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View all- Fujiwara EMatsuoka K(1987)A self-checking generalized prediction checker and its use for built-in testingIEEE Transactions on Computers10.1109/TC.1987.500945136:1(86-93)Online publication date: 1-Jan-1987
This paper presents a new design for a self-checking checker for nonencoded multiinput combinational circuits. A built-in testing method is also stressed. The proposed checker, called a generalized prediction checker (GPC), has an extended and ...
This paper presents a new simple and straightforward method for designing Self-Testing Embedded (STE) parity checkers. The building block is the two-input XOR gate. During normal, fault-free operation, each XOR gate receives all possible input vectors. ...
In this paper, we design a new class of self-testing checkers, self-testing nonincreasing order checkers, for the first time. The self-testing nonincreasing order checker is a critical component to design concurrent checking VLSI sorters because it is ...
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