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Circuit partitioning for efficient logic BIST synthesis

Published: 13 March 2001 Publication History
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    References

    [1]
    G. Hetherington, T. Fryars, N. Tamarapalli, M. Kassab, A. Hassan, J. Rajski, Logic BIST for Large Industrial Designs: Real Issues and Case Studies, Proceedings International Test Conference, IEEE, 1999, pp. 358-367.
    [2]
    B. Nadeau-Dostie, Design For At-Speed Test, Diagnosis and Measurement, Kluwer, 2000.
    [3]
    P.H. Bardell, W.H. McAnney, Parallel Pseudorandom Sequences for Built-In Test, Proceedings International Test Conference, IEEE, 1984, pp. 302- 308.
    [4]
    J.P. Hayes, A.D. Friedman, Test Point Placement to Simplify Fault Detection, IEEE Transactions on Computers, Vol. C-33, July 1974, pp. 727-735.
    [5]
    B.H. Seiss, P.M. Trousborst, M.H. Schulz, Test Point Insertion for Scan-Based BIST, Proceedings European Test Conference, IEEE, 1991, pp. 253-262.
    [6]
    N. Tamarapalli, J. Rajski, Constructive Multi-Phase Test Point Insertion for Scan-Based BIST, Proceedings International Test Conference, IEEE, 1996, pp. 649-658.
    [7]
    B. Koenemann, LFSR-Coded Test Patterns for Scan Design, Proceedings European Test Conference, Munich, 1991, pp. 237-242.
    [8]
    S. Hellebrand, B. Reeb, S. Tarnick, H.-J. Wunderlich, Pattern Generation for a Deterministic BIST Scheme, Proceedings ACM/IEEE International Conference on CAD-95 (ICCAD95), San Jose, CA, November 1995, pp. 88-94.
    [9]
    N. A. Touba, E. J. McCluskey, Altering a pseudorandom bit sequence for scan-based BIST, Proceedings IEEE International Test Conference, 1996, pp. 167-175.
    [10]
    H.-J. Wunderlich, G. Kiefer, Bit-Flipping BIST, Proceedings International Conference on Computer- Aided Design, IEEE, 1996, pp. 337-343.
    [11]
    G. Kiefer, H.-J. Wunderlich, Using BIST Control for Pattern Generation, Proceedings IEEE International Test Conference, Washington, DC, November 1997, pp. 347-355.
    [12]
    G. Kiefer, H.-J. Wunderlich, Deterministic BIST with Multiple Scan Chains, Proceedings IEEE International Test Conference, Washington, DC, October 1998, pp. 1057-1064.
    [13]
    G. Kiefer, H.-J. Wunderlich, Deterministic BIST with Partial Scan, Proceedings IEEE European Test Workshop, Constance, May 25-28, 1999.
    [14]
    G. Kiefer, H. Vranken, E.J. Marinissen, H.-J. Wunderlich, Application of Deterministic Logic BIST on Industrial Circuits, Proceedings International Test Conference, IEEE, 2000, pp.105-114.
    [15]
    P.S. Bottorff, R.E. France, N.H. Garges, E.J. Orosz, Test Generation for Large Logic Networks, Proceedings Design Automation Conference, IEEE/ACM, 1977, pp. 479-485.
    [16]
    A. Yamada, N. Wakatsuki, T. Fukui, S. Funatsu, Automatic System Level Test Generation and Fault Location for Large Digital Systems, Proceedings Design Automation Conference, IEEE/ACM, 1978, pp. 347-352.
    [17]
    S. Patil, P. Banerjee, Fault Partitioning Issues in an Integrated Parallel Test Generation/Fault Simulation Environment, Proceedings International Test Conference, IEEE, 1989, pp. 718-726.
    [18]
    R.H. Klenke, R.D. Williams, J.H. Aylor, Parallelization Methods for Circuit Partitioning Based Parallel Automatic Test Pattern Generation, Proceedings VLSI Test Symposium, IEEE, 1993, pp. 71-78.
    [19]
    F. Brglez, D. Bryan, K. Komzminski, Combinational Profiles of Sequential Benchmark Circuits, Proceedings International Symposium on Circuits and Systems, IEEE, 1989, pp. 1929-1934.
    [20]
    Y. Zorian, E.J. Marinissen, S. Dey, Testing Embedded-Core Based System Chips, Proceedings International Test Conference, IEEE, Washington, D.C, October 1998, pp. 130-143.
    [21]
    P. Goel, Test Generation Costs Analysis and Projections, Proceedings Design Automation Conference, ACM/IEEE, 1980, pp. 77-84.
    [22]
    D. Harel, B. Krishnamurthy, Is there hope for Linear Fault Simulation?, Proceedings International Symposium on Fault-Tolerant Computing, IEEE, 1987, pp. 28-33.
    [23]
    H. Fujiwara, S. Toida, The Complexity of Fault Detection Problems for Combinational Logic Circuits, IEEE Transactions on Computers, Vol. C- 31, No. 6, June 1982.

    Cited By

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    • (2003)Efficient compression and application of deterministic patterns in a logic BIST architectureProceedings of the 40th annual Design Automation Conference10.1145/775832.775976(566-569)Online publication date: 2-Jun-2003

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    Published In

    cover image ACM Conferences
    DATE '01: Proceedings of the conference on Design, automation and test in Europe
    March 2001
    756 pages
    ISBN:0769509932

    Sponsors

    • EDAA: European Design Automation Association
    • IFIP WG 10.5: IFIP WG 10.5
    • ECSI
    • EDAC: Electronic Design Automation Consortium
    • SIGDA: ACM Special Interest Group on Design Automation
    • IEEE-CS\TTTC: Test Technology Technical Council
    • IEEE-CS\DATC: IEEE Computer Society
    • The Russian Academy of Sciences: The Russian Academy of Sciences

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    IEEE Press

    Publication History

    Published: 13 March 2001

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    Author Tags

    1. circuit partitioning
    2. deterministic BIST
    3. divide-and-conquer

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    Sponsor:
    • EDAA
    • IFIP WG 10.5
    • EDAC
    • SIGDA
    • IEEE-CS\TTTC
    • IEEE-CS\DATC
    • The Russian Academy of Sciences

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    • (2003)Efficient compression and application of deterministic patterns in a logic BIST architectureProceedings of the 40th annual Design Automation Conference10.1145/775832.775976(566-569)Online publication date: 2-Jun-2003

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