research-article

A Clustered Failure Model for the Memory Array Reconfiguration Problem

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A. PelcAuthors Info & Claims

IEEE Transactions on Computers, Volume 42, Issue 5

Pages 518 - 528

https://doi.org/10.1109/12.223671

Published: 01 May 1993 Publication History

Abstract

Reconfiguration of memory array using spare rows and spare columns, which has been shown to be a useful technique for yield enhancement of memories, is considered. A clustered failure model that adopts the center-satellite approach of F.J. Meyer and D.K. Pradhan (1989) is proposed and utilized to show that the total number of faulty cells that can be tolerated when clustering occurs is larger than when faults are independent. It is also shown that an optimal solution to the reconfiguration problem can be found in polynomial time for a special case of the clustering model. An efficient approximation algorithm is given for the general case of the probabilistic model assumed. It is shown, through simulation, that the computation time required by this algorithm to repair large arrays containing a significant number of clustered faults is small.

References

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Digital Library

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Digital Library

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Digital Library

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Bai GFernau H(2012)Constraint bipartite vertex coverJournal of Combinatorial Optimization10.1007/s10878-010-9289-723:3(331-355)Online publication date: 1-Apr-2012
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A Clustered Failure Model for the Memory Array Reconfiguration Problem
1. Hardware
  1. Hardware test

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cover image IEEE Transactions on Computers

IEEE Transactions on Computers Volume 42, Issue 5

May 1993

134 pages

ISSN:0018-9340

Issue’s Table of Contents

Copyright © Copyright © 1993 IEEE. All Rights Reserved.

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IEEE Computer Society

United States

Publication History

Published: 01 May 1993

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Cited By

Tan JWang WMa MWei XYan K(2023)Improving the Performance of CNN Accelerator Architecture under the Impact of Process VariationsACM Transactions on Design Automation of Electronic Systems10.1145/360423628:5(1-21)Online publication date: 9-Sep-2023
https://dl.acm.org/doi/10.1145/3604236
Krištofík ŠMalík P(2018)Enhancement of fault collection for embedded RAM redundancy analysis considering intersection and orphan faultsIntegration, the VLSI Journal10.1016/j.vlsi.2018.02.01562:C(190-204)Online publication date: 1-Jun-2018
https://dl.acm.org/doi/10.1016/j.vlsi.2018.02.015
Bai GFernau H(2012)Constraint bipartite vertex coverJournal of Combinatorial Optimization10.1007/s10878-010-9289-723:3(331-355)Online publication date: 1-Apr-2012
https://dl.acm.org/doi/10.1007/s10878-010-9289-7
Lu XLi JSeo C(2009)Probabilistic diagnosis of clustered faults for shared structuresMathematical and Computer Modelling: An International Journal10.1016/j.mcm.2008.06.01149:3-4(623-634)Online publication date: 1-Feb-2009
https://dl.acm.org/doi/10.1016/j.mcm.2008.06.011
Bai GFernau H(2008)Constraint Bipartite Vertex Cover Simpler Exact Algorithms and ImplementationsProceedings of the 2nd annual international workshop on Frontiers in Algorithmics10.1007/978-3-540-69311-6_10(67-78)Online publication date: 29-Jun-2008
https://dl.acm.org/doi/10.1007/978-3-540-69311-6_10
Kranakis EPaquette MPelc A(2007)Communication in networks with random dependent faultsProceedings of the 32nd international conference on Mathematical Foundations of Computer Science10.5555/2392236.2392289(418-429)Online publication date: 26-Aug-2007
https://dl.acm.org/doi/10.5555/2392236.2392289
Smith MMazumder P(1996)Generation of Minimal Vertex Covers for Row/Column Allocation in Self-Repairable ArraysIEEE Transactions on Computers10.1109/12.48149245:1(109-115)Online publication date: 1-Jan-1996
https://dl.acm.org/doi/10.1109/12.481492

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