article

MOSFET threshold voltage: Definition, extraction, and some applications

Authors:

Osmar Franca Siebel,

Marcio Cherem Schneider,

Carlos Galup-MontoroAuthors Info & Claims

Microelectronics Journal, Volume 43, Issue 5

Pages 329 - 336

https://doi.org/10.1016/j.mejo.2012.01.004

Published: 01 May 2012 Publication History

Abstract

This paper exploits a universal current-based definition of the threshold voltage (V"T) and discusses some direct methods to measure it. The consistency, accuracy, and sensitivity of the extraction procedures to second-order effects are examined through numerical simulations and experimental measurements. In addition to three procedures based on dc current measurements we propose an automatic V"T-extractor circuit which allows the direct determination of the threshold voltage with minimum influence of second-order effects.

References

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Sanchotene Silva RPereira Luiz LCherem Schneider MGalup-Montoro C(2019)A Test Chip for Characterization of the Series Association of MOSFETsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2019.290833827:8(1967-1971)Online publication date: 23-Jul-2019
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C. JKlimach HFabris EMattia Ode Lima RCunha APlett Cde Oliveira W(2015)High PSRR Nano-Watt MOS-Only Threshold Voltage Monitor CircuitProceedings of the 28th Symposium on Integrated Circuits and Systems Design10.1145/2800986.2801009(1-6)Online publication date: 31-Aug-2015
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Published In

Microelectronics Journal Volume 43, Issue 5

May, 2012

39 pages

ISSN:0026-2692

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Elsevier Science Publishers B. V.

Netherlands

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Published: 01 May 2012

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Sanchotene Silva RPereira Luiz LCherem Schneider MGalup-Montoro C(2019)A Test Chip for Characterization of the Series Association of MOSFETsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2019.290833827:8(1967-1971)Online publication date: 23-Jul-2019
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Mattia OKlimach HBampi SDavid EOrdonez Mde Azevedo RKinget P(2014)Sub-1 V Supply Nano-Watt MOSFET-Only Threshold Voltage Extractor CircuitProceedings of the 27th Symposium on Integrated Circuits and Systems Design10.1145/2660540.2660991(1-6)Online publication date: 1-Sep-2014
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Measurements and modeling of intrinsic fluctuations in MOSFET threshold voltage

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