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Hierarchical multi-scale network for cross-scale visual defect detection

Published: 10 March 2023 Publication History

Abstract

Nowadays, an increasing number of researchers apply deep-learning-based object detection methods to implement visual defect detection in industrial manufacturing. However, large-scale variation in visual defect detection impedes the improvement of detection accuracy to be further explored. Therefore, we propose a hierarchical multi-scale block (HMS-Block), equipped with hierarchical representation and multi-scale embedding, to afford scale-abundant features to facilitate multi-scale defect detection. Specially, the hierarchical representation is implemented by a cascade learning stage to extract features from local to global at the channel level. Based on this representation, a cross-branch shortcut is concisely embedded to relieve the large-scale variation problem. Ultimately, the hierarchical multi-scale network (HMSNet) is published elegantly via stacking a certain amount of HMS-Blocks. The proposed methods facilitate the defect detection at all scales and outperform the ResNet50 baseline by a large margin with minor time overhead and less parameter required, indicating that the proposed HMS-Block has a high practical utility in the field of industrial applications. Moreover, the proposed HMSNet can also be applied to other detection-based tasks and greatly surpasses existing methods. Concretely, the proposed HMSNets achieve 42.4/42.7 mAP on NEU and COCO datasets, surpassing the recent backbones (i.e.,  HRNetV2) by 2.6/1.2 mAP.

References

[1]
Bao Y, Song K, Liu J, Wang Y, Yan Y, Yu H, and Li X Triplet-graph reasoning network for few-shot metal generic surface defect segmentation IEEE Transactions on Instrumentation and Measurement 2021 70 1-11
[2]
Cai, Z., & Vasconcelos, N. (2018). Cascade r-cnn: Delving into high quality object detection, in Proceedings of the IEEE conference on computer vision and pattern recognition, pp. 6154–6162.
[3]
Cao, Y., Xu, J., Lin, S., Wei, F., & Hu, H. (2019). GCNet: Non-Local Networks Meet Squeeze-Excitation Networks and Beyond, in 2019 IEEE/CVF International Conference on Computer Vision Workshop (ICCVW), IEEE Computer Society, pp. 1971–1980. IEEE Computer Society.
[4]
Çelik A, Küçükmanisa A, Sümer A, Çelebi AT, and Urhan O A real-time defective pixel detection system for lcds using deep learning based object detectors Journal of Intelligent Manufacturing 2022 33 985-994
[5]
Chen, K., Wang, J., Pang, J., Cao, Y., Xiong, Y., Li, X., Sun, S., Feng, W., Liu, Z., & Xu, J. et al. (2019). Mmdetection: Open mmlab detection toolbox and benchmark. arXiv preprint arXiv:1906.07155, 1–13.
[6]
Cheng KC-C, Chen LL-Y, Li J-W, Li KS-M, Tsai NC-Y, Wang S-J, Huang AY-A, Chou L, Lee C-S, Chen JE, et al. Machine learning-based detection method for wafer test induced defects IEEE Transactions on Semiconductor Manufacturing 2021 34 2 161-167
[7]
Deng, J., Dong, W., Socher, R., Li, L.-J., Li, K., & Fei-Fei, L. (2009). Imagenet: A large-scale hierarchical image database, in 2009 IEEE conference on computer vision and pattern recognition, Ieee, pp. 248–255. IEEE.
[8]
Everingham M, Van Gool L, Williams CK, Winn J, and Zisserman A The pascal visual object classes (voc) challenge International Journal of Computer Vision 2010 88 2 303-338
[9]
Gao S-H, Cheng M-M, Zhao K, Zhang X-Y, Yang M-H, and Torr P Res2net: A new multi-scale backbone architecture IEEE Transactions on Pattern Analysis and Machine Intelligence 2019 43 2 652-662
[10]
Gao Y, Lin J, Xie J, and Ning Z A real-time defect detection method for digital signal processing of industrial inspection applications IEEE Transactions on Industrial Informatics 2020 17 5 3450-3459
[11]
Guo, C., Fan, B., Zhang, Q., Xiang, S., & Pan, C. (2020). Augfpn: Improving multi-scale feature learning for object detection, in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 12595–12604.
[12]
Hao R, Lu B, Cheng Y, Li X, and Huang B A steel surface defect inspection approach towards smart industrial monitoring Journal of Intelligent Manufacturing 2021 32 1833-1843
[13]
He, K., Zhang, X., Ren, S., & Sun, J. (2016). Deep residual learning for image recognition, in Proceedings of the IEEE conference on computer vision and pattern recognition, pp. 770–778.
[14]
He Y, Song K, Meng Q, and Yan Y An end-to-end steel surface defect detection approach via fusing multiple hierarchical features IEEE Transactions on Instrumentation and Measurement 2019 69 4 1493-1504
[15]
Hsu C-Y and Liu W-C Multiple time-series convolutional neural network for fault detection and diagnosis and empirical study in semiconductor manufacturing Journal of Intelligent Manufacturing 2021 32 823-836
[16]
Hu J, Shen L, Albanie S, Sun G, and Wu E Squeeze-and-excitation networks IEEE Transactions on Pattern Analysis and Machine Intelligence 2019 42 8 2011-2023
[17]
Jain S, Seth G, Paruthi A, Soni U, and Kumar G Synthetic data augmentation for surface defect detection and classification using deep learning Journal of Intelligent Manufacturing 2022 33 1007-1020
[18]
Kim Y, Cho D, and Lee J-H Wafer defect pattern classification with detecting out-of-distribution Microelectronics Reliability 2021 122
[19]
Kong, T., Yao, A., Chen, Y., & Sun, F. (2016). Hypernet: Towards accurate region proposal generation and joint object detection, in Proceedings of the IEEE conference on computer vision and pattern recognition, 2016, pp. 845–853.
[20]
Li D, Li Y, Xie Q, Wu Y, Yu Z, and Wang J Tiny defect detection in high-resolution aero-engine blade images via a coarse-to-fine framework IEEE Transactions on Instrumentation and Measurement 2021 70 1-12
[21]
Li F and Xi Q Defectnet: Toward fast and effective defect detection IEEE Transactions on Instrumentation and Measurement 2021 70 1-9
[22]
Li, Y., Chen, Y., Wang, N., & Zhang, Z. (2019). Scale-aware trident networks for object detection, in Proceedings of the IEEE/CVF International Conference on Computer Vision, 2019, pp. 6054–6063.
[23]
Lin, T-Y., Maire, M., Belongie, S., Hays, J., Perona, P., Ramanan, D., Dollár, P., & Zitnick, C.L. (2014). Microsoft coco: Common objects in context, in European conference on computer vision, Springer, 2014, pp. 740–755. Springer.
[24]
Lin, T.-Y., Dollár, P., Girshick, R., He, K., Hariharan, B., & Belongie, S. (2017a) Feature pyramid networks for object detection, in Proceedings of the IEEE conference on computer vision and pattern recognition, 2017a, pp. 2117–2125.
[25]
Lin, T.-Y., Goyal, P., Girshick, R., He, K., & Dollár, P. (2017b). Focal loss for dense object detection, in Proceedings of the IEEE international conference on computer vision, pp. 2980–2988.
[26]
Ling Z, Zhang A, Ma D, Shi Y, and Wen H Deep Siamese semantic segmentation network for pcb welding defect detection IEEE Transactions on Instrumentation and Measurement 2022 71 1-11
[27]
Liu, J.-J., Hou, Q., Cheng, M.-M., Wang, C., & Feng, J. (2020a). Improving convolutional networks with self-calibrated convolutions, in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 10096–10105.
[28]
Liu R, Sun Z, Wang A, Yang K, Wang Y, and Sun Q Real-time defect detection network for polarizer based on deep learning Journal of Intelligent Manufacturing 2020 31 1813-1823
[29]
Liu, S., Qi, L., Qin, H., Shi, J., & Jia, J. (2018). Path aggregation network for instance segmentation, in Proceedings of the IEEE conference on computer vision and pattern recognition, pp. 8759–8768.
[30]
Liu, W., Anguelov, D., Erhan, D., Szegedy, C., Reed, S., Fu, C.-Y., & Berg, A.C. (2016). Ssd: Single shot multibox detector, in European conference on computer vision, Springer, pp. 21–37. Springer.
[31]
Liu Z, Yang B, Duan G, and Tan J Visual defect inspection of metal part surface via deformable convolution and concatenate feature pyramid neural networks IEEE Transactions on Instrumentation and Measurement 2020 69 12 9681-9694
[32]
Liu Z, Tang R, Duan G, and Tan J Truingdet: Towards high-quality visual automatic defect inspection for mental surface Optics and Lasers in Engineering 2021 138
[33]
Liu, Z., Song, Y., Tang, R., Duan, G., & Tan, J. (2022). Few-shot defect recognition of metal surfaces via attention-embedding and self-supervised learning. Journal of Intelligent Manufacturing, 1–15.
[34]
Meng S, Pan R, Gao W, Zhou J, Wang J, and He W A multi-task and multi-scale convolutional neural network for automatic recognition of woven fabric pattern Journal of Intelligent Manufacturing 2021 32 1147-1161
[35]
Pang, J., Chen, K., Shi, J., Feng, H., Ouyang, W., & Lin, D. (2019) Libra r-cnn: Towards balanced learning for object detection, in Proceedings of the IEEE/CVF conference on computer vision and pattern recognition, pp. 821–830.
[36]
Radosavovic, I., Kosaraju, R.P., Girshick, R., He, K., & Dollár, P. (2020). Designing network design spaces, in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 10428–10436.
[37]
Ren S, He K, Girshick R, and Sun J Faster r-cnn: Towards real-time object detection with region proposal networks IEEE Transactions on Pattern Analysis & Machine Intelligence 2017 39 06 1137-1149
[38]
Schlosser T, Friedrich M, Beuth F, and Kowerko D Improving automated visual fault inspection for semiconductor manufacturing using a hybrid multistage system of deep neural networks Journal of Intelligent Manufacturing 2022 33 4 1099-1123
[39]
Singh, B., & Davis, L.S. (2018) An analysis of scale invariance in object detection snip, in Proceedings of the IEEE conference on computer vision and pattern recognition, pp. 3578–3587.
[40]
Singh B, Najibi M, and Davis LS Sniper: Efficient multi-scale training Advances in Neural Information Processing Systems 2018 31 1-10
[41]
Song Y, Liu Z, Wang J, Tang R, Duan G, and Tan J Multiscale adversarial and weighted gradient domain adaptive network for data scarcity surface defect detection IEEE Transactions on Instrumentation and Measurement 2021 70 1-10
[42]
Stern ML and Schellenberger M Fully convolutional networks for chip-wise defect detection employing photoluminescence images: Efficient quality control in led manufacturing Journal of Intelligent Manufacturing 2021 32 113-126
[43]
Sun, K., Xiao, B., Liu, D., & Wang, J. (2019). Deep high-resolution representation learning for human pose estimation, in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 5693–5703.
[44]
Szegedy, C., Liu, W., Jia,Y., Sermanet, P., Reed, S., Anguelov, D., Erhan, D., Vanhoucke, V., & Rabinovich, A. (2015). Going deeper with convolutions, in Proceedings of the IEEE conference on computer vision and pattern recognition, pp. 1–9.
[45]
Szegedy, C., Vanhoucke, V., Ioffe, S., Shlens, J., & Wojna, Z. (2016). Rethinking the inception architecture for computer vision, in Proceedings of the IEEE conference on computer vision and pattern recognition, pp. 2818–2826.
[46]
Szegedy, C., Ioffe, S., Vanhoucke, V., & Alemi, A. (2017). Inception-v4, inception-resnet and the impact of residual connections on learning, in Proceedings of the AAAI conference on artificial intelligence, vol. 31, pp. 1–8.
[47]
Tang, R., Liu, Z., Li, Y., Song, Y., Liu,H., Wang, Q., Shao, J., Duan, G., & Tan, J. (2023). Task-balanced distillation for object detection. Pattern Recognition, 109320.
[48]
Tian, Z., Shen, C., Chen, H., & He, T. (2019). Fcos: Fully convolutional one-stage object detection, in Proceedings of the IEEE/CVF International Conference on Computer Vision, pp. 9627–9636.
[49]
Wang J, Sun K, Cheng T, Jiang B, Deng C, Zhao Y, Liu D, Mu Y, Tan M, Wang X, et al. Deep high-resolution representation learning for visual recognition IEEE Transactions on Pattern Analysis and Machine Intelligence 2020 43 10 3349-3364
[50]
Wang Y, Liu M, Zheng P, Yang H, and Zou J A smart surface inspection system using faster r-cnn in cloud-edge computing environment Advanced Engineering Informatics 2020 43
[51]
Woo, S., Park, J., Lee, J.-Y., & Kweon, I.S. (2018). Cbam: Convolutional block attention module, in Proceedings of the European conference on computer vision (ECCV), pp. 3–19.
[52]
Xie, S., Girshick, R., Dollár, P., Tu, Z., & He, K. (2017). Aggregated residual transformations for deep neural networks, in Proceedings of the IEEE conference on computer vision and pattern recognition, pp. 1492–1500.
[53]
Yang B, Liu Z, Duan G, and Tan J Mask2defect: A prior knowledge-based data augmentation method for metal surface defect inspection IEEE Transactions on Industrial Informatics 2021 18 10 6743-6755
[54]
Zhang, S., Chi, C., Yao, Y., Lei, Z., & Li, S.Z. (2020). Bridging the gap between anchor-based and anchor-free detection via adaptive training sample selection, in Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 9759–9768.

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Published In

cover image Journal of Intelligent Manufacturing
Journal of Intelligent Manufacturing  Volume 35, Issue 3
Mar 2024
458 pages

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Springer-Verlag

Berlin, Heidelberg

Publication History

Published: 10 March 2023
Accepted: 13 February 2023
Received: 03 August 2021

Author Tags

  1. Visual defect detection
  2. Large-scale variation
  3. Hierarchical convolution representation
  4. Multi-scale information embedding
  5. Hierarchical multi-scale network
  6. Object detection

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