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A system-level methodology for fully compensating process variability impact of memory organizations in periodic applications

Published: 19 September 2005 Publication History

Abstract

Process variability is an emerging problem that is becoming worse with each new technology node. Its impact on the performance and energy of memory organizations is severe and degrades the system-level parametric yield. In this paper we propose a broadly applicable system-level technique that can guarantee parametric yield on the memory organization and which minimizes the energy overhead associated to variability in the conventional design process. It is based on offering configuration capabilities at the memory-level and exploiting them at the system-level. This technique can decrease by up to a factor of 5 the energy overhead that is introduced by state-of-the-art process variability compensation techniques, including statistical timing analysis. In this way we obtain results close to the ideal nominal design again.

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  • (2013)Hardware/software approaches for reducing the process variation impact on instruction fetchesACM Transactions on Design Automation of Electronic Systems10.1145/248977818:4(1-23)Online publication date: 25-Oct-2013
  • (2009)System-level PVT variation-aware power exploration of on-chip communication architecturesACM Transactions on Design Automation of Electronic Systems10.1145/1497561.149756314:2(1-25)Online publication date: 7-Apr-2009
  • (2009)Process-Variation-Aware Adaptive Cache Architecture and ManagementIEEE Transactions on Computers10.1109/TC.2009.3058:7(865-877)Online publication date: 1-Jul-2009
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  1. A system-level methodology for fully compensating process variability impact of memory organizations in periodic applications

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      cover image ACM Conferences
      CODES+ISSS '05: Proceedings of the 3rd IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis
      September 2005
      356 pages
      ISBN:1595931619
      DOI:10.1145/1084834
      Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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      Published: 19 September 2005

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      Author Tags

      1. parametric yield
      2. process variability
      3. system-level compensation

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      CODES+ISSS '05 Paper Acceptance Rate 50 of 200 submissions, 25%;
      Overall Acceptance Rate 280 of 864 submissions, 32%

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      Cited By

      View all
      • (2013)Hardware/software approaches for reducing the process variation impact on instruction fetchesACM Transactions on Design Automation of Electronic Systems10.1145/248977818:4(1-23)Online publication date: 25-Oct-2013
      • (2009)System-level PVT variation-aware power exploration of on-chip communication architecturesACM Transactions on Design Automation of Electronic Systems10.1145/1497561.149756314:2(1-25)Online publication date: 7-Apr-2009
      • (2009)Process-Variation-Aware Adaptive Cache Architecture and ManagementIEEE Transactions on Computers10.1109/TC.2009.3058:7(865-877)Online publication date: 1-Jul-2009
      • (2008)Combining system scenarios and configurable memories to tolerate unpredictabilityACM Transactions on Design Automation of Electronic Systems10.1145/1367045.136705813:3(1-7)Online publication date: 25-Jul-2008
      • (2008)Incorporating PVT Variations in System-Level Power Exploration of On-Chip Communication ArchitecturesProceedings of the 21st International Conference on VLSI Design10.1109/VLSI.2008.14(363-370)Online publication date: 4-Jan-2008
      • (2008)Reliable Cache Memory Design for Sensor NetworksProceedings of the 2008 Third International Conference on Convergence and Hybrid Information Technology - Volume 0110.1109/ICCIT.2008.125(651-656)Online publication date: 11-Nov-2008
      • (2008)Synthesis of Runtime Switchable Pareto Buffers Offering Full Range Fine Grained Energy/Delay Trade-OffsJournal of Signal Processing Systems10.1007/s11265-007-0147-552:2(193-210)Online publication date: 1-Aug-2008
      • (2008)Reliability Issues in Deep Deep Submicron Technologies: Time-Dependent Variability and its Impact on Embedded System DesignVLSI-SoC: Research Trends in VLSI and Systems on Chip10.1007/978-0-387-74909-9_8(119-141)Online publication date: 2008
      • (2007)Working with process variation aware cachesProceedings of the conference on Design, automation and test in Europe10.5555/1266366.1266615(1152-1157)Online publication date: 16-Apr-2007
      • (2007)Impact of Random Soft Oxide Breakdown on SRAM Energy/Delay DriftIEEE Transactions on Device and Materials Reliability10.1109/TDMR.2007.9104447:4(581-591)Online publication date: Dec-2007
      • Show More Cited By

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