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Automatic test generation for linear digital systems with bi-level search using matrix transform methods

Published: 08 November 1992 Publication History
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References

[1]
A.E. Casavant et. al., "A synthesis environment for designing DSP systems," IEEE Design Test Comp., pp. 35-44, Apr. 1989.
[2]
P. B. Denyer and D. Renshaw, VLSI Signal Processing, A bit-Serial Approach. Reading, MA: Addison-Wesley, 1985.
[3]
R. Jain et. al., "Custom design of a VLSI PCM- FDM transmultiplexor from system specification to circuit layout using a computer-aided design system," IEEE J. Solid State Circuits, vol. SC-21, pp. 73-85, Feb. 1986.
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R.I. Hartley and P. F. Corbett, "A digit-serial silicon compiler," Proc. 25th Design Automation Conf., pp. 646-649, 1988.
[5]
A.F. Murray, P. B. Denyer, and D. Renshaw, "Self-testing in bit-serial VLSI parts: high coverage at low cost," Proc. Intl. Test Conf., pp. 260-268, 1983.
[6]
S. G. Smith and P. B. Denyer, Serial-Data Computation. Boston, MA: Kluwer Academic Publishers, 1988.
[7]
N. Kanopoulos and G. T. Mitchell, "Design for testability and self-testing approaches for bit-serial signal processors," IEEE Design and Test Comp., pp. 52-59, May 1984.
[8]
T.M. Niermann and J. H. Patel, "HITEC: A test generation package for sequential circuits," Proc. European Design Automation Conf., pp. 214-218, 1991.
[9]
W.-T. Cheng, "The BACK algorithm for sequential test generation," Proc. Intl. Conf. Computer Design, pp. 66-69, 1988.
[10]
C.-T. Chen, Linear System Theory and Design. New York: Holt, Rinehart and Winston, 1970.
[11]
M. Abramovici, M. A. Breuer, and A. D. Friedman, Digital Systems Testing and Testable Design. New York, NY: Computer Science Press, 1990.
[12]
T.M. Niermann, W.-T. Cheng, and J. H. Patel, "Proofs: A fast memory efficient fault simulator for sequential circuits," Proc. 27th Design Automation Conf., pp. 535-540, 1990.
[13]
G. H. Golub and C. F. Van Loan, Matrix Computations. Baltimore, MD: Johns Hopkins University Press, 1983.
[14]
R.K. Roy, "Automatic Test Generation for Bit-serial VLSI Digital Signal Processors," Ph.D. Dissertation, University of Illinois at Urbana-Champaign, Feb. 1992.

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  1. Automatic test generation for linear digital systems with bi-level search using matrix transform methods

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      cover image ACM Conferences
      ICCAD '92: Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
      November 1992
      637 pages
      ISBN:0897915402

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      IEEE Computer Society Press

      Washington, DC, United States

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      Published: 08 November 1992

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