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Searched The ACM Guide to Computing Literature (3,749,455 records)|Limit your search to The ACM Full-Text Collection (755,871 records)
- research-articleMarch 1998
Optimal Self-Testing Embedded Parity Checkers
IEEE Transactions on Computers (ITCO), Volume 47, Issue 3March 1998, Pages 313–321https://doi.org/10.1109/12.660167This paper presents a new simple and straightforward method for designing Self-Testing Embedded (STE) parity checkers. The building block is the two-input XOR gate. During normal, fault-free operation, each XOR gate receives all possible input vectors. ...