Article

On the generation of scan-based test sets with reachable states for testing under functional operation conditions

Author:

Irith PomeranzAuthors Info & Claims

DAC '04: Proceedings of the 41st annual Design Automation Conference

Pages 928 - 933

https://doi.org/10.1145/996566.996813

Published: 07 June 2004 Publication History

Abstract

Design-for-testability (DFT) for synchronous sequential circuits allows the generation and application of tests that rely on non-functional operation of the circuit. This can result in unnecessary yield loss due to the detection of faults that do not affect normal circuit operation. Considering single stuck-at faults in full-scan circuits, a test vector consists of a primary input vector U and a state S .We say that the test vector consisting of U and S relies on non-functional operation if S is an unreachable state, i.e., a state that cannot be reached from all the circuit states. Our goal is to obtain test sets with states S that are reachable states. Given a test set C, the solution we explore is based on a simulation-based procedure to identify reachable states that can replace unreachable states in C. No modifications are required to the test generation procedure and no sequential test generation is needed. Our results demonstrate that the proposed procedure is able to produce test sets that detect many of the circuit faults, which are detectable using scan, and practically all the sequentially irredundant faults, by using test vectors with reachable states. The procedure is applicable to any type of scan-based test set, including test sets for delay faults.

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Cited By

Pomeranz I(2023)Compact Set of Functional Broadside Tests with Fault Detection on Primary Outputs2023 IEEE 41st VLSI Test Symposium (VTS)10.1109/VTS56346.2023.10140078(1-7)Online publication date: 24-Apr-2023
https://doi.org/10.1109/VTS56346.2023.10140078
Pomeranz I(2023)Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test SetIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2022.319390242:4(1336-1345)Online publication date: Apr-2023
https://doi.org/10.1109/TCAD.2022.3193902
Rajam PTheresa MSlacer PPriyadharshini RJacob J(2022)Effective broadside tests using test cube seed generationRECENT TRENDS IN SCIENCE AND ENGINEERING10.1063/5.0074374(020118)Online publication date: 2022
https://doi.org/10.1063/5.0074374
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Index Terms

On the generation of scan-based test sets with reachable states for testing under functional operation conditions
1. Hardware
  1. Hardware test
  2. Robustness

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cover image ACM Conferences

DAC '04: Proceedings of the 41st annual Design Automation Conference

June 2004

1002 pages

ISBN:1581138288

DOI:10.1145/996566

General Chair:
Sharad Malik
Princeton University, Princeton, NJ
,
Program Chairs:
Limor Fix
Intel Semiconductors Ltd., Haifa, Israel
,
Andrew B. Kahng
University of California at San Diego, La Jolla, CA

Copyright © 2004 ACM.

Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 07 June 2004

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Cited By

Pomeranz I(2023)Compact Set of Functional Broadside Tests with Fault Detection on Primary Outputs2023 IEEE 41st VLSI Test Symposium (VTS)10.1109/VTS56346.2023.10140078(1-7)Online publication date: 24-Apr-2023
https://doi.org/10.1109/VTS56346.2023.10140078
Pomeranz I(2023)Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test SetIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2022.319390242:4(1336-1345)Online publication date: Apr-2023
https://doi.org/10.1109/TCAD.2022.3193902
Rajam PTheresa MSlacer PPriyadharshini RJacob J(2022)Effective broadside tests using test cube seed generationRECENT TRENDS IN SCIENCE AND ENGINEERING10.1063/5.0074374(020118)Online publication date: 2022
https://doi.org/10.1063/5.0074374
Pomeranz I(2021)Covering Test Holes of Functional Broadside TestsACM Transactions on Design Automation of Electronic Systems10.1145/344128226:3(1-15)Online publication date: 6-Jan-2021
https://dl.acm.org/doi/10.1145/3441282
Pomeranz I(2021)Functional Constraints in the Selection of Two-Cycle Gate-Exhaustive Faults for Test GenerationIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2021.308104629:7(1500-1504)Online publication date: Jul-2021
https://doi.org/10.1109/TVLSI.2021.3081046
Pomeranz I(2020)Globally Functional Transparent-Scan SequencesIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2019.293933139:10(3012-3022)Online publication date: Oct-2020
https://doi.org/10.1109/TCAD.2019.2939331
Pomeranz I(2020)Functional Broadside Tests Under Broadcast ScanIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems10.1109/TCAD.2019.293932439:10(3139-3143)Online publication date: Oct-2020
https://doi.org/10.1109/TCAD.2019.2939324
Pomeranz I(2019)Extracting a Close-to-Minimum Multicycle Functional Broadside Test Set From a Functional Test SequenceIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2019.2895386(1-10)Online publication date: 2019
https://doi.org/10.1109/TVLSI.2019.2895386
Pomeranz I(2019)Compaction of a Functional Broadside Test Set through the Compaction of a Functional Test Sequence without Sequential Fault Simulation2019 IEEE International Test Conference (ITC)10.1109/ITC44170.2019.9000161(1-7)Online publication date: Nov-2019
https://doi.org/10.1109/ITC44170.2019.9000161
Pomeranz I(2019)LFSR‐based generation of boundary‐functional broadside testsIET Computers & Digital Techniques10.1049/iet-cdt.2019.005814:2(61-68)Online publication date: 25-Sep-2019
https://doi.org/10.1049/iet-cdt.2019.0058
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