Automatic test generation for linear digital systems with bi-level search using matrix transform methods
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Automatic test generation for linear digital systems with bi-level search using matrix transform methods
ICCAD '92: 1992 IEEE/ACM international conference proceedings on Computer-aided designA global optimization algorithm for solving the bi-level linear fractional programming problem
In this paper, we obtain the solution to bi-level linear fractional programming problem (BLFP) by means of an optimization algorithm based on the duality gap of the lower level problem. In our algorithm, the bi-level linear fractional programming ...
Semi-automatic Search-Based Test Generation
ICST '12: Proceedings of the 2012 IEEE Fifth International Conference on Software Testing, Verification and ValidationSearch-based testing techniques can efficiently generate test data to achieve high code coverage. However, when the fitness function does not provide sufficient guidance, the search will only generate optimal results by chance. Yet, where the search ...
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- SIGDA: ACM Special Interest Group on Design Automation
- IEEE-CAS: Circuits & Systems
- IEEE-CS: Computer Society
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IEEE Computer Society Press
Washington, DC, United States
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