Built-in generation of functional broadside tests considering primary input constraints

Functional broadside tests allow overtesting to be avoided as part of a scheme that considers both test generation and the analysis of output responses, by ensuring that delay faults are detected under functional operation conditions. Compared with two-...

Functional broadside tests are two-pattern scanbased tests that avoid overtesting by ensuring that a circuit traverses only reachable states during the functional clock cycles of a test. In addition, the power dissipation during the fast functional ...

Functional broadside tests avoid overtesting of delay faults by creating functional operation conditions during the clock cycles where delay faults are detected. When a circuit is embedded in a larger design, a functional broadside test needs to take ...