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10.1109/HPCA.2013.6522321guideproceedingsArticle/Chapter ViewAbstractPublication PagesConference Proceedingsacm-pubtype
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Coset coding to extend the lifetime of memory

Published: 23 February 2013 Publication History

Abstract

Some recent memory technologies, including phase change memory (PCM), have lifetime reliabilities that are affected by write operations. We propose the use of coset coding to extend the lifetimes of these memories. The key idea of coset coding is that it performs a one-to-many mapping from each dataword to a coset of vectors, and having multiple possible vectors provides the flexibility to choose the vector to write that optimizes lifetime. Our technique, FlipMin, uses coset coding and, for each write, selects the vector that minimizes the number of bits that must flip. We also show how FlipMin can be synergistically combined with the ability to tolerate bit erasures. Thus, our techniques help to prevent bits from wearing out and can then tolerate those bits that do wear out.

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  • (2024)AmLuCEP: Amalgamating LUT-based Compression and Adaptive Encoding Assisted Block Placement To Improve Lifetime of PCM-based Main MemoriesACM Transactions on Design Automation of Electronic Systems10.1145/368933429:6(1-24)Online publication date: 20-Aug-2024
  • (2024)MORSE: Memory Overwrite Time Guided Soft Writes to Improve ReRAM Energy and EnduranceProceedings of the 2024 International Conference on Parallel Architectures and Compilation Techniques10.1145/3656019.3676890(26-39)Online publication date: 14-Oct-2024
  • (2022)Exploiting successive identical words and differences with dynamic bases for effective compression in Non-Volatile MemoriesProceedings of the ACM/IEEE International Symposium on Low Power Electronics and Design10.1145/3531437.3539716(1-6)Online publication date: 1-Aug-2022
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cover image Guide Proceedings
HPCA '13: Proceedings of the 2013 IEEE 19th International Symposium on High Performance Computer Architecture (HPCA)
February 2013
653 pages
ISBN:9781467355858

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IEEE Computer Society

United States

Publication History

Published: 23 February 2013

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Cited By

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  • (2024)AmLuCEP: Amalgamating LUT-based Compression and Adaptive Encoding Assisted Block Placement To Improve Lifetime of PCM-based Main MemoriesACM Transactions on Design Automation of Electronic Systems10.1145/368933429:6(1-24)Online publication date: 20-Aug-2024
  • (2024)MORSE: Memory Overwrite Time Guided Soft Writes to Improve ReRAM Energy and EnduranceProceedings of the 2024 International Conference on Parallel Architectures and Compilation Techniques10.1145/3656019.3676890(26-39)Online publication date: 14-Oct-2024
  • (2022)Exploiting successive identical words and differences with dynamic bases for effective compression in Non-Volatile MemoriesProceedings of the ACM/IEEE International Symposium on Low Power Electronics and Design10.1145/3531437.3539716(1-6)Online publication date: 1-Aug-2022
  • (2020)Improving phase change memory performance with data content aware accessProceedings of the 2020 ACM SIGPLAN International Symposium on Memory Management10.1145/3381898.3397210(30-47)Online publication date: 16-Jun-2020
  • (2019)Optimizing systems for byte-addressable NVM by reducing bit flippingProceedings of the 17th USENIX Conference on File and Storage Technologies10.5555/3323298.3323301(17-30)Online publication date: 25-Feb-2019
  • (2019)A Survey on PCM Lifetime Enhancement SchemesACM Computing Surveys10.1145/333225752:4(1-38)Online publication date: 30-Aug-2019
  • (2019)An Efficient Spare-Line Replacement Scheme to Enhance NVM SecurityProceedings of the 56th Annual Design Automation Conference 201910.1145/3316781.3317767(1-6)Online publication date: 2-Jun-2019
  • (2019)Adaptive Granularity Encoding for Energy-efficient Non-Volatile Main MemoryProceedings of the 56th Annual Design Automation Conference 201910.1145/3316781.3317760(1-6)Online publication date: 2-Jun-2019
  • (2018)Rethinking self-balancing binary search tree over phase change memory with write asymmetryProceedings of the 23rd Asia and South Pacific Design Automation Conference10.5555/3201607.3201736(548-553)Online publication date: 22-Jan-2018
  • (2018)Enhancing Flash Memory Reliability by Jointly Considering Write-back Pattern and Block EnduranceACM Transactions on Design Automation of Electronic Systems10.1145/322919223:5(1-24)Online publication date: 22-Aug-2018
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