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A PD-based methodology to enhance efficiency in testbenches with random stimulation

Published: 31 August 2009 Publication History

Abstract

Among the current verification techniques, functional verification has received important attention, since it represents an alternative that keeps HDL validation costs low throughout the circuit's design cycle. Functional verification is based in testbenches, and it works by exploring the whole (or relevant) model's functionality, applying sets of testcases. There are different techniques concerning testbenches operation, being the random stimulation an important approach, by which a huge number of testcases can be automatically created and applied. In testbench development, creation of random stimuli generators containing overlapping or invalid input parameter subspaces may occur, wasting computational time during testbench execution. In this work, we present a methodology to organize and apply random input stimuli by means of IP parameter domain, PD, formalism. The methodology provides the application of stimulus which: 1) belongs to the valid parameter subspace; 2) avoids repeated conditions; 3) covers the parameter subspaces uniformly. Moreover the methodology allows the automation of several tasks, making it efficient and less error-prone. Results on applying such a methodology are compared to cases where test vectors from the complete (unreduced, unorganized) verification space are generated manually, analyzing its relation to the coverage models specified for the design verification.

References

[1]
Wile, Bruce, Goss, John C e Roesner, Wolfgang. "Comprehensive Funcional Verification", Morgan Kaufmann Publishers. San Francisco, Elsevier Inc., 2005.
[2]
J. Bergeron, "Writing Testbenches: Functional Verification of HDL Model", Second edition, Kluwer Academic Publishers, Boston, 2003.
[3]
V. Jerinic, D. Müller, "Safe integration of parameterized IP", INTEGRATION: The VLSI Journal, vol. 37, no. 4, pp. 193--221, 2004.
[4]
O. Guzey, L. Wang, J. Levitt, H. Foster. "Functional Test Selection Based on Unsupervised Support Vector Analysis", DAC 2008, pp. 262--267.
[5]
M. Braun, W. Rosenstiel, and K. Schubert, "Comparison of Bayesian networks and data mining for coverage directed verification", High Level Design Verification and Test Workshop, pp. 91--95, 2003.
[6]
C. Castro, E. Romero, M. Strum, J. Wang, "Automatic generation of random stimuli sources based on PDs for functional verification", in Proceedings of the 2008 IEEE Dallas Circuits and Systems Workshop, pp. 79--82.
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INTERNATIONAL STANDARD ISO/IEC 14496-2, Second edition, "Information technology - Coding of audio-visual objects - Part 2: Visual". December 2001.
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E. Romero, M. Strum, W. Chau, "Comparing Two Testbench Methods for Hierarchical Functional Verification of a Bluetooth Baseband Adaptor". 2005, Proc. of the 2005 International Conference on Hardware/Software Codesign and System Synthesis (CODES+ISSS 2005), pp. 327--332.
[9]
SystemC Verification Standard Specification, Version 1.0e, SystemC Verification Working Group, 2003

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  1. A PD-based methodology to enhance efficiency in testbenches with random stimulation

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    cover image ACM Conferences
    SBCCI '09: Proceedings of the 22nd Annual Symposium on Integrated Circuits and System Design: Chip on the Dunes
    August 2009
    325 pages
    ISBN:9781605587059
    DOI:10.1145/1601896
    Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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    Published: 31 August 2009

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    Author Tags

    1. coverage analysis
    2. design methodologies
    3. functional verification
    4. parameter domains
    5. system-on-chip

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    Overall Acceptance Rate 133 of 347 submissions, 38%

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