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Analysis of non-uniform temperature-dependent interconnect performance in high performance ICs

Published: 22 June 2001 Publication History

Abstract

Non-uniform temperature profiles along global interconnect lines in high-performance ICs can significantly impact the performance of these lines. This paper presents a detailed analysis and modeling of the interconnect performance degradation due to non-uniform temperature profiles that exist along their lengths, which in turn arise due to the thermal gradients in the underlying substrate. A non-uniform temperature-dependent distributed RC interconnect delay model is proposed for the first time. The model has been applied to a wide variety of interconnect layouts and temperature distributions to quantify the impact on signal integrity issues including clock skew fluctuations.

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cover image ACM Conferences
DAC '01: Proceedings of the 38th annual Design Automation Conference
June 2001
863 pages
ISBN:1581132972
DOI:10.1145/378239
Permission to make digital or hard copies of all or part of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or commercial advantage and that copies bear this notice and the full citation on the first page. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, or republish, to post on servers or to redistribute to lists, requires prior specific permission and/or a fee. Request permissions from [email protected]

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Published: 22 June 2001

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  • (2021)Temperature-Aware Electromigration Analysis with Current-Tracking in Power Grid NetworksJournal of Computer Science and Technology10.1007/s11390-021-0909-836:5(1133-1144)Online publication date: 30-Sep-2021
  • (2019)Ultimate Monolithic-3D Integration With 2D Materials: Rationale, Prospects, and ChallengesIEEE Journal of the Electron Devices Society10.1109/JEDS.2019.29251507(878-887)Online publication date: 2019
  • (2019)Analysis of Temperature-Dependent Crosstalk for Graphene Nanoribbon and Copper InterconnectsIETE Journal of Research10.1080/03772063.2019.167419368:3(1789-1800)Online publication date: 20-Oct-2019
  • (2019)Temperature Effect Analysis on Microstrip StructureAnalytical Methodology of Tree Microstrip Interconnects Modelling For Signal Distribution10.1007/978-981-15-0552-2_11(215-229)Online publication date: 22-Nov-2019
  • (2018)Cooling CodesIEEE Transactions on Information Theory10.1109/TIT.2017.277124564:4-P2(3062-3085)Online publication date: 1-Apr-2018
  • (2018)Monolithic-3D Integration with 2D Materials: Toward Ultimate Vertically-Scaled 3D-ICs2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)10.1109/S3S.2018.8640131(1-3)Online publication date: Oct-2018
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  • (2014)Temperature Sensing RRAM Architecture for 3-D ICsIEEE Transactions on Very Large Scale Integration (VLSI) Systems10.1109/TVLSI.2013.225637822:4(878-887)Online publication date: 1-Apr-2014
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