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POSTER: On the Problem of Consistency Exceptions in the Context of Strong Memory Models

Authors:

Minjia Zhang,

Swarnendu Biswas,

Michael D. BondAuthors Info & Claims

ACM SIGPLAN Notices, Volume 52, Issue 8

Pages 459 - 460

https://doi.org/10.1145/3155284.3019024

Published: 26 January 2017 Publication History

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Abstract

This work considers the problem of availability for memory models that throw consistency exceptions. We define a new memory model called RIx based on isolation of synchronization-free regions and a new approach called Avalon that provides RIx. Our evaluation shows that Avalon and RIx substantially reduce consistency exceptions, by 1-3 orders of magnitude and sometimes eliminate them completely. Furthermore, our exploration provides new, compelling points in the performance-availability tradeoff space.

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Index Terms

POSTER: On the Problem of Consistency Exceptions in the Context of Strong Memory Models
1. Software and its engineering
  1. Software notations and tools
    1. Compilers
      1. Runtime environments

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Information

Published In

ACM SIGPLAN Notices Volume 52, Issue 8

PPoPP '17

August 2017

442 pages

ISSN:0362-1340

EISSN:1558-1160

DOI:10.1145/3155284

Editor:
Matthew Fluet

Issue’s Table of Contents

PPoPP '17: Proceedings of the 22nd ACM SIGPLAN Symposium on Principles and Practice of Parallel Programming
January 2017
476 pages
ISBN:9781450344937
DOI:10.1145/3018743
General Chair:
Vivek Sarkar
Rice University, USA
,
Program Chair:
Lawrence Rauchwerger
Texas A&M University, USA

Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for third-party components of this work must be honored. For all other uses, contact the Owner/Author.

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Association for Computing Machinery

New York, NY, United States

Publication History

Published: 26 January 2017

Published in SIGPLAN Volume 52, Issue 8

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