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Discovering the input assumptions in specification refinement coverage

Published: 24 January 2006 Publication History

Abstract

The design of a large chip is typically hierarchical - large modules are recursively expanded into a collection of sub-modules. Each expansion refines the design due to the addition of level specific details. We believe that a similar approach is necessary to scale the capacity of formal property verification technology - as the design gets refined from one level to another, the formal specification must also be refined to reflect the level specific design decisions. At the heart of this approach we propose a checker that identifies the input assumptions under which the refined specification "covers" the original specification. This enables the validation engineer to focus the verification effort on the remaining input scenarios thereby reducing the number of target coverage points for simulation.

References

[1]
E. M. Clarke, O. Grumberg, and D. A. Peled, Model checking, MIT Press, 2000.
[2]
S. Das, P. Basu, A. Banerjee, P. Dasgupta, P. P. Chakrabarti, C. R. Mohan, L. Fix, R. Armoni, "Formal verification coverage: computing the cover-age gap between temporal specifications," In Proc. of ICCAD, 198--203, 2004.
[3]
A. Pnueli, "The temporal logics of programs," In Proc. of FOCS, 46--57, 1977.
[4]
A. Biere, A. Cimatti, E. M. Clarke, M. Fujita, Y. Zhu, "Symbolic model checking using SAT procedures instead of BDDs," In Proc. of DAC, 1999.
[5]
ARM AMBA specification rev 2.0, http://www.arm.com/

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  1. Discovering the input assumptions in specification refinement coverage

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          cover image ACM Conferences
          ASP-DAC '06: Proceedings of the 2006 Asia and South Pacific Design Automation Conference
          January 2006
          998 pages
          ISBN:0780394518

          Sponsors

          • IEEE Circuits and Systems Society
          • SIGDA: ACM Special Interest Group on Design Automation
          • IEICE ESS: Institute of Electronics, Information and Communication Engineers, Engineering Sciences Society
          • IPSJ SIG-SLDM: Information Processing Society of Japan, SIG System LSI Design Methodology

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          IEEE Press

          Publication History

          Published: 24 January 2006

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