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10.5555/851002.855936guideproceedingsArticle/Chapter ViewAbstractPublication PagesConference Proceedingsacm-pubtype
Article

Optimizing the Yield of VLSI Circuits

Published: 24 March 2003 Publication History

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cover image Guide Proceedings
ISQED '03: Proceedings of the 4th International Symposium on Quality Electronic Design
March 2003
ISBN:0769518818

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IEEE Computer Society

United States

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Published: 24 March 2003

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