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10.1109/HLDVT.2005.1568818guideproceedingsArticle/Chapter ViewAbstractPublication PagesConference Proceedingsacm-pubtype
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A software test program generator for verifying system-on-chips

Published: 30 November 2005 Publication History

Abstract

Design verification is crucial for successful systems-on-chips (SoCs). However, validating and proving the correctness of SoCs is often a bottleneck in the design project. This paper presents a technique to test the SoC at the system level using software application based programs. Our software application level verification methodology (SALVEM) employs test programs composed of dynamic sequences of software code segments. The SALVEM system implements a test generator to create these software test programs automatically. Experiments were conducted applying SALVEM tests to the Altera Nios SoC. A feedback verification flow is also feasible in our SALVEM system. SALVEM test runs are analyzed to direct the test generator toward important SoC scenarios.

Cited By

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  • (2016)Stochastic stability analysis for 2-D Roesser systems with multiplicative noiseAutomatica (Journal of IFAC)10.1016/j.automatica.2016.03.00669:C(356-363)Online publication date: 1-Jul-2016
  • (2008)An evolutionary methodology for test generation for peripheral cores via dynamic FSM extractionProceedings of the 2008 conference on Applications of evolutionary computing10.5555/1787943.1787968(214-223)Online publication date: 26-Mar-2008
  • (2008)Verifying external interrupts of embedded microprocessor in SoC with on-chip busProceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design10.5555/1509456.1509542(372-377)Online publication date: 10-Nov-2008
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cover image Guide Proceedings
HLDVT '05: Proceedings of the High-Level Design Validation and Test Workshop, 2005. on Tenth IEEE International
November 2005
226 pages
ISBN:0780395719

Publisher

IEEE Computer Society

United States

Publication History

Published: 30 November 2005

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Cited By

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  • (2016)Stochastic stability analysis for 2-D Roesser systems with multiplicative noiseAutomatica (Journal of IFAC)10.1016/j.automatica.2016.03.00669:C(356-363)Online publication date: 1-Jul-2016
  • (2008)An evolutionary methodology for test generation for peripheral cores via dynamic FSM extractionProceedings of the 2008 conference on Applications of evolutionary computing10.5555/1787943.1787968(214-223)Online publication date: 26-Mar-2008
  • (2008)Verifying external interrupts of embedded microprocessor in SoC with on-chip busProceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design10.5555/1509456.1509542(372-377)Online publication date: 10-Nov-2008
  • (2007)A software-based methodology for the generation of peripheral test sets based on high-level descriptionsProceedings of the 20th annual conference on Integrated circuits and systems design10.1145/1284480.1284571(348-353)Online publication date: 3-Sep-2007
  • (2007)Coupling EA and high-level metrics for the automatic generation of test blocks for peripheral coresProceedings of the 9th annual conference on Genetic and evolutionary computation10.1145/1276958.1277342(1912-1919)Online publication date: 7-Jul-2007

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