joachim Wunderlich:
Extending Aging Monitors for Early Life and Wear-Out Failure Prevention. ATS 2018: 92-97 - [c5]Matthias Kampmann, Jürgen Mottok:
A "Laboratory" as an approach to foster writing skills at software engineering studies: Learning software engineering is easier when writing courses are directly applied to lecture's content and the problems and examples enrolled in. EDUCON 2018: 900-908 - 2017
- [c4]Matthias Kampmann, Sybille Hellebrand:
Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. DDECS 2017: 35-41 - 2016
- [c3]Matthias Kampmann, Sybille Hellebrand:
X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. ATS 2016: 1-6 - 2015
- [c2]Matthias Kampmann, Michael A. Kochte, Eric Schneider, Thomas Indlekofer, Sybille Hellebrand, Hans-Joachim Wunderlich:
Optimized Selection of Frequencies for Faster-Than-at-Speed Test. ATS 2015: 109-114 - 2014
- [c1]Sybille Hellebrand, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, Hans-Joachim Wunderlich:
FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects. ITC 2014: 1-8
Coauthor Index
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