Cited By
View all- Gupta PGupta AAsati A(2018)Leakage immune modified pass transistor based 8t SRAM cell in subthreshold regionInternational Journal of Reconfigurable Computing10.1155/2015/7498162015(6-6)Online publication date: 13-Dec-2018
Scaling of conventional CMOS circuit tends to have short channel effects due to which, effect such as drain induced barrier lowering, hot electron effect, punch through etc takes place and hence leakage increases in the transistor. To minimize short ...
The leakage current and process variation are drastically increased with technology scaling. In Conventional SRAM cell due to process variations, stored data can be destroyed during read operation. Therefore, leakage current of SRAM cell and stability ...
Low voltage and high-density SRAM memory creates new challenges such as stability and sense margin. Conventional decoupled 8T SRAM cell has improved read stability but small sense margin and high leakage power which makes it unsuitable for small supply ...
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