research-article

Diagnosis and Repair of Memory with Coupling Faults

Authors:

J. H. PatelAuthors Info & Claims

IEEE Transactions on Computers, Volume 38, Issue 4

Pages 493 - 500

https://doi.org/10.1109/12.21142

Published: 01 April 1989 Publication History

Abstract

The problem of diagnosis and spare allocation for random-access memory (RAM) with coupling faults is addressed. A number of spare allocation algorithms for RAM with row and column redundancy have recently been proposed. These procedures, however, have been restricted to repair stuck-at faults. The authors examine both diagnosis and repair of coupling faults in RAMs utilizing spare rows and columns. It is shown that a coupling fault is repaired if its coupling cell is replaced by utilizing a spare row or its coupled cell is replaced by utilizing a spare row or column. By specifying both the coupled cell and coupling cell, the amount of redundancy required to repair a given set of faults may be reduced. A diagnosis procedure for RAM is provided to locate stuck-at faults as well as coupling faults. A graph model is used to describe the repair of coupling faults. A repair procedure has been implemented to allocate rows and columns for repair.

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Chao MChin CLin CScheffer LPhillips JHu A(2010)Mathematical yield estimation for two-dimensional-redundancy memory arraysProceedings of the International Conference on Computer-Aided Design10.5555/2133429.2133478(235-240)Online publication date: 7-Nov-2010
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Ney AGirard PPravossoudovitch SVirazel ABastian MGouin VSciuto D(2008)A design-for-diagnosis technique for SRAM write driversProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403731(1480-1485)Online publication date: 10-Mar-2008
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Index Terms

Diagnosis and Repair of Memory with Coupling Faults
1. Hardware

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Published In

cover image IEEE Transactions on Computers

IEEE Transactions on Computers Volume 38, Issue 4

April 1989

131 pages

ISSN:0018-9340

Editor:
Ming T. Liu
Ohio State Univ., Columbus

Issue’s Table of Contents

Copyright © Copyright © 1989 IEEE. All Rights Reserved.

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IEEE Computer Society

United States

Publication History

Published: 01 April 1989

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Cited By

Schirmeier HKorb ISpinczyk OEngel M(2013)Efficient online memory error assessment and circumvention for Linux with RAMpageInternational Journal of Critical Computer-Based Systems10.1504/IJCCBS.2013.0583974:3(227-247)Online publication date: 1-Dec-2013
https://dl.acm.org/doi/10.1504/IJCCBS.2013.058397
Chao MChin CLin CScheffer LPhillips JHu A(2010)Mathematical yield estimation for two-dimensional-redundancy memory arraysProceedings of the International Conference on Computer-Aided Design10.5555/2133429.2133478(235-240)Online publication date: 7-Nov-2010
https://dl.acm.org/doi/10.5555/2133429.2133478
Ney AGirard PPravossoudovitch SVirazel ABastian MGouin VSciuto D(2008)A design-for-diagnosis technique for SRAM write driversProceedings of the conference on Design, automation and test in Europe10.1145/1403375.1403731(1480-1485)Online publication date: 10-Mar-2008
https://dl.acm.org/doi/10.1145/1403375.1403731
Li JHuang C(2007)An Efficient Diagnosis Scheme for RAMs with Simple Functional FaultsIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences10.1093/ietfec/e90-a.12.2703E90-A:12(2703-2711)Online publication date: 1-Dec-2007
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Niggemeyer DRudnick E(2003)A data acquisition methodology for on-chip repair of embedded memoriesACM Transactions on Design Automation of Electronic Systems10.1145/944027.9440378:4(560-576)Online publication date: 1-Oct-2003
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Li JTzeng RWu C(2002)Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-TestJournal of Electronic Testing: Theory and Applications10.1023/A:101655792747918:4-5(515-527)Online publication date: 1-Aug-2002
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Li JCheng KHuang CWu C(2001)March-Based RAM Diagnosis Algorithms for Stuck-At and Coupling FaultsProceedings of the 2001 IEEE International Test Conference10.5555/839296.843728Online publication date: 30-Oct-2001
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Li JWu C(2001)Memory fault diagnosis by syndrome compressionProceedings of the conference on Design, automation and test in Europe10.5555/367072.367102(97-101)Online publication date: 13-Mar-2001
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Chang MShi WFuchs W(1990)Optimal Diagnosis Procedures for k-out-of-n StructuresIEEE Transactions on Computers10.1109/12.5485039:4(559-564)Online publication date: 1-Apr-1990
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