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Scanning Probe Microscopy release_rev_e8b2f469-c041-472a-a6ef-968ee57a9a1e

Published in IEEE Control Systems by Institute of Electrical and Electronics Engineers (IEEE).

2008   Volume 28, p65-83

Type  article-journal
Stage   published
Year   2008
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ISSN-L:  1066-033X
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Revision: e8b2f469-c041-472a-a6ef-968ee57a9a1e
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