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Algorithm-Based Fault Detection for Signal Processing Applications

Published: 01 October 1990 Publication History

Abstract

The increasing demands for high-performance signal processing along with the availability of inexpensive high-performance processors have results in numerous proposals for special-purpose array processors for signal processing applications. A functional-level concurrent error-detection scheme is presented for such VLSI signal processing architectures as those proposed for the FFT and QR factorization. Some basic properties involved in such computations are used to check the correctness of the computed output values. This fault-detection scheme is shown to be applicable to a class of problems rather than a particular problem, unlike the earlier algorithm-based error-detection techniques. The effects of roundoff/truncation errors due to finite-precision arithmetic are evaluated. It is shown that the error coverage is high with large word sizes.

References

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Published In

cover image IEEE Transactions on Computers
IEEE Transactions on Computers  Volume 39, Issue 10
October 1990
99 pages
ISSN:0018-9340
Issue’s Table of Contents

Publisher

IEEE Computer Society

United States

Publication History

Published: 01 October 1990

Author Tags

  1. FFT factorization
  2. QR factorization
  3. VLSI signal processing architectures
  4. VLSI.
  5. algorithm based fault detection
  6. correctness checking
  7. digital signal processing chips
  8. error coverage
  9. error detection
  10. fault tolerant computing
  11. finite-precision arithmetic
  12. functional-level concurrent error-detection
  13. integrated circuit testing
  14. roundoff errors
  15. signal processing applications
  16. special-purpose array processors
  17. truncation errors

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  • (2020)Design of SEU-Tolerant Turbo Decoders Implemented on SRAM-FPGAsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2020.301697628:12(2563-2572)Online publication date: 25-Nov-2020
  • (2019)Design and Implementation of Configuration Memory SEU-Tolerant Viterbi Decoders in SRAM-Based FPGAsIEEE Transactions on Nanotechnology10.1109/TNANO.2019.292587218(691-699)Online publication date: 1-Jan-2019
  • (2016)Processor Design for Soft ErrorsACM Computing Surveys10.1145/299635749:3(1-44)Online publication date: 8-Nov-2016
  • (2016)Fault Tolerant Parallel FFTs Using Error Correction Codes and Parseval ChecksIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2015.240862124:2(769-773)Online publication date: 1-Feb-2016
  • (2015)A Synergetic Use of Bloom Filters for Error Detection and CorrectionIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2014.231123423:3(584-587)Online publication date: 20-Feb-2015
  • (2015)Fault Tolerant Parallel Filters Based on Error Correction CodesIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2014.230832223:2(384-387)Online publication date: 1-Feb-2015
  • (2015)Reliable Radix-4 Complex Division for Fault-Sensitive ApplicationsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2015.239438934:4(656-667)Online publication date: 17-Mar-2015
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  • (2009)Checksum-based probabilistic transient-error compensation for linear digital systemsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2008.200458717:10(1447-1460)Online publication date: 1-Oct-2009
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