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OOPS! (OntOlogy Pitfall Scanner!): An On-line Tool for Ontology Evaluation

Published: 01 April 2014 Publication History
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  • Abstract

    This paper presents two contributions to the field of Ontology Evaluation. First, a live catalogue of pitfalls that extends previous works on modeling errors with new pitfalls resulting from an empirical analysis of over 693 ontologies. Such a catalogue classifies pitfalls according to the Structural, Functional and Usability-Profiling dimensions. For each pitfall, we incorporate the value of its importance level (critical, important and minor) and the number of ontologies where each pitfall has been detected. Second, OOPS! (OntOlogy Pitfall Scanner!), a tool for detecting pitfalls in ontologies and targeted at newcomers and domain experts unfamiliar with description logics and ontology implementation languages. The tool operates independently of any ontology development platform and is available online. The evaluation of the system is provided both through a survey of users' satisfaction and worldwide usage statistics. In addition, the system is also compared with existing ontology evaluation tools in terms of coverage of pitfalls detected.

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    Published In

    cover image International Journal on Semantic Web & Information Systems
    International Journal on Semantic Web & Information Systems  Volume 10, Issue 2
    April 2014
    86 pages
    ISSN:1552-6283
    EISSN:1552-6291
    Issue’s Table of Contents

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    IGI Global

    United States

    Publication History

    Published: 01 April 2014

    Author Tags

    1. Ontology
    2. Ontology Evaluation
    3. Ontology Quality
    4. Ontology Validation
    5. Pitfalls

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