research-article

Strategies for Low-Cost Test

Authors:

Rohit Kapur,

R. Chandramouli,

T. W. WilliamsAuthors Info & Claims

IEEE Design & Test, Volume 18, Issue 6

Pages 47 - 54

https://doi.org/10.1109/54.970423

Published: 01 November 2001 Publication History

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Abstract

More collaboration between EDA, semiconductor, and ATE industry segments can improve the manufacturing test environment. These improvements can dramatically reduce the cost of test and lead to a new generation of DFT-aware ATE and ATE-aware DTE.

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Proc. Int'l Test Conf. (ITC 00), IEEE CS Press, Los Alamitos, Calif., 2000, pp. 770-777.

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R.W. Bassett et al., "Low Cost Testing of High Density Logic Components," Proc. Int'l Test Conf. (ITC 89), IEEE CS Press, Los Alamitos, Calif., pp. 550-557.

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Proc. Int'l Test Conf. (ITC 00), IEEE CS Press, Los Alamitos, Calif., 2000, pp. 292-301.

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Proc. Int'l Test Conf. (ITC 01), IEEE CS Press, Los Alamitos, Calif., 2001.

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Cited By

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Ko HNicolici N(2008)Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application StrategyJournal of Electronic Testing: Theory and Applications10.1007/s10836-007-5036-024:4(393-403)Online publication date: 1-Aug-2008
https://dl.acm.org/doi/10.1007/s10836-007-5036-0
Hamling D(2005)Test Solution Selection Using Multiple-Objective Decision Models and AnalysesIEEE Design & Test10.1109/MDT.2005.4722:2(126-134)Online publication date: 1-Mar-2005
https://dl.acm.org/doi/10.1109/MDT.2005.47

Strategies for Low-Cost Test
1. Applied computing

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Published In

IEEE Design & Test Volume 18, Issue 6

November 2001

81 pages

ISSN:0740-7475

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IEEE Computer Society Press

Washington, DC, United States

Publication History

Published: 01 November 2001

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Ko HNicolici N(2008)Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application StrategyJournal of Electronic Testing: Theory and Applications10.1007/s10836-007-5036-024:4(393-403)Online publication date: 1-Aug-2008
https://dl.acm.org/doi/10.1007/s10836-007-5036-0
Hamling D(2005)Test Solution Selection Using Multiple-Objective Decision Models and AnalysesIEEE Design & Test10.1109/MDT.2005.4722:2(126-134)Online publication date: 1-Mar-2005
https://dl.acm.org/doi/10.1109/MDT.2005.47

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References

Cited By

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Test Integration for SOC Supporting Very Low-Cost Testers

Low cost scan test by test correlation utilization

Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers

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