Article

Embedded two-rail checkers with on-line testing ability

Authors:

C. Metra,

M. Favalli,

B. RiccoAuthors Info & Claims

VTS '96: Proceedings of the 14th IEEE VLSI Test Symposium

Page 145

Published: 28 April 1996 Publication History

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Abstract

This paper addresses the problem of the design of embedded two-rail checkers. In particular a simple additional circuit is proposed which can be used to make a two-rail checker receive all the codewords of the two-rail code, independently of which and how many codewords are produced by its driving functional block or checkers. The proposed circuit features a high online self-testing ability with respect to possible internal faults and a compact structure.

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Omana MRossi DMetra C(2005)Low Cost and High Speed Embedded Two-Rail Code CheckerIEEE Transactions on Computers10.1109/TC.2005.3054:2(153-164)Online publication date: 1-Feb-2005
https://dl.acm.org/doi/10.1109/TC.2005.30
Omana MRossi DMetra C(2003)High Speed and Highly Testable Parallel Two-Rail Code CheckerProceedings of the conference on Design, Automation and Test in Europe - Volume 110.5555/789083.1022793Online publication date: 3-Mar-2003
https://dl.acm.org/doi/10.5555/789083.1022793
Metra CPagano ARiccò B(2001)On-Line Testing of Transient and Crosstalk Faults Affecting Interconnections of FPGA-Implemented SystemsProceedings of the 2001 IEEE International Test Conference10.5555/839296.843702Online publication date: 30-Oct-2001
https://dl.acm.org/doi/10.5555/839296.843702
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Embedded two-rail checkers with on-line testing ability
1. Hardware

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VTS '96: Proceedings of the 14th IEEE VLSI Test Symposium

April 1996

ISBN:0818673044

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IEEE Computer Society

United States

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Published: 28 April 1996

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Omana MRossi DMetra C(2005)Low Cost and High Speed Embedded Two-Rail Code CheckerIEEE Transactions on Computers10.1109/TC.2005.3054:2(153-164)Online publication date: 1-Feb-2005
https://dl.acm.org/doi/10.1109/TC.2005.30
Omana MRossi DMetra C(2003)High Speed and Highly Testable Parallel Two-Rail Code CheckerProceedings of the conference on Design, Automation and Test in Europe - Volume 110.5555/789083.1022793Online publication date: 3-Mar-2003
https://dl.acm.org/doi/10.5555/789083.1022793
Metra CPagano ARiccò B(2001)On-Line Testing of Transient and Crosstalk Faults Affecting Interconnections of FPGA-Implemented SystemsProceedings of the 2001 IEEE International Test Conference10.5555/839296.843702Online publication date: 30-Oct-2001
https://dl.acm.org/doi/10.5555/839296.843702
Metra CFavalli MRiccò B(2000)Self-Checking Detection and Diagnosis of Transient, Delay, and Crosstalk Faults Affecting Bus LinesIEEE Transactions on Computers10.1109/12.86221649:6(560-574)Online publication date: 1-Jun-2000
https://dl.acm.org/doi/10.1109/12.862216
Metra CGiovanelli FSoma MRiccò B(1999)Self-Checking Scheme for Very Fast Clocks' Skew CorrectionProceedings of the 1999 IEEE International Test Conference10.5555/518925.939396Online publication date: 28-Sep-1999
https://dl.acm.org/doi/10.5555/518925.939396
Nikolos D(1998)Self-Testing Embedded Two-Rail CheckersJournal of Electronic Testing: Theory and Applications10.1023/A:100828182296612:1-2(69-79)Online publication date: 1-Feb-1998
https://dl.acm.org/doi/10.1023/A%3A1008281822966
Metra CFavalli MRicco B(1997)Highly testable and compact single output comparatorProceedings of the 15th IEEE VLSI Test Symposium10.5555/832297.836329Online publication date: 27-Apr-1997
https://dl.acm.org/doi/10.5555/832297.836329

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