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Wear-Aware Adaptive Routing for Networks-on-Chips

Published: 28 September 2015 Publication History

Abstract

Chip-multiprocessors are facing worsening reliability due to prolonged operational stresses, with their tile-interconnecting Network-on-Chip (NoC) being especially vulnerable to wearout-induced failure. To tackle this ominous threat we present a novel wear-aware routing algorithm that continuously considers the stresses the NoC experiences at runtime, along with temperature and fabrication process variation metrics, steering traffic away from locations that are most prone to Electromigration (EM)- and Hot-Carrier Injection (HCI)-induced wear. Under realistic applications our wear-aware algorithm yields 66% and 8% average increases in mean-time-to-failure for EM and HCI, respectively.

References

[1]
J. R. Black. Electromigration: A Brief Survey and Some Recent Results. In IEEE Transactions on Electron Devices, Vol. 16, No. 4, pp. 338--347, April 1969.
[2]
Y. Hoskote et al. Failure Mechanisms and Models for Semiconductor Devices. Report JEP122G, JEDEC Solid State Technology Association, Oct. 2011.
[3]
L. Huang et al. AgeSim: A Simulation Framework for Evaluating the Lifetime Reliability of Processor-Based SoCs. Proc. Design, Automation & Test in Europe Conference & Exhibition, pp. 51--56, March 2010.
[4]
H. Kim et al. Use It or Lose It: Wear-Out and Lifetime in Future Chip Multiprocessors. Proc. 46th IEEE/ACM Int'l Symposium on Microarchitecture, pp. 136--147, Dec. 2013.
[5]
M. Radetzki et al. Methods for Fault Tolerance in Networks-on-Chip. ACM Computing Surveys, Vol. 46, No. 1, Article No. 8, Oct. 2013.
[6]
M. Ramakrishna et al. GCA: Global Congestion Awareness for Load Balance in Networks-on-Chip. Proc. 7th IEEE/ACM Int'l Symposium on Networks-on-Chip, pp. 1--8, April 2013.
[7]
S. R. Sarangi et al. VARIUS: A Model of Process Variation and Resulting Timing Errors for Microarchitects. IEEE Trans. on Semiconductor Manufacturing, Vol. 21, No. 1, pp. 3--13, 2008.

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  1. Wear-Aware Adaptive Routing for Networks-on-Chips

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        cover image ACM Conferences
        NOCS '15: Proceedings of the 9th International Symposium on Networks-on-Chip
        September 2015
        233 pages
        ISBN:9781450333962
        DOI:10.1145/2786572
        Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for third-party components of this work must be honored. For all other uses, contact the Owner/Author.

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        Association for Computing Machinery

        New York, NY, United States

        Publication History

        Published: 28 September 2015

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        Author Tags

        1. Electromigration (EM)
        2. Hot-Carrier Injection (HCI)
        3. Lifetime
        4. Network-on-Chip
        5. Reliability
        6. Routing Algorithm

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        • Extended-abstract
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        NOCS '15
        NOCS '15: International Symposium on Networks-on-Chip
        September 28 - 30, 2015
        BC, Vancouver, Canada

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        Overall Acceptance Rate 14 of 44 submissions, 32%

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