research-article

Contemporary CMOS aging mitigation techniques

Authors:

Navid Khoshavi,

Rizwan A. Ashraf,

Ronald F. DeMara,

Mehdi B. TahooriAuthors Info & Claims

Integration, the VLSI Journal, Volume 59, Issue C

Pages 10 - 22

https://doi.org/10.1016/j.vlsi.2017.03.013

Published: 01 September 2017 Publication History

Abstract

The proposed paper addresses the overarching reliability issue of transistor aging in nanometer-scaled circuits. Specifically, a comprehensive survey and taxonomy of techniques used to model, monitor and mitigate Bias Temperature Instability (BTI) effects in logic circuits are presented. The challenges and overheads of these techniques are covered through the course of this paper. Important metrics of area overhead, power and energy overhead, performance overhead, and lifetime extension are discussed. Furthermore, the techniques are assessed with regards to ease of implementation and the ability to cope with challenges such as increase in manufacturing induced process variations. Finally, a taxonomy of the surveyed techniques is presented to facilitate generalization of the discussed approaches and to foster new inspiring techniques for this important reliability phenomenon leading to advancements in the design of defect-tolerant digital circuits. HighlightsThis manuscript presents a survey of VLSI aging mechanism, models, and mitigation techniques at different abstraction levels.An overview of the primary source of reliability issue in submicron manufacturing era is given.Two main models describing the physics of the BTI phenomenon are introduced.

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Kajal Sharma V(2021)Design and Simulation for NBTI Aware Logic GatesWireless Personal Communications: An International Journal10.1007/s11277-021-08522-z120:2(1525-1542)Online publication date: 1-Sep-2021
https://dl.acm.org/doi/10.1007/s11277-021-08522-z
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Published In

cover image Integration, the VLSI Journal

Integration, the VLSI Journal Volume 59, Issue C

September 2017

255 pages

ISSN:0167-9260

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Elsevier Science Publishers B. V.

Netherlands

Publication History

Published: 01 September 2017

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Cited By

Lanzieri LMartino GFey GSchlarb HSchmidt TWählisch M(2024)A Review of Techniques for Ageing Detection and Monitoring on Embedded SystemsACM Computing Surveys10.1145/369524757:1(1-34)Online publication date: 7-Oct-2024
https://dl.acm.org/doi/10.1145/3695247
Morsali MShalchian M(2022)Switched pseudo-current mirror inverter for low-power, thermally stable and robust ring oscillatorIntegration, the VLSI Journal10.1016/j.vlsi.2021.08.01282:C(20-28)Online publication date: 1-Jan-2022
https://dl.acm.org/doi/10.1016/j.vlsi.2021.08.012
Kajal Sharma V(2021)Design and Simulation for NBTI Aware Logic GatesWireless Personal Communications: An International Journal10.1007/s11277-021-08522-z120:2(1525-1542)Online publication date: 1-Sep-2021
https://dl.acm.org/doi/10.1007/s11277-021-08522-z
Gomez AChampac V(2018)Selection of Critical Paths for Reliable Frequency Scaling under BTI-Aging Considering Workload Uncertainty and Process Variations EffectsACM Transactions on Design Automation of Electronic Systems10.1145/317786423:3(1-21)Online publication date: 23-Feb-2018
https://dl.acm.org/doi/10.1145/3177864
Zhou YAng DKalaga PGollu S(2018)Oxide breakdown path for optical sensing at the nanoscale level2018 IEEE International Reliability Physics Symposium (IRPS)10.1109/IRPS.2018.8353668(P-GD.8-1-P-GD.8-5)Online publication date: 11-Mar-2018
https://dl.acm.org/doi/10.1109/IRPS.2018.8353668

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