March-Based RAM Diagnosis Algorithms for Stuck-At and Coupling Faults
Abstract
Diagnosis technique plays a key role during the rapid developmentof the semiconductor memories, for catchingthe design and manufacturing failures and improving theoverall yield and quality. Investigation on efficient diagnosisalgorithms is very important due to the expensiveand complex fault/failure analysis process. We proposeMarch-based RAM diagnosis algorithms which not onlylocate faulty cells but also identify their types. The diagnosiscomplexity is O(17 N) and O((17 + 10 B)N) forbit-oriented and word-oriented diagnosis algorithms, respectively,where N represents the address number and Bis the data width. Using the proposed algorithms, stuck-atfaults, state coupling faults, idempotent coupling faultsand inversion coupling faults can be distinguished. Furthermore,the coupled and coupling cells can be locatedin the memory array. Our word-oriented diagnosis algorithmcan distinguish all of the inter-word and intra-wordcoupling faults, and locate the coupling cells of the intra-wordinversion and idempotent coupling faults. With addi-tional2B-1 operations, the algorithm can further locatethe intra-word state coupling faults. With improved diagnosticresolution and test time, the proposed algorithmsfacilitate the development and manufacturing of semiconductormemories.
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Published In
October 2001
ISBN:0780371712
Copyright © Copyright (c) 2001 Institute of Electrical and Electronics Engineers, Inc. All rights reserved.
Publisher
IEEE Computer Society
United States
Publication History
Published: 30 October 2001
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