Abstract
In this paper, we propose a new clustered reconfigurable interconnect network (CRIN) BIST to improve the embedding probabilities of random-pattern-resistant-patterns. The proposed method uses a scan-cell reordering technique based on the signal probabilities of given test cubes and specific hardware blocks that increases the embedding probabilities of care bit clustered scan chain test cubes. We have developed a simulated annealing based algorithm that maximizes the embedding probabilities of scan chain test cubes to reorder scan cells, and an iterative algorithm for synthesizing the CRIN hardware. Experimental results demonstrate that the proposed CRIN BIST technique achieves complete fault coverage with lower storage requirement and shorter testing time in comparison with a previous method.
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Song, DS., Kang, S. (2005). Increasing Embedding Probabilities of RPRPs in RIN Based BIST. In: Srikanthan, T., Xue, J., Chang, CH. (eds) Advances in Computer Systems Architecture. ACSAC 2005. Lecture Notes in Computer Science, vol 3740. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11572961_49
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DOI: https://doi.org/10.1007/11572961_49
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