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Requirements and Compatibility | Ordering Information | Detailed Specifications

For user manuals and dimensional drawings, visit the product page resources tab on ni.com.

Last Revised: 2014-11-06 07:13:49.0

24-Bit, 204.8 kS/s Dynamic Signal Acquisition and Generation

NI 4461, NI 4462

2 or 4 simultaneously sampled analog inputs 6 gain settings

2 simultaneously updated analog outputs (NI 4461 only) AC/DC coupling
118 dB dynamic range, 24-bit resolution Antialiasing and anti-imaging protection
204.8 kS/s maximum sampling rate IEPE conditioning – software-configurable
92 kHz alias-free bandwidth Multimodule synchronization
Input range from ±316 mV to 42.4 V

Overview
The National Instruments 4461 and 4462 are high-accuracy data acquisition devices specifically designed for sound and vibration applications. The devices include the hardware
and software needed to make precision measurements with microphones, accelerometers, and other transducers that have very large dynamic ranges. Common applications for
the NI 446x include audio test, automotive test, noise, vibration, and harshness (NVH) analysis, and machine condition monitoring (MCM). The NI 446x devices offer a complete
range of functionality for sound and vibration monitoring and analysis applications. With either two inputs and two outputs, or four inputs, they are ideal for applications where
simultaneous generation and acquisition of noise, vibration, and acoustic signals are required. You can synchronize the acquisition clock of your NI 446x with other instruments in
your system for mixed-signal applications. Both analog and digital triggering are available on an NI 446x.

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Requirements and Compatibility

OS Information Driver Information Software Compatibility

Windows 2000/XP NI-DAQmx LabVIEW

Windows 7 LabWindows/CVI
Windows NT Measurement Studio
Windows Vista

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Comparison Tables

Analog Input Sampling Analog Output Update

Product Bus Input Range Input Configuration
Inputs Resolution Rate Output Resolution Rate

PXI, ±316 mV to 42.4

NI 4461 2 24 bits 204.8 kS/s Differential/pseudodifferential 2 24 bits 204.8 kS/s
PCI V

PXI, ±316 mV to 42.4

NI 4462 4 24 bits 204.8 kS/s Differential/pseudodifferential 0 - -
PCI V

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Application and Technology
Hardware
Applications

Audio Test
Noise, Vibration, and Harshness Test
Machine Condition Monitoring
Sound Power
Structural Vibration
Pass-by Noise

Analog Inputs
The analog input channels of NI 446x devices have 24-bit resolution ADCs that are simultaneously sampled at software-programmable rates for standard audio applications, such
as 44.1 kS/s (the standard rate used in CD players), 48.0 kS/s (the rate used in digital audio tape (DAT) recorders and other digital audio equipment), 96.0 kS/s, and 192 kS/s. An
NI 446x is well-suited for audio, sound, and vibration analysis applications.

The analog inputs offer programmable AC/DC coupling. A programmable gain amplifier stage on the inputs gives gain selection from -20 to +30 dB in 10 dB steps. Furthermore,
to provide you with the quietest and highest-quality analog measurements, the input stage accepts differential or single-ended signal connections.

With 118 dB dynamic range and low noise and distortion, NI 446x devices can make very accurate frequency-domain measurements. They have excellent amplitude flatness of
±0.1 dB within the frequency range of DC to 92 kHz, and have a typical THD of -107 dB.

Figure 1. These 24-bit delta-sigma converters deliver outstanding dynamic range.

Antialiasing
The analog inputs have both analog and digital filters implemented in hardware to prevent aliasing. Input signals are first passed through a fixed analog filter to remove any
signals with frequency components beyond the range of the ADCs. Then digital antialiasing filters automatically adjust their cutoff frequency to remove any frequency components
above half the programmed sampling rate.

Analog Outputs
NI 4461 devices have two channels of 24-bit resolution, high-fidelity analog output. A common application of the analog output is to stimulate a system under test while measuring
the frequency response with the analog inputs. The output conversions occur simultaneously at softwareprogrammable rates up to 204.8 kS/s. The analog output circuitry uses
8-times oversampling interpolators with 64-times oversampling delta-sigma modulators to offer exceptional spectral purity. Software-programmable attenuation of 0, 20, or 40 dB
is available on the output channels. NI 4461 devices have excellent amplitude flatness of ±0.1 dB within DC to 92 kHz, and a THD of -95 dB at 1 kHz. You can simultaneously
acquire data on the input channels while updating the output channels.

Anti-Imaging

NI 4461 output channels have both analog and digital anti-imaging filters. These filters remove the unwanted out-of-band components generated when an analog signal is
produced from digital data. The digital filters limit the bandwidth of the output signal to half the original conversion rate, thereby rejecting images caused by the 8-times
oversampling process. The signals generated by the analog output circuitry are low-distortion, low-noise, flat-frequency analog signals.

Multimodule Synchronization
For applications requiring more channels, you can synchronize the operation of two or more NI 446x devices with less than 0.1 deg phase mismatch. Synchronization is achieved
by sharing a digital trigger and clock between multiple modules. The NI-DAQmx driver software automatically handles the synchronization of multiple devices in a single task.

Triggering
NI 446x devices offer both analog and digital triggering for signal acquisition. The source of the trigger can come from any analog input channel, the external digital trigger input,
the PXI trigger bus (PXI devices), or the RTSI bus (PCI devices). The external digital trigger is 5 VTTL/CMOS-compatible and is activated by a choice of rising or falling edge.
Triggering is needed in applications that acquire transient signals. When performing structural analysis by striking a metal beam with a hammer, for instance, you measure
transient vibrations with accelerometers with acquisition triggered by the hammer impact.

Calibration

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National Instruments calibrates the offset voltage and gain accuracy of the analog inputs and outputs. An onboard precision voltage reference ensures that the gain and offset
remain stable and accurate. NIST-traceable and ISO 9002-certified calibration certificates are available on request.

Figure 2. With application software such as NI LabVIEW, you can conduct frequency-response, swept-sine, and other common audio measurements.

Software
NI Measurement Services Software
NI 446x devices use NI measurement services software, based on the NI-DAQmx driver, as the hardware and OS interface. You can build automated test systems or integrate an
NI 446x with other hardware, including modular instruments and multifunction data acquisition (DAQ) products, through NI-DAQmx function calls. NI measurement services
software also includes DAQ Assistant, an interactive guide that steps you through configuring, testing, and programming measurement tasks and generates the necessary code
automatically for National Instruments LabVIEW, LabWindows/CVI, or Measurement Studio.

Analysis Software
LabVIEW Sound and Vibration Toolkit
NI 446x devices are well-suited for audio, acoustic, and vibration analysis applications. The LabVIEW Sound and Vibration Toolkit incorporates Express technology to make it
easier for you to perform sound and vibration measurement and analysis. The toolkit includes LabVIEW Express VIs for:

Fractional-octave analysis with weighting

Integrated vibration level
Weighted sound level
Zoom power spectrum
Peak search
Power in band
Power spectrum analysis
Frequency response
Limit testing

In addition, the LabVIEW Sound and Vibration Toolkit includes numerous VIs for audio measurements such as gain, phase, distortion, and swept-sine analysis. Swept-sine is a
powerful analysis technique to measure frequency response. The toolkit also includes simple modular examples of all of these measurements, so you can quickly combine analog
output, analog input, and data analysis to build a customized application. In addition, the existing signal generation is extended to include the tools and examples needed to
provide the excitation required by most audio, noise, and vibration measurements. For example, a library of 33 waveforms is included in this toolkit to get you up and running fast.
This toolkit also optimizes LabVIEW to perform noise and vibration measurements. For example, all frequency measurements can perform zoom FFT analysis to offer improved
resolution in the frequency range of interest. With the built-in fractional-octave analysis, you can perform measurements with any number of bands at any sampling frequency. NI
446x dynamic signal acquisition devices, combined with this toolkit, offer compliance with several standards for sound level measurements and octave analysis:

IEC 61260 : 1995, class 1

IEC 61672 : 2002, class 1
ANSI S1.11 – 2004, class 1
ANSI S1.4 – 1983
ANSI S1.42 – 1986

LabVIEW Order Analysis Toolkit

Order analysis is a tool for examining dynamic signals generated by mechanical systems that include rotating or reciprocating components. With order analysis you can dissect
sound, vibration, and other dynamic signals into components that relate to physical elements of mechanical systems.

The LabVIEW Order Analysis Toolkit is ideal for machine monitoring, machine health, and machine efficiency applications. You can use the toolkit to perform the most common
analyses required by MCM applications, including order tracking, slow-roll compensation, and vibration integration. With this toolkit, you can develop your application faster by
using built-in examples for order spectra, tachometer processing, and waterfall plots.

You can also apply order analysis to dynamic signals generated by mechanical systems that include rotating or reciprocating components, such as turbines, compressors, pumps,
and engines. It is common to use order analysis in applications such as machine condition monitoring and noise, vibration, and harshness (NVH) testing. With the added capability
for online processing, you can easily create flexible applications for condition-based monitoring and predictive maintenance. The National Instruments 446x dynamic signal
acquisition devices are ideal for acquiring sound and vibration signals to analyze with this toolkit.

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Ordering Information
For a complete list of accessories, visit the product page on ni.com.

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Software Recommendations
NI LabVIEW Full Development Fully integrated graphical system design NI LabVIEW Real-Time Design deterministic real-time applications
System for Windows software Module with LabVIEW graphical programming
Support for a wide range of measurement Download to dedicated NI or third-party
hardware, I/O, and buses hardware for reliable execution and a wide
selection of I/O
Custom, event-driven user interfaces for
measurement and control Take advantage of built-in PID control, signal
processing, and analysis functions
Extensive signal processing, analysis, and
math functionality Automatically take advantage of multicore
Advanced compiler to ensure CPUs or set processor affinity manually
high-performance execution and code Includes real-time OS, development and
optimization debugging support, and board support
Includes SSP for professional technical Purchase individually or as part of a
support, online training, and software LabVIEW suite
upgrades

NI Sound and Vibration Stand-alone configuration-based analysis and

Toolkit data logging with the Sound and Vibration
Assistant
AES17-compliant audio filter signal
processing
Easy-to-use power spectrum, swept sine, and
octave analysis steps
Sound level with A-, B-, or C-weighting and
vibration level with integration
Audio measurements including THD, SNR,
SINAD, and swept-sine analysis
Universal File Format (UFF58) file I/O support

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Support and Services
System Assurance Programs
NI system assurance programs are designed to make it even easier for you to own an NI system. These programs include configuration and deployment services for your NI PXI,
CompactRIO, or Compact FieldPoint system. The NI Basic System Assurance Program provides a simple integration test and ensures that your system is delivered completely
assembled in one box. When you configure your system with the NI Standard System Assurance Program, you can select from available NI system driver sets and application
development environments to create customized, reorderable software configurations. Your system arrives fully assembled and tested in one box with your software preinstalled.
When you order your system with the standard program, you also receive system-specific documentation including a bill of materials, an integration test report, a recommended
maintenance plan, and frequently asked question documents. Finally, the standard program reduces the total cost of owning an NI system by providing three years of warranty
coverage and calibration service. Use the online product advisors at ni.com/advisor to find a system assurance program to meet your needs.

Calibration
NI measurement hardware is calibrated to ensure measurement accuracy and verify that the device meets its published specifications. To ensure the ongoing accuracy of your
measurement hardware, NI offers basic or detailed recalibration service that provides ongoing ISO 9001 audit compliance and confidence in your measurements. To learn more
about NI calibration services or to locate a qualified service center near you, contact your local sales office or visit ni.com/calibration.

Technical Support
Get answers to your technical questions using the following National Instruments resources.
Support - Visit ni.com/support to access the NI KnowledgeBase, example programs, and tutorials or to contact our applications engineers who are located in NI sales
offices around the world and speak the local language.
Discussion Forums - Visit forums.ni.com for a diverse set of discussion boards on topics you care about.
Online Community - Visit community.ni.com to find, contribute, or collaborate on customer-contributed technical content with users like you.

Repair
While you may never need your hardware repaired, NI understands that unexpected events may lead to necessary repairs. NI offers repair services performed by highly trained
technicians who quickly return your device with the guarantee that it will perform to factory specifications. For more information, visit ni.com/repair.

Training and Certifications

The NI training and certification program delivers the fastest, most certain route to increased proficiency and productivity using NI software and hardware. Training builds the skills
to more efficiently develop robust, maintainable applications, while certification validates your knowledge and ability.
Classroom training in cities worldwide - the most comprehensive hands-on training taught by engineers.
On-site training at your facility - an excellent option to train multiple employees at the same time.
Online instructor-led training - lower-cost, remote training if classroom or on-site courses are not possible.
Course kits - lowest-cost, self-paced training that you can use as reference guides.
Training memberships and training credits - to buy now and schedule training later.
Visit ni.com/training for more information.

Extended Warranty
NI offers options for extending the standard product warranty to meet the life-cycle requirements of your project. In addition, because NI understands that your requirements may
change, the extended warranty is flexible in length and easily renewed. For more information, visit ni.com/warranty.

OEM
NI offers design-in consulting and product integration assistance if you need NI products for OEM applications. For information about special pricing and services for OEM
customers, visit ni.com/oem.

Alliance
Our Professional Services Team is comprised of NI applications engineers, NI Consulting Services, and a worldwide National Instruments Alliance Partner program of more than
700 independent consultants and integrators. Services range from start-up assistance to turnkey system integration. Visit ni.com/alliance.

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Detailed Specifications
This document lists specifications for the NI PCI/PXI-4461 and NI PCI/PXI-4462 (NI 446 x) Dynamic Signal Acquisition (DSA) devices. These specifications are typical at 25 °C
unless otherwise stated. The operating range for the PXI-446 x is 0 to 55 °C, and the operating range for the PCI-446 x is 0 to 50 °C. All accuracies listed are valid for up to one
year from the time of the device external calibration. All specifications are subject to change without notice. Visit ni.com/manuals for the most current specifications and product
documentation.

Caution The inputs of this sensitive test and measurement product are not protected for electromagnetic interference for functional reasons. As a result, this product
may experience reduced measurement accuracy or other temporary performance degradation when cables are attached in an environment with electromagnetic
interference present. Refer to the Declaration of Conformity (DoC) for this product for details of the standards applied to assess electromagnetic compatibility
performance. To obtain the DoC, visit ni.com/certification, search by model number or product line, and click the appropriate link in the Certification column.

Analog Input

This section lists the NI 446x analog input (AI) specifications.

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Input Characteristics

Number of simultaneously sampled input channels

2
NI 4461

4
NI 4462

Differential or pseudodifferential (50 Ω between negative input and chassis

Input configuration
ground), each channel independently software selectable
AC or DC, each channel independently software selectable
Input coupling

24 bits
A/D converter (ADC) resolution

Delta-sigma
ADC type

1 kS/s to 204.8 kS/s in 181.9 μS/s increments, maximum

Sample rates (ƒs), samples-per-second (S/s)

ADC modulator oversample rate

1.0 kS/s ≤ ƒs ≤ 51.2 kS/s 128 ƒs

64 ƒs
51.2 kS/s < ƒs ≤ 102.4 kS/s

32 ƒs
102.4 kS/s < ƒs ≤ 204.8 kS/s

Sample Clock Timebase Rate

Ratio between sample rate (ƒs) and sample clock timebase rate

Sample Rate (ƒs) Sample Clock Timebase Rate

Low-Frequency Alias Rejection Enabled (Default) Low-Frequency Alias Rejection Disabled

1.0 kS/s ≤ ƒs ≤ 1.6 kS/s 16,384 ƒs 512 ƒs

1.6 kS/s < ƒs ≤ 3.2 kS/s 8,192 ƒs

3.2 kS/s < ƒs ≤ 6.4 kS/s 4,096 ƒs

6.4 kS/s < ƒs ≤ 12.8 kS/s 2,048 ƒs

12.8 kS/s < ƒs ≤ 25.6 kS/s 1,024 ƒs

25.6 kS/s < ƒs ≤ 51.2 kS/s 512 ƒs

51.2 kS/s < ƒs ≤ 102.4 kS/s 256 ƒs 256 ƒs

102.4 kS/s < ƒs ≤ 204.8 kS/s 128 ƒs 128 ƒs

FIFO buffer size 2,047 samples

Data transfers Direct memory access (DMA)

Input Common Mode Range

Gain (dB) Input Differential* Pseudodifferential*

≥0 + ±12 Vpk ±12 Vpk

– ±12 Vpk ±10 Vpk

<0 + ±42.4 Vpk ±42.4 Vpk

– ±42.4 Vpk ±10 Vpk

*
Voltages with respect to chassis ground

Input Overvoltage Protection

Differential configuration ±42.4 Vpk

Pseudodifferential configuration

Positive terminal ±42.4 Vpk

Negative terminal (shield) ±10.0 Vpk

Input Signal Range

Gain (dB) Full-Scale Range (Vpk)*

30 ±0.316

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 Gain (dB) Full-Scale Range (Vpk)*

20 ±1.00

10 ±3.16

0 ±10.0

–10 ±31.6

–20 ±42.4

*
Each input channel gain is independently software selectable.

Transfer Characteristics

AI Offset (Residual DC)

Gain (dB) DC-Coupled Offset*, †, Max, T ‡ ±5 °C (±mV) DC-Coupled Offset*, Max, Over Operating Temperature Range (±mV)
cal

30 0.1 1

20 0.2 2

10 0.5 3

0 0.7 7

–10 5 30

–20 7 70

*
Source impedance ≤ 50 Ω.

†
Listed offset is valid 24 hours following a self calibration.

‡
T cal = ambient temperature at which last self calibration was performed.

AI Gain Amplitude Accuracy

1 kHz input tone

Tcal ±5 °C ±0.03 dB max

(Tcal = ambient temperature at which last self calibration was performed.)

(Listed accuracy is valid 24 hours following a self calibration.)

Over operating temperature range ±0.2 dB max

Amplifier Characteristics

Input Impedance

Input Impedance Differential Configuration Pseudodifferential Configuration

Between positive input and chassis ground 1 M Ω || 217 pF 1 M Ω || 217 pF

Between negative input and chassis ground 1 M Ω || 229 pF 50 Ω

Common-Mode Rejection Ratio (CMRR)

Gain (dB) DC-Coupled CMRR (dBc)*, † AC-Coupled CMRR (dBc)†, ‡

30 105 70

20 101

10 90

0 80

–20, –10 60 65

*
≤ 1 kHz

†
Differential configuration

‡
50 or 60 Hz

Dynamic Characteristics 1

Specification Low-Frequency Alias Rejection Enabled (Default) Low-Frequency Alias Rejection Disabled

Alias-free bandwidth (BW) (passband) DC to 0.4 ƒs DC to 0.4535 ƒs

Alias rejection, minimum 104 dBc 120 dBc

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 Specification Low-Frequency Alias Rejection Enabled (Default) Low-Frequency Alias Rejection Disabled

Alias rejection by frequency Input frequency > 0.6 ƒs

0.5465 ƒs < input frequency < 127.4535 ƒs, where 1.0 kS/s ≤ ƒs ≤ 51.2 kS/s

0.5465 ƒs < input frequency < 63.4535 ƒs, where 51.2 kS/s < ƒs ≤ 102.4 kS/s

0.5465 ƒs < input frequency < 31.4535 ƒs, where 102.4 kS/s < ƒs ≤ 204.8 kS/s

–3 dB BW 0.484 ƒs 0.491 ƒs

AC coupling

3.4 Hz
–3 dB cutoff frequency

22.6 Hz
–0.1 dB cutoff frequency

Magnitude Response of AC Coupling Circuit (1 Hz to 1 kHz)

Phase Response of AC Coupling Circuit (1 Hz to 1 kHz)

ADC Filter Delay

Low-Frequency Alias Rejection Enabled (Default) Low-Frequency Alias Rejection Disabled

Sample Rate (kS/s) Filter Delay (Samples) Sample Rate (kS/s) Filter Delay (Samples)

1.0 ≤ ƒs ≤ 1.6 32.96875 1.0 ≤ ƒs ≤ 1.6 63

1.6 < ƒs ≤ 3.2 33.9375 1.6 < ƒs ≤ 3.2

3.2 < ƒs ≤ 6.4 35.875 3.2 < ƒs ≤ 6.4

6.4 < ƒs ≤ 12.8 39.75 6.4 < ƒs ≤ 12.8

12.8 < ƒs ≤ 25.6 47.5 12.8 < ƒs ≤ 25.6

25.6 < ƒs ≤ 204.8 63 25.6 < ƒs ≤ 204.8

AI Flatness

Gain (dB) DC-Coupled Flatness* (dB), Max (Typical)

20 Hz to 20 kHz 20 Hz to 45 kHz 20 Hz to 92.2 kHz

0, 10, 20, 30 ±0.006 (±0.003) ±0.03 (±0.02) ±0.1 (±0.08)

–20, –10 ±0.2 (±0.1) ±0.6 (±0.33) ±1 (±0.55)

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 Gain (dB) DC-Coupled Flatness* (dB), Max (Typical)

20 Hz to 20 kHz 20 Hz to 45 kHz 20 Hz to 92.2 kHz

*
Relative to 1 kHz

AI Spectral Noise Density

AI spectral noise density (with EAR turned on) 8 nV/ at 30 dB gain, 1 kHz

AI Spectral Noise Density (30 dB Gain)

AI Idle Channel Noise

Sample Rate (kS/s) Idle Channel Noise*, †

dBVrms μVrms

1.0 kS/s ≤ ƒs < 51.2 kS/s –118 dBVrms 1.3 μVrms

51.2 kS/s ≤ ƒs < 102.4 kS/s –115 dBVrms 1.8 μVrms

102.4 kS/s ≤ ƒs ≤ 204.8 kS/s –111 dBVrms 2.8 μVrms

*
Source impedance ≤ 50 Ω

†
30 dB gain

AI Spurious Free Dynamic Range (SFDR)

Gain Setting (dB) SFDR (dBc)*, †, ‡

30 106

0, 10, 20 108

–20, –10 110

*
ƒs = 204.8 kS/s

†
1 kHz input tone, input amplitude is the lesser of –1 dBFS or 8.91 Vpk.

‡
Measurement includes all harmonics.

SFDR 51.2 kS/s (–1 dBFS, 0 dB Gain, 1 kHz Sine Wave Input)

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SFDR 102.4 kS/s (–1 dBFS, 0 dB Gain, 1 kHz Sine Wave Input)

SFDR 204.8 kS/s (–1 dBFS, 0 dB Gain, 1 kHz Sine Wave Input)

AI Dynamic Range

Gain Setting (dB) Dynamic Range (dBFS)*, Min (Typical)

1 kS/s ≤ ƒs ≤ 51.2 kS/s 51.2 kS/s < ƒs ≤ 102.4 kS/s 102.4 kS/s < ƒs ≤ 204.8 kS/s

30 103 (105) 100 (102) 96 (98)

20 111 (113) 108 (110) 104 (106)

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 Gain Setting (dB) Dynamic Range (dBFS)*, Min (Typical)

1 kS/s ≤ ƒs ≤ 51.2 kS/s 51.2 kS/s < ƒs ≤ 102.4 kS/s 102.4 kS/s < ƒs ≤ 204.8 kS/s

10 114 (117) 111 (114) 106 (110)

0 116 (118) 113 (114) 107 (110)

–10 107 (108) 104 (105) 101 (102)

–20 105 (107) 102 (104) 98 (101)

*
1 kHz input tone, –60 dBFS input amplitude

AI Total Harmonic Distortion (THD), Balanced Source

Gain (dB) THD (dBc)*, †

20 Hz to 20 kHz 20 Hz to 92.2 kHz

30 –100 –97

20 –109 –106

0, 10 –107 –104

–10 –108 –107

–20 –107 –106

*
ƒs = 204.8 kS/s, 92.8 kHz BW, differential configuration

†
Input amplitude is the lesser of –1 dBFS or 8.91 Vpk.

AI THD, Unbalanced Source

Gain (dB) THD (dBc)*, †

20 Hz to 20 kHz 20 Hz to 92.2 kHz

30 –100 –93

20 –106 –94

10 –105 –92

0 –97 –87

–10 –90 –88

–20 –91 –89

*
ƒs = 204.8 kS/s, 92.8 kHz BW

†
Input amplitude is the lesser of –1 dBFS or 8.91 Vpk.

AI THD (Balanced Source with Differential Configuration, 204.8 kS/s, 0 dB Gain)

AI THD Plus Noise (THD+N), Balanced Source

Gain (dB) THD+N (dBc)*

51.2 kS/s, 20 Hz to 20 kHz† 204.8 kS/s, 20 Hz to 92.2 kHz‡

30 –103 –94

20 –107 –95

10 –108 –96

0 –107 –96

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 Gain (dB) THD+N (dBc)*

51.2 kS/s, 20 Hz to 20 kHz† 204.8 kS/s, 20 Hz to 92.2 kHz‡

–10 –96 –91

–20 –94 –88

*
Input amplitude is the lesser of –1 dBFS or 8.91 Vpk, differential configuration.

†
23.2 kHz measurement BW

‡
92.8 kHz measurement BW

AI THD+N, Unbalanced Source

Gain (dB) THD+N (dBc)*

51.2 kS/s, 20 Hz to 20 kHz† 204.8 kS/s, 20 Hz to 92.2 kHz‡

30 –103 –91

20 –107 –93

10 –108 –91

0 –104 –87

–10 –94 –86

–20 –93 –86

*
Input amplitude is the lesser of –1 dBFS or 8.91 Vpk.

†
23.2 kHz measurement BW

‡
92.8 kHz measurement BW

AI Intermodulation Distortion (IMD)

Gain (dB) IMD (dBc)*

20, 30 –109

10 –107

0 –104

–20, –10 –111

*
CCIF 14 kHz + 15 kHz, each tone amplitude is the lesser of –6 dBFS or 5 V pk.

Crosstalk, Input Channel Separation

Gain (dB) Crosstalk for Adjacent (Nonadjacent) Channels (dBc) *, †

1 kHz Signal 92.2 kHz

30 –130 (–140) –110 (–124)

0, 10, 20 –138 (–145) –110 (–124)

–20, –10 –96 (–124) –60 (–108)

*
Source impedance ≤ 50 Ω

†
Input amplitude is the lesser of –1 dBFS or 8.91 Vpk.

AI Interchannel Gain Mismatch

Gain (dB) DC-Coupled Mismatch (dB)* AC-Coupled Mismatch (dB)*

20 Hz to 20 kHz 20 Hz to 92.2 kHz 20 Hz

30 0.004 0.008 0.004

0, 10, 20 0.003 0.003

–20, –10 0.04 0.25 0.006

*
Identical channel configurations

AI Interchannel Phase Mismatch

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 Gain (dB) DC-Coupled Mismatch (deg)* AC-Coupled Mismatch (deg)*

20 Hz to 20 kHz 20 Hz to 92.2 kHz 20 Hz

30 0.10 0.60 0.08

20 0.04 0.15

0, 10 0.015 0.08

–20, –10 0.7 1

*
Identical channel configurations

Note All gain and phase mismatch specifications are for the same device and are not applicable between different NI 446 x devices.

AI Phase Linearity

Gain (dB) Linearity (deg)

20 Hz to 20 kHz 20 Hz to 92.2 kHz

0, 10, 20, 30 ±0.01 ±0.03

–20, –10 ±0.10 ±1

Onboard Calibration Reference

DC level 5.000 V ±2.5 mV

Temperature coefficient ±5 ppm/°C max

Long-term stability ±15 ppm/

Integrated Electronic Piezoelectric (IEPE)

Current 0 mA, 4 mA ±15%, or 10 mA ±15%, each channel independently software

selectable

Compliance 24 V min

Note Use the following equation to make sure that your configuration meets the IEPE compliance voltage range.

V common-mode + V bias + V full-scale must be 0 to 24 V,

where V common-mode is the common-mode voltage seen by the input channel,

V bias is the DC bias voltage of the sensor, and

V full-scale is the AC full-scale voltage of the sensor.

Channel input impedance with IEPE enabled (1 MΩ || 240 pF), pseudodifferential

Current noise <300 pA/

Transducer Electronic Data Sheet (TEDS) Support

The PCI-4461, PCI-4462, PXI-4461 (revision M or later), and PXI-4462 inputs support Transducer Electronic Data Sheet (TEDS) according to the IEEE 1451 Standard. For more
information about TEDS, go to ni.com/info and enter the info code rdteds.

Analog Output (NI 4461 Only)

This section lists the NI 4461 analog output (AO) specifications.

Output Characteristics

2, simultaneously sampled
Number of output channels

Differential or pseudodifferential (50 Ω to chassis ground on shield), each

Output configuration
channel independently software selectable

DAC resolution 24 bits

DAC type Delta-sigma

Update rates (ƒs) 1 kS/s to 204.8 kS/s in 181.9 μS/s increments, maximum

DAC modulator oversample rate

8,192 ƒs
1.0 kS/s ≤ ƒs ≤ 1.6 kS/s

4,096 ƒs
1.6 kS/s < ƒs ≤ 3.2 kS/s

3.2 kS/s < ƒs ≤ 6.4 kS/s 2,048 ƒs

1,024 ƒs
6.4 kS/s < ƒs ≤ 12.8 kS/s

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 512 ƒs
12.8 kS/s < ƒs ≤ 25.6 kS/s

25.6 kS/s < ƒs ≤ 51.2 kS/s 256 ƒs

128 ƒs
51.2 kS/s < ƒs ≤ 102.4 kS/s

102.4 kS/s < ƒs ≤ 204.8 kS/s 64 ƒs

1,023 samples
FIFO buffer size

DMA
Data transfers

Output Signal Range

Attenuation (dB) Full-Scale Range (Vpk)*

40 ±0.1

20 ±1.0

0 ±10.0

*
Each output channel range is independently software selectable.

Transfer Characteristics

AO Offset (Residual DC)

Attenuation (dB) Maximum Offset*, T ± 5 °C† (±mV) Maximum Offset, Over Operating Temperature Range ( ±mV)
cal

20, 40 1 2

0 1 10

*
Listed offset is valid 24 hours following a self calibration.

†
T cal = ambient temperature at which last self calibration was performed.

Gain (Amplitude Accuracy)

Specifications valid at any attenuation setting with a 1 kHz output signal.

Tcal ±5 °C ±0.04 dB max

(Tcal = ambient temperature at which last self calibration was performed.)

(Listed accuracy is valid 24 hours following a self calibration.)

Over operating temperature range ±0.1 dB max

Voltage Output

Output coupling DC

Indefinite protection between positive and negative

Short circuit protection

600 Ω
Minimum working load

Output Impedance

Output Impedance Differential Configuration Pseudodifferential Configuration

Between positive output and chassis ground 2.4 kΩ 70 Ω

Between negative output and chassis ground 2.4 kΩ 50 Ω

Between positive and negative outputs 22 Ω 22 Ω

Dynamic Characteristics 1

75 dB min < 768 kHz, 66 dB min > 768 kHz

Image rejection

0.487 ƒs
–3 dB BW

DAC filter delay (samples), for update rate

36.6
1.0 kS/s ≤ ƒs ≤ 1.6 kS/s

36.8
1.6 kS/s < ƒs ≤ 3.2 kS/s

3.2 kS/s < ƒs ≤ 6.4 kS/s 37.4

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 38.5
6.4 kS/s < ƒs ≤ 12.8 kS/s

12.8 kS/s < ƒs ≤ 25.6 kS/s 40.8

43.2
25.6 kS/s < ƒs ≤ 51.2 kS/s

51.2 kS/s < ƒs ≤ 102.4 kS/s 48.0

32.0
102.4 kS/s < ƒs ≤ 204.8 kS/s

AO Flatness

All attenuation settings relative to 1 kHz

±0.008 dB max
20 Hz to 20 kHz

±0.1 dB max
20 Hz to 92.1 kHz

AO Idle Channel Noise

Attenuation (dB) Maximum Idle Channel Noise

*
102.5 kS/s (30 kHz BW) 204.8 kS/s (80 kHz BW)* 204.8 kS/s (500 kHz BW)*

dB Vrms μ Vrms dB Vrms μ Vrms dB Vrms μ Vrms

40 –106 5 –101 9 –87 45

20 –106 5 –101 9 –86 50

0 –96 16 –93 23 –73 224

*
Noise equivalent bandwidth

AO Spurious Free Dynamic Range (SFDR)

Attenuation (dB) SFDR (dBc)*, †, ‡

40 87

20 94

0 98

*
ƒs = 204.8 kS/s

†
1 kHz output frequency, –1 dBFS output amplitude

‡
Measurement includes all harmonics.

AO Dynamic Range

Attenuation (dB) Minimum Dynamic Range (dBFS)*

102.5 kS/s (30 kHz BW)† 204.8 kS/s (80 kHz BW)† 204.8 kS/s (500 kHz BW)†

40 83 78 64

20 103 98 83

0 113 110 90

*
1 kHz output frequency, –60 dBFS output amplitude

†
Noise equivalent bandwidth

AO THD

Attenuation (dB) THD (dBc)*

102.5 kS/s, 20 Hz to 20 kHz† 204.8 kS/s, 20 Hz to 20 kHz‡ 204.8 kS/s, 20 Hz to 92.1 kHz‡

40 –99 –92 –92

20 –98 –95 –93

0 –97 –94 –83

*
–1 dBFS output amplitude

†
30 kHz measurement BW

‡
92.8 kHz measurement BW

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AO THD (204.8 kS/s, 0 dB Gain, 65,536 Samples, 92.8 kHz Measurement BW)

AO THD+N

Attenuation (dB) THD+N (dBc)*

102.5 kS/s, 20 Hz to 20 kHz† 204.8 kS/s, 20 Hz to 80 kHz‡ 204.8 kS/s, 20 Hz to 92.1 kHz**

40 –83 –76 –63

20 –98 –92 –79

0 –97 –86 –68

*
–1 dBFS output amplitude

†
30 kHz measurement BW

‡
80 kHz measurement BW

**
500 kHz measurement BW

AO Intermodulation Distortion (IMD)

Attenuation (dB) IMD (dBc)*

40 –99

20 –104

0 –104

*
CCIF 14 kHz + 15 kHz, each tone amplitude is –6 dBFS.

Crosstalk, Output to Input Channel Separation

Gain (dB) Crosstalk (dBc)*, †

1 kHz Signal 92.1 kHz

30 –151 –118

20 –150 –118

10 –144 –115

0 –137 –111

–20, –10 –87 –51

*
Source impedance ≤ 50 Ω

†
Output amplitude is the lesser of –1 dBFS or 8.91 Vpk.

Crosstalk, Output Channel Separation

All attenuation settings (0, 20, and 40 dB)

No measurable crosstalk
1 kHz signal

–110 dBc
92.1 kHz signal

AO Interchannel Gain Mismatch

All attenuation settings

0.03 dB
20 Hz to 92.1 kHz

AO Interchannel Phase Mismatch

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All attenuation settings

0.1°
20 Hz to 20 kHz

0.2°
20 Hz to 92.1 kHz

Note All gain and phase mismatch specifications are for the same device and are not applicable between different NI 446 x devices.

AO Phase Linearity

Attenuation (dB) Linearity (deg)

20 Hz to 20 kHz 20 Hz to 92.1 kHz

0 ±0.1 ±1.7

20 ± 0.1 ±1.6

40 ±0.1 ±1.8

Internal Frequency Timebase Characteristics

±20 ppm, over operating temperature range

Accuracy

8 ppm in first year; 5 ppm max/year after first year

Aging

Triggers

Analog trigger

Start trigger
Purpose

Source

AI0 or AI1
NI 4461

AI0, AI1, AI2, or AI3

NI 4462

Full scale, programmable

Level

Positive (rising) or negative (falling), software selectable

Slope

24 bits
Resolution

Programmable
Hysteresis

Digital Trigger

Start or reference trigger

Purpose

PFI0, PXI_Trig<0..6>
Source

Transistor-transistor logic (5V TTL)

Compatibility

Rising or falling edge

Polarity

Minimum pulse width 10 ns

General Specifications

This section lists general specification information for the NI 446x.

Bus Interface

3.3 V or 5 V signal environment

PCI or PXI

DMA channels

2, analog input and analog output

NI 4461

1, analog input
NI 4462

Synchronization

PXI

CLK_10 Multiple, full chassis

PXI_STAR Up to 14 devices per chassis

PCI

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 Up to 3 devices across ribbon cable
RTSI

Power Requirements

Voltage NI PXI-4461 NI PCI-4461 NI PXI-4462 NI PCI-4462

+5 V 990 mA 2,200 mA 990 mA 1,900 mA

+3.3 V 1,430 mA 1,750 mA 1,750 mA 2,300 mA

+12 V 170 mA 40 mA 130 mA 100 mA

–12 V 110 mA 40 mA 70 mA 40 mA

Physical

Dimensions (not including connectors)

PCI 17.5 cm × 9.9 cm (6.9 in. × 3.9 in.) PCI slot

PXI 16 cm × 10 cm (6.3 in. × 3.9 in.) 3U CompactPCI slot

Analog I/O connectors BNC female

Digital trigger connector SMB male

Weight

PCI 226.8 g (8.0 oz)

PXI 241 g (8.5 oz)

I
Measurement Category 2

Caution Do not use the NI 446x for connections to signals or for measurements within Categories II, III, or IV.

Environmental

Operating Environment

Ambient temperature range

PXI-446x 0 to 55 °C (Tested in accordance with IEC-60068-2-1 and IEC-60068-2-2.)

PCI-446x 0 to 50 °C (Tested in accordance with IEC-60068-2-1 and IEC-60068-2-2.)

Relative humidity range 10 to 90%, noncondensing (Tested in accordance with IEC-60068-2-56.)

Altitude 2,000 m (at 25 °C ambient temperature)

Pollution Degree (indoor use only) 2

Storage Environment

Ambient temperature range –20 to 70 °C (Tested in accordance with IEC-60068-2-1 and

IEC-60068-2-2.)

Relative humidity range 5 to 95%, noncondensing (Tested in accordance with IEC-60068-2-56.)

Shock and Vibration (PXI Only)

Operational shock 30 g peak, half-sine, 11 ms pulse (Tested in accordance with

IEC-60068-2-27. Test profile developed in accordance with
MIL-PRF-28800F.)

Random vibration

5 to 500 Hz, 0.3 grms

Operating

5 to 500 Hz, 2.4 grms (Tested in accordance with IEC-60068-2-64.

Nonoperating
Nonoperating test profile exceeds the requirements of MIL-PRF-28800F,
Class 3.)

Safety Standards

This product is designed to meet the requirements of the following standards of safety for electrical equipment for measurement, control, and laboratory use:

IEC 61010-1, EN 61010-1

UL 61010-1, CSA 61010-1

Note For UL and other safety certifications, refer to the product label or the Online Product Certification section.

Electromagnetic Compatibility

This product meets the requirements of the following EMC standards for electrical equipment for measurement, control, and laboratory use:

EN 61326 (IEC 61326): Class A emissions; Basic immunity

EN 55011 (CISPR 11): Group 1, Class A emissions

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 AS/NZS CISPR 11: Group 1, Class A emissions
FCC 47 CFR Part 15B: Class A emissions
ICES-001: Class A emissions

Note For the standards applied to assess the EMC of this product, refer to the Online Product Certification section.

Note For EMC compliance, operate this product according to the documentation.

CE Compliance

This product meets the essential requirements of applicable European Directives, as amended for CE marking, as follows:

2006/95/EC; Low-Voltage Directive (safety)

2004/108/EC; Electromagnetic Compatibility Directive (EMC)

Online Product Certification

Refer to the product Declaration of Conformity (DoC) for additional regulatory compliance information. To obtain product certifications and the DoC for this product, visit
ni.com/certification, search by module number or product line, and click the appropriate link in the Certification column.

Environmental Management

National Instruments is committed to designing and manufacturing products in an environmentally responsible manner. NI recognizes that eliminating certain hazardous
substances from our products is beneficial not only to the environment but also to NI customers.

For additional environmental information, refer to the NI and the Environment Web page at ni.com/environment. This page contains the environmental regulations and directives
with which NI complies, as well as other environmental information not included in this document.

Waste Electrical and Electronic Equipment (WEEE)

EU Customers At the end of the product life cycle, all products must be sent to a WEEE recycling center. For more information about WEEE recycling centers, National
Instruments WEEE initiatives, and compliance with WEEE Directive 2002/96/EC on Waste Electrical and Electronic Equipment, visit ni.com/environment/weee.htm.

1
Test system equipped with an LCD monitor for AO noise and distortion measurements to avoid possible magnetic interference caused by CRT-based monitors.
2
Measurement Category is also referred to as Installation Category.

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