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On-chip transient current monitor for testing of low-voltage CMOS IC

Authors:

V. Stopjaková,

H. Manhaeve,

M. SidiropulosAuthors Info & Claims

DATE '99: Proceedings of the conference on Design, automation and test in Europe

Pages 109 - es

https://doi.org/10.1145/307418.307560

Published: 01 January 1999 Publication History

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Cited By

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Pathrose JAli GKerkhoff H(2018)IJTAG compatible analogue embedded instruments for MPSoC life-time prediction2018 IEEE 19th Latin-American Test Symposium (LATS)10.1109/LATW.2018.8349691(1-4)Online publication date: Mar-2018
https://doi.org/10.1109/LATW.2018.8349691
Onabajo MSilva-Martinez JOnabajo MSilva-Martinez J(2012)Process Variation Challenges and Solutions ApproachesAnalog Circuit Design for Process Variation-Resilient Systems-on-a-Chip10.1007/978-1-4614-2296-9_2(9-30)Online publication date: 8-Mar-2012
https://doi.org/10.1007/978-1-4614-2296-9_2
Dasnurkar SAbraham J(2010)Calibration-enabled scalable built-in current sensor compatible with very low cost ATE2010 15th IEEE European Test Symposium10.1109/ETSYM.2010.5512770(119-124)Online publication date: May-2010
https://doi.org/10.1109/ETSYM.2010.5512770
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On-chip transient current monitor for testing of low-voltage CMOS IC
1. Hardware
  1. Integrated circuits

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DATE '99: Proceedings of the conference on Design, automation and test in Europe

January 1999

730 pages

ISBN:1581131216

DOI:10.1145/307418

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 01 January 1999

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Pathrose JAli GKerkhoff H(2018)IJTAG compatible analogue embedded instruments for MPSoC life-time prediction2018 IEEE 19th Latin-American Test Symposium (LATS)10.1109/LATW.2018.8349691(1-4)Online publication date: Mar-2018
https://doi.org/10.1109/LATW.2018.8349691
Onabajo MSilva-Martinez JOnabajo MSilva-Martinez J(2012)Process Variation Challenges and Solutions ApproachesAnalog Circuit Design for Process Variation-Resilient Systems-on-a-Chip10.1007/978-1-4614-2296-9_2(9-30)Online publication date: 8-Mar-2012
https://doi.org/10.1007/978-1-4614-2296-9_2
Dasnurkar SAbraham J(2010)Calibration-enabled scalable built-in current sensor compatible with very low cost ATE2010 15th IEEE European Test Symposium10.1109/ETSYM.2010.5512770(119-124)Online publication date: May-2010
https://doi.org/10.1109/ETSYM.2010.5512770
Mozuelos RLechuga YMartínez MBracho S(2010)Test Based on Built-In Current Sensors for Mixed-Signal CircuitsEmerging Trends in Technological Innovation10.1007/978-3-642-11628-5_58(523-530)Online publication date: 2010
https://doi.org/10.1007/978-3-642-11628-5_58
Chen CLo JXia TQu GIsmail YNarayanan VZhou H(2006)An indirect current sensing technique for IDDQ and IDDT testsProceedings of the 16th ACM Great Lakes symposium on VLSI10.1145/1127908.1127964(235-240)Online publication date: 30-Apr-2006
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Lechuga YMozuelos RAllende MMartínez MBracho S(2005)Fault detection in switched current circuits using built-in transient current sensorsJournal of Electronic Testing: Theory and Applications10.1007/s10836-005-2543-821:6(583-598)Online publication date: 1-Dec-2005
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Russell GLi YBahr H(2005)Low Cost High Temperature Test System for SOI DevicesScience and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment10.1007/1-4020-3013-4_26(241-246)Online publication date: 2005
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Alorda BCanals VSegura J(2004)A Two-Level Power-Grid Model for Transient Current Testing EvaluationJournal of Electronic Testing: Theory and Applications10.1023/B:JETT.0000042518.15795.f020:5(543-552)Online publication date: 1-Oct-2004
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Stopjaková VMalošek PMičušík DMatej MMargala M(2004)Classification of Defective Analog Integrated Circuits Using Artificial Neural NetworksJournal of Electronic Testing: Theory and Applications10.1023/B:JETT.0000009311.63472.d620:1(25-37)Online publication date: 1-Feb-2004
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Dragic MFilanovsky IMargala M(2004)A Novel On-Chip Amplifier for Fast I Current MonitoringAnalog Integrated Circuits and Signal Processing10.1023/B:ALOG.0000041635.23947.a841:2-3(185-198)Online publication date: 1-Dec-2004
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Variability-conscious circuit designs for low-voltage memory-rich nano-scale CMOS LSIs

Leakage Suppression of Low Voltage Transient Voltage Suppressor

Low-voltage limitations of deep-sub-100-nm CMOS LSIs: view of memory designers

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