Reaffirmed 2001

SUPPLIED BY BOOK SUPPLY BUREAU TO L&T LIMIED ECC DIVISION
UDYOG VIHAR GURGAON FOR INTERNAL USE AT THIS LOCATION ONLY

( Reaffirmed 2001 )
c ___ -_. ..~ .._ __~ ..-......- - -- --- -- -- .~ -
IS I 2511 i 1963
Indian Standard
SPECIFICATION FOR POLYCRYSTALLTNE
SEMI-CONDUCTOR RECTIFIER STACKS
Power Converters Sectional Committee, ETDC 31
Choirmon Re~rrsenting
SHBI J. D. MALHOTRA Railway Board ( Ministry of Railways )

Members
SHBI S. K. KANJI LAL ( Alternate to
Shri J. D. Malhotra )
ADDITIONAL CHIEF ENoINEEn Directorate General of Posts and Telegraphs
( Ministry of Transport & Communications),
Jabalpur
DIRECTOR ox TELEQRAPBS (L) ( Alfemate )
DIVISIONAL ENGINEER TELE-
G&APES (P) (Alternote)
SEEI M. G. BEAT Automatic Electric Private Ltd, Bombay
SH~I R. R. KABANDIKAR ( Alternute)
SHRI L. W. BUAZEL The Calcutta Electric Supply Corporation Ltd,
Calcutta
SHBI K. K. BOSE ( Alternate)
SH~I P. CSAWLA The Fertilizer Corooration of India Ltd, Naya
Nangal
SRBI C. R. SETHI ( Alternate )
SERI N. GOPALKBISHNAN Indian Aluminium CO Ltd, Calcutta
SETRIR. K. CHABI ( Altrrnote )
SHBI R. R. KA~,IUIK Central Water & Power Commission (Power
Wing )
SHBI s. M. K~sa Hind Rectifiers Ltd, Bombay
&RI S. M. MANE ( Alternolr)
SB~I P. V. RAO Indian Telephone Industries Ltd, Bangalore
SBRI U. S. SAVAICOOB Directorate General of Supplies & Disposals ( Ins-
pection Wing) ( Ministry of Economic Jr
Defence Co-ordination )
Snxs D. T. GU~SAHANI ( Altnxate )
SHRI M. T. SHIVDAIXANI Kaycee Industries Ltd, Bombay
SHRI M. I. SETH ( Al&mote )
SHBI K. M. SINCLAIB Heavy Electricals ( India ) Ltd, Bhopal
SHRI Y. S. VENPA~~WARAN, Director, ISI ( Ex-o&cio Member )
Deputy Director ( Electro-
technical )
Serrelory
SHRI K. K. TANEJA
Extra Assistant Director ( Electrotechnical ), IS1
-INDIAN STANDARDS INSTITUTION

MANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARC
NEW DELHI IlOOOz
P’
ISr2511-1963
Indian Standard
SPECIFICATION FOR POLYCRYSTALLTNE
SEMI-CONDUCTOR RECTIFIER STACKS
8. FOREWORD

0.1 This’Indian Standard was adopted by the Indian Standards Institu-
tion on 27 November 1963, after the draft finalized by the Power Con-
verters Sectional Committee had been approved by the Electrotechnical
Division Council.
0.2 Rectifier equipments making use of polycrystalline semi-conductor
rectifier units are being widely used due to the fact that for all moderate
sizes the semi-conductor rectifier units have been found more convenient
and economical than the vacuum tube or mercury vapour rectifier.
The manufacture of such rectifier units is yet to be fully developed
in this country; therefore, it has been felt that an Indian Standard
on the subject will serve as a proper instrument for guiding the
production.
0.3 This specification relates to the polycrystalline rectifier units, such as
those of selenium and copper oxide. It is intended to cover the general
requirements and tests applicable to the completed rectifier equipment in
a separate standard which is under preparation.
0.4 While ,preparing this standard, assistance has been derived from the
following:
IEC PUBLICATIONNo. 119-1960 RECOMMENDATIONS FOR POLYCRYS-
TALLINE SEMI-CONDUCTORS RECTIFIER STACKS AND EQUIPMENT.
International Electrotechnical Commission.
B. S. 2709 : 1956 SEMI-CONDUCTORRECTIFIER ( METAL RECTIFIERS ).
Rritish Standards Institution.
0.5 Wherever a reference to any Indian Standard appears in this speci-
fication, it shall be taken as a reference to the latest version of the
standard.
0.6 For the purpose of deciding whether a particular requirement of this
standard is complied with, the final value, observed or calculated,
expressing the result of a test, shall be rounded off in accordance with
IS: 2-1960 Rules for Rounding Off Numerical Values ( Revised ). The
number of significant places retained in the rounded off value should be
the same as that of the specified value in this standard.
2
IS:251L- 1963
0.7 This standard is intended chiefly. to cover the technical provisions

relating to polycrystalline semi-conductor rectifier stacks, and it does not
include all the necessary provisions of a contract.
1. SCOPE
1.1 This standard applies to polycrystalline semi-conductor rectifier stacks

and stack assembly used for supplying dc power from ac sources at
frequencies up to 2 000 c/s.

1.2 This standard does not apply to telecommunicatron rectrhers other
than those for power supplied to such apparatus, nor to rectifiers us&
as auxiliaries to measuring instruments. Further, it does not include
the main transformer or other. associated transformers and apparatus,
nor does it apply to rectifiers based on mono-crystalline semi-conductor
materials.
2. TERMINOLOGY
2.0 For the purpose of this standard, the following definitions shall
apply.
2.1 Rectifier -A device for converting an alternating or oscillating
current into a unidirectional current, either by inversion or suppression of
alternate half-waves.
2.2 Semi-conductor Rectifier -A rectifier using the properties of a
semi-conductor as the basis of operation.
2.3 Rectifier cell - A basic rectifier, consisting of a combination of
semi-conductors or a semi-conductor and a metal or metals in contact with
one another, which presents an asymmetrical conductance according to
the polarity of the voltage applied to it ( see Fig. 1 ).
2.4 Rectifier Stack ( Unit ) - A single structure of one or more rectifier
cells with its ( their) associated mounting(s), cooling attachment(s), if
any, ( for example a blower or fan ) and connections whether electrical or
mechanical ( see Fig. 2 ).
2.5 Rectifier Stack Assembly -An electrically and mechanically com-
bined structure of one or more rectifier stacks, complete with all its
connections together with the means for cooling, if any, ( for example a
blower or fan ) in its own mechanical structure ( see Fig. 3 ).
2.6 Rectifier Equipment - An operative assembly comprising one or
more rectifier stacks, together with trnnsformcrs and otller auxiliaries, if
any, for conversion of ac into dc ( J’PBFig. 4).
3
FIG 2 RECTIFIERSTACK( UNIT )

FIG. 1 RECTIFIERCELL
4
+
ISr2511-1963
IS : 2511- 1963
N
+
FI$. 3 RECTIFIER\STACK ASSEMBLY
FIG. 4 RECTIFIEREQUIPMENT
5
-_(I
h- --_-. .-... _ .-.
1%: 2511- 1963
2.7 Rectifying Element-A circuit element bounded by one positive

and one negative terminal, and having the characteristic of conducting
effectively only in one direction (see Fig. 5 ).
NOTE - In practice, a rectifying element may be derived from one cell, or a
number of cells interconnected in either series, parallel or series-parallel arrangement.
Therefore, the corresponding component may either bc a part or the whole of a stack,
a sta,ck containing a single cell, or a stack assembly.

FIG. 5 RECTIFYINGELEMENT
2.8 Rectifier Connection - A connection of one or more rectifying ele-
ments for conversion of ac into dc ( see Fig. 6).
FIG. 6 RECTIFIERCONNECTION
2.9 Arm of a RecMer Connection- One rectifying element of a rectifier
connection ( see Fig. 7 ) .
? 9
FIG. 7 ARM OF A RECTIFIERCONNECTION

2.10 Forward Direction - The direction of a rectifying element which
has the higher conductance.
2.11 Reverse Direction -The direction of a rectifying element which
has the lower conductance.
2.12 Average Forward Current - The average value of the current in
the forward direction of a rectifying element excluding the reverse current
and measured over a full cycle.
6
IS t 2511*1%3
2.13 Average Reverse Current-The average value of the current in

the reverse direction of a rectifying element excluding the forward current
and measured over a full cycle.
2.14 Forward Voltage Drop- The voltage drop which results from
the flow of forward current through a rectifying element.
2.14.1 Average Forward Voltage Drop - The average value of the forward
voltage drop of a rectifying element excluding the reverse voltage and

measured over a full cycle.
2.15 Reverse Voltage - The voltage which is applied to a rectifying
element in the reverse direction.
2.15.1 Working Reverse Voltage - The peak value of the reverse rated
voltage (excluding transient over voltage) divided by 42.
2.16 Forward Power Loss - The power loss resulting from the flow of
curre in the forward direction.
%J
2.17 Reverse Power Loss - The power loss resulting from the flow of
current in the reverse direction.
2.18 DC Blocking - The action of rectifying element which essentially
prevents the flow of direct current in the reverse direction in a dc circuit.
2.19 DC Blocking Voltage -A substantially smooth dc voltage applied
in the reverse direction of a rectifying element.
2.20 Barrier Layer -The layer within a semi-conductor rectifier ceiS
which has the asymmetric conductance.
2.21 Forming - Electrical and/or thermal treatment of semi-conductor
cells or stacks ‘for the purpose of increasing the effectiveness of the barrier
layer. ( An increase of the effectiveness of the barrier layer may also
take place in service or during storage. )
2.22 Lose of Forming - A partial loss in the effectiveness of the barrier
layer.
2.23 Re-forming - The operation of restoring by an electric treatment,
the effectiveness of the barrier layer after loss of forming.
2.24 Ageing- A gradual persisting change, except failure, which takes
place in the forward or reverse resistance characteristic, when the rectifier
is in use.
2.25 Shelf Ageing - A gradual persistiug change, except failure, which
takes place in the forward or reverse resistance characteristic, when the
rectifier is not in use.
7
‘1s I 2511-1963
2.26 Positive Creep Effect - A gradual increase in the reverse current

which may occur when a substantially smooth dc blocking voltage
(se6 2.19) is applied to a semi-conductor rectifying element.
2.27 Stack Temperature - The stack temperature of a semi-conductor
rectifier stack measured at the hottest accessible point.
2.28 Conversion Efficiency - The ratio of the product of the average
value of dc voltage and direct current to the input active power on the
ac side’. ( Expressed in this way the maximum efficiency for the single-

phase bridge connections on resistance load with sinusoidal supply is 0.81. )

2.29 Ratings - A statement of the performance of rectifier under the
rated conditions assigned by the manufacturer.
2.30 Rated Service Conditions - The service condition for which the
ratings apply.
2.30.1 Service Cditivns - All external factors ( ambient temperature,
air humidity, type of load, etc) which may have influence & the
performance of the rectifier.
2.31 Rated Service Time - The period of time for which the rectifier is
rated to give the rated value of the voltage between the dc terminals at
the rated current.
2.32 Ambient Temperature-The temperature of the ambient air
immediately below the rectifier stacks.
2.33 Type Tests- Tests carried out to prove conformity with the
requirements of this specification. These are intended to prove the
general qualities and design of a given type of rectifier stack.
2.34 Routine Tests - Tests carried out on each rectifier stack to check
requirements likely to vary during production.
3. RATINGS
3.1 Semi-conductor rectifiers shall be rated in terms of ac rms input
voltage of approximately sinusoidal form and of mean dc output voltage
and current.
3.1.1 Basic Chd- The basic rating shall be for operation on a
single-phase bridge circuit with a purely resistive load with unaided and
unimpeded convection cooling in clean air,
The ratings of a rectifier stack may be calculated from the rating
of the reference rectifier stack in the basic circuit. A manufacturer may,
therefore, give the ratings of a series of stacks comprising one type
8
IS t 2511- 1963
of cells by referring to the rating of a reference stack, composed of the

same type of cells.
3.1.2 Ambient Temperature - The basic rating snail apply to 40°C
ambient temperature.
3.1.2.1 Other ambient temperatures of 45”C, 55°C and 70°C are also
recognized and the manufacturer shall, on the request of the purchaser,
provide a rating for the required temperature(s).
3.1.3 Basis of Rating - The basis of rating is such that durmg the first

2 000 hours under the conditions specified in 3.1.1 and with the rating
appropriate to the ambient temperature ( see 3.1.2 ), the output voltage
does not fall below 90 percent of the rated voltage.
3.2 Rated Direct Current - The rated dc output current shall be given
as the average value of the direct current at the dc terminals of the
reference rectifier stack for continuous service 24 hours a day.
3.3 Rated DC Voltage- The rated dc voltage shall be given as the
average value of the voltage between the dc terminals which can be
obtained during the entire rated service time ( see 7.1) without the rated
ac voltage being exceeded.
3.3.1 Due to the ageing in the forward direction, the rated dc
voltage shall be given with a margin for the expected increase in voltage
drop. In order to abtain the rated dc voltage, therefore, a new stack
shall be run at a recommended ac voltage lower than the rated ac voltage.
3.4 Rated AC Voltage - The rated ac voltage shall be given as the rms
value of the maximum continuously permissible line-to-line ac voltage
to be applied to the rectifier stack.
3.4.1 The. manufacturer shall also state the value of the commencing
ac voltage below the rated ac voltage at which a new stack gives rated
dc voltage ( see 3.3.1). ‘Rated ac voltage shall not exceed the commencing
ac voltage by more than 15 percent.
3.5 Duty Factor -The duty factors, intermittence (see 3.5.1) or
utilization factors ( see 3.5.2 ), shall be stated. The manufacturer shall,
if requested, advise the purchaser about the rating for required duty
factors.
Where no duty factors are stated, it shall be taken to mean con-
tinuous service 24 hours a day.
3.5.1 Intermittence Factor - This factor shall be stated as the ratio
between load time and total time between the beginning of two sequential
load periods for intermittent loads, where the load period is loo short lo
give stationary temperature conditions.
9
IS : 2511.1963
3.5.2 Utili<ation Factor - This factor shall be stated as the ratio between
the load time and the total time for non-continuous load where each load
period is long enough to give practically stationary temperature conditions.
3.6 Types 6f Load - For the purposes of rating, the type of rectifier load
should be specified, that is resistive load, inductive load, capacitive load,
battery load,’ machine load or combination of loads. If not otherwise
specified, the load shall be taken to be resistive.
3.7 The rating of rectifiers may be increased by asslsted cooling; on the

other hand, if rectifiers are used under conditions of restricted cooling, the
rating will be reduced.
3.8 Under conditions of use not covered by the standard, the manufac-
turer, in consultation with purchaser, will specify an appropriate rating.
3.9 For some useful information on the basis of ratings see Appendix A.
4. METHODS OF CONNECTION
4.1 Rectifier stacks may either be completed in one of the forms given in
the following list, or more than one stack may be used to complete such a
form of circuit connections:
ITEM CONNECTION NAME PULSE

NUMBER
1 Half-wave connection 1
2
+
m_ Back-wave connection 1
+
3
P- Centre-tap connection 2
Single-phase bridge connection 2
Voltage-doubler bridge connec-

tion 2
10
I
~--_---.___-._ _
rSr2511-1%3
ITEX CONNECTION NAME Pasm
+ NUMBEB
6
d3! Two-step voltage-doubler connec-
tion 1

I pi-+$-r

7 One-pulse voltage multiplier 1
+
a Two-pulse voltage multiplier 2
!b-
9 Three-phase star ( shown with
zig-zag tranrformer a8 an
example ) 3
+
10 Six.phase star 6
11 Double three-phase star (with

interphase transformer ) 6
Three-phase bridge 6
11
P
IS I 2511- 1963
5. MARKING
5.1 Each rectifier stack shall be clearly and indelibly marked with the
following information:
a) The manufacturer’s name and/or trade-mark,
b) Date of manufacture ( may be given by quarter ),
c) Country of manufacture,
d) The following symbols or colours for the terminal markings:

Terminal Symbol Colour
AC 4 Yellow
DC positive + Red
DC negative - Blue
5.2 The code designation as given in Appendix B shall also be marked on

the stacks.
5.3 Where suitable, the forward direction of stacks forming rectifying

elements shall be indicated by an arrow (for example, on rod-shaped
stacks ) .
5.4 Rectifier stacks may also be marked with the IS1 Certification Mark.
NOTE- The use of the IS1 Certification Mark is governed by :be provisions of
the Indian Standards Institution (Certification Marks) Act and the Rules and
Regulations made thereunder. The IS1 Mark on products covered by an Indian Standard
conveys the assurance that they have been produced to comply with the requirements
‘of that standard under a well-defined system of inspection, testing and quality control
which is devised and supervised by ISI and operated by the producer. IS1 marked
products are also continuously checked by IS1 for conformity to that standard as a
further safeguard. Details of conditions under which a licence for the use of the IS1
Certification Mark may be granted to manufacturers or processors, may be obtained
from the Indian Standards Institution.
6. VOLTAGE-CURRENT CHARACTERISTIC CURVES, DATA AND

POWER LOSSES
6.1 Voltage-Current Characteristics and Data
6.1.1 All data given for the stacks shall refer to the ambient tempera-
ture for which the new stacks are rated.
6.1.2 The currents and voltages in the circuit to which the charac-
teristic curves and data refer shall be stated.
12
IS t 2511- 1963
6.1.3 Characteristic curves shall preferably be given for rectifying

elements or single cells of a rectifier.
6.1.4 It shall be clearly stated whether a characteristic curve refers to
stationary dc values, average values during rectifier operation or instan-
taneous values during rectifier operation.
NOTE - In most cases, the characteristics ofa rectifying element valid for stationary
dc do not apply at rectifier operation because of the dynamic physical phenomena in
the cells.
6.1.5 Unless otherwise specified, the characteristic curves for rectifier

operation shall be taken to apply for single-phase bridge operation with

resistance load ( see also 3.1.1 ) .
6.1.6 Drawing of characteristic curves in either of the two alternatives
given in Fig. 8 is recommended.
FORWARO
CURRENT
REVERSE
CURRENT
REVERSE
REVERSE VOLTAGE
CURRENT
ALTERNATIVE 1 ALTERNATIVE II
FIG. 8 CHARACTERISTIC CURVES
6.2 Power Losses

6.2.1 The power losses given shall apply to the new stack and specified
service conditions.
6.2.2 It shall be stated whether the losses given apply- to rectifier cell,
rectifier stack or other configuration.
6.2.3 When giving data for stacks being built from certain types of
cells, the losses per cell shall preferably be given ( SM also Appendix C ).
13
IS : 2511- 1963
7. PERFORMANCE REQUIREMENTS
7.1 Service Time
7.1.1 During the service time, which applies for rated service (corn;
prising a given duty factor ) and includes the off time, the ac voltage has
to be increased for maintaining the rated dc voltage on account of the
steady increase in the forward voltage drop. But at the end of the rated
time, the ac voltage necessary shall be the rated ac voltage and shall not
be increased further. As the forward voltage drop is steadily increasing;

the rated dc voltage can no longer be obtained ( see Fig, 9 ).

VOLTAGE
I
t ’ RATED ALTERNATING VOLTAGE
____-___-----___-
RATED DC VOLTAGE
- -%_VcL_ra_cE
RATED SERVICE TIME --__
(INCLUDING OFF TIME) ’ --__
AT GIVEN DUTY FACTOR
TIME WHEN RATED OUTPUT
I, CAN NO LONGER DE OBTAINED
END OF RATED
s%x SERVICE TIME
FIG. 9 %i!RVICE TIME

7.1.2 The storage period before the rectifier is put mto operation is not
inchtded in the rated service time.
7.2 Reverse Voltage
7.2.1 A stack shall withstand, without damage or permanent change of
its characteristics, operation at 110 percent of the rated ac voltage and the
maximum permissible ac reverse voltage respectively at no load for a
period of 5 minutes each.
7.2.2 A rectifier stack, when required by application and so specified
by the purchaser, shall continuously withstand its rated dc voltage
applied to the dc terminals when the alternating current is interrupted.
7.2.3 When a stack, having been out of service or having been in
service at low voltage, cannot be directly connected to its rated ac
voltage and rated reverse voltage respectively, without damage or
14
IS: 2511-1963
permanent change in its characteristics, the manufacturer shall state, if

required, the procedure for re-forming the stack.
7.3 Insulation
7.3.1The insulation between the cells and the spindle as well as
different insulated parts of the same stack shall be tested.
7.3.2 The insulation shall withstand, unless otherwise specified, an ac
rms voltage having a frequency between 40 and 60 c/s and given by the

formula,
2x$.+1ooov
with a minimum of 2 060 V for a period of one minute. UP is the peak

value of the highest voltage which occurs between two terminals of the
stack at rated service.
ull
7.3.3 -- 2
Where 1/ is not higher than 90 V, insulation may be tested at
a lower voltage than given in which shall be clearly stated by the
7.3.2,
manufacturer.
8. TESTS
8.1Type tests for approval and routine tests during manufacture shall be
applied as detailed below:
Tyke Test Routine Tat
Inspection ( 8.2 ) Inspection ( 8.2 )
Forward Voltage Drop ( 8.3 ) Forward Voltage Drop ( 8.3)
Reverse Leakage ( 8.4) Reverse Leakage ( 8.4 )
High Voltage (8.5 ) High Voltage ( 8.5 )
Output Voltage ( 8.6)
Conversion Efficiency ( 8.7)
Load ( 8.8)
Shelf Life ( 8.9 )
8.1.1 The type tests shall be made by a recognized testing authority
which may be the manufacturer itself.
8.2 Inspection
8.2.1The rectifiers shall be subjected to a general inspection for the
quality of workmanship and finish.
15
IS I 2511- 1963
8.3 Forward Voltage Drop Test
8.3.1 The average voltage drop measured at the temperature of 27 & 5°C
and between adjacent pairs of terminals shall not exceed I.5 volts per
series connected cell when the normal rated dc output current of the
section under test is caused to flow in the conducting direction of the
rectifier ( see also Appendix C ).
8.4 Reverse Leakage Test

8.4.1 The rectifier stack or stacks shall be connected as a single-phase

bridge, the output terminals of the bridge being unconnected. The rated
ac input voltage shall be applied to the input terminals of the bridge and
input current measured by a moving coil rectifier instrument at a
temperature of 27 f 5°C. The mean value of this current shall not exceed
7 percent of the rated dc load current for the bridge after an interval of
30 seconds from the application of the voltage ( see also Appendix C ).
8.5 High Voltage Test
8.5.1 All the terminals in the same circuit shall be connected together
and the test voltage in accordance with 7.3 shall be applied between the
terminals and the spindle and between the different circuits, if there are
more than one on the same spindle, for a period of one minute. There shall
be no breakdown or other evident deterioration.
8.6 Output Voltage Test
8.6.1 For this test, the rectifier unit in association, if necessary, with
others of the same type shall be connected into a single-phase bridge
circuit and operated on resistance load at its rated current and input
voltage. The input shall be obtained from a low impedance source of
sinusoidal voltage.
8.6.2 The dc output voltage shall be measured and shall not be less
than the manufacturer’s rated figure.
8.6.3 Where it is also important that a maximum value shall not be
exceeded, the purchaser shall draw the attention of the supplier to this
fact at the time of enquiry and order.
8.7 Conversion Efficiency Test
8.7.1 Under the test conditions of 8.6, the measurement of input volta e,
input watts, mean output currents and mean output voltage shall % c
recorded and the conversion efficiency calculated f see 2.28 ).
16
IS : 2511 - 1%3
8.8 Load Test
8.8.1 At the commencement of the test the conditions shall be as

in 86.1. The rectifier shall be loaded in an ambient temperature of 40°C
continuously for the rated service time. The load resistance shall be kept
constant. The input voltage shall be started at a recommended lower
value ( see 3.3.1). At the end of the service time, the rated ac input
voltage shall not give less than the rated output dc voltage.
88.2 Where rectifiers have been specified for operation at other

ambient temperatures (see 3.1.2.1 ), this test shall be carried out at the
appropriate ambient temperature and rating.

8.9 Shelf Life Test
8.9.1 The rectifier stack shall be stored for a period of six months under
clean and dry condition and at all times in equilibrium with the atmos-
pheric conditions of the room. At the end of this period, the rectifier
stack shall be capable of meeting the requirements of 8.2 to 8.6 after
re-forming, if necessary.
APPENDIX A
( czausf?3.9 )
RATINGS OF RECTIFIER STACKS
A-l. BASIS OF RATING
A-l.1 The rectifier stacks are largely rated on thermal basis, that is ratings
are chosen so that the corresponding internal heat losses will not result in
excessive stack temperatures.
A-1.1.1 Internal heat losses in stacks consist of: (a) the forward loss due
to the passage of load current. through the forward resistance of the cells,
and (b) the reverse loss due to the flow of reverse or leakage current
through the reverse resistance of the cells.
A-1.1.2 Since the forward resistance decreases with increasing cell

temperature, the forward loss also decreases with increasing temperature
at any given load. Also since the reverse voltage remains substantially
constant for a given load, the reverse loss increases with increasing temne-
rature because of the decreasing reverse resistance.
17
Is : 2511-1%3
A-1.1.3 The total internal heat loss in watts is the sum of the forward
and reverse losses and may vary directly or inversely with the cell
temperature or may remain substantially constant over a wide range of
temperature depending upon the choice of voltage and current per cell.
A-1.1.4 In general, standard cell ratings will give a substantially

constant value of internal heat loss over the normal range of indoor
ambient temperatures. The shape of the loss curve is ro matched to the
heat dissipation curves of the various types of stack structures so that
stable operation will result after the cells are fully aged or if the ambient

temperature, for any reason, should occasionally exceed the specified value.
A-l.2 When a rectifier stack has more than one cell in series per elemen),
it is only necessary to multiply the voltage rating for the specified circmt
by the number of cells in series to get the total voltage rating of the stack.
Likewise, when there is more than one cell in parallel per element, the
current rating should be multiplied by the number of cells in parallel to
get the total current rating of the stack.
APPENDIX B
( czause5.2 )
CODE DESIGNATION OF STACKS
B-l. CODE DESIGNATION
B-l.1 The following different codes should be included in the code

designation.
B-1.1.1 Strucfu~e Code-A code giving the structure of the stack with
regard to connection and number of cells in series and parallel per arm.
B-1.1.2 Rating Code - A code giving ratings of the stack.
B-1.1.3 Manufacturer’s Code -A code specified by the manufacturer to

give such information which is not included in the structure code.
B-2. DESCRIPTION OF CODE

B-2.1 The code consists of letters and figures in 10 positions, in which
the last five positions are the structure code according to this specification
18
ISr2511-1963
and the first five positions are the manufacturer’s own code for other
indications not given in the structure code, such as ratings, brackets,
finish, etc.
xxxxx xxxxx
Manufacturer’s Code Structure Code

B-2.2The first two positions of the structure code should normally be

figures indicating the number of cells in series per arm, including 0 for
numbers below 10. The third position shall normally be a letter indicating
the stack connection according IO B-2.3. The fourth and fifth positions
shall normally be figures indicating the number of cells in parallel. When
one of these numbers needs 3 positions, the’letter is moved one step to the
right or left.
xxxxx 12 A 02
~------Cells in parallel per arm
Connection
- Cells in series per arm
Example 2;
xxxxx 123 A 1
B-2.3 Code letters according to the following table shall be used for
designating the stack connection.
NOTE -As these designations refer only to the structure of stacks, these
connections may be used for several purposes. The connections F and S may be used
with or without interphase transformer. More stacks may be combined to form
another connection, for example two D stacks may be used to make a single-phase
bridge.
19
iS : 2511- 1963
ITEM CONNECTION NAME CODE

LETTER
0 4
7 0
1 Half-wave A

2 Centre-tap, positive C
,
3 Centre-tap, negative N
4 Voltage doubler
Single-phase bridge,
positive outer P
20
_^__._
IS t 2511- 1963
ITRM CONNECTION NAME CODE

LETTER
Open bridge, singlc-

phase H

8 Three-phase atac,
common positive E
9 Three-phase star,
common negative Y
h N N
12 Three-pulse bridge G
__-__-__--_-~----
13 A sl’_a & Ope&ridge, three- K
t - + - +
B-2.3.1The manufacturer’s code shall always end with a letter, as the

next position is the first figure of the structure code.
21
IS t 2511.- 1963
APPENDIX C
( Clauses 6.2, 8.3 and 8.4)
TEST METHODS
C-O. GENERAL
C-O.1 Power losses, forward voltage drop and reverse current are prefer-

ably measured with the same arrangement. Unless otherwise specified,
these measurements shall be carried out for rated dc voltage and direct
current.
C-l. PROCEDURE
C-1.0 The simplest method is a short-circuit and open-circuit test, where

the loss values are calculated from the measured values.
C-l.1 The rectifier is connected to the instruments in accordance with

Fig. 10.
C-1.2 The short-circuit test gives the forward power losses and forward
voltage drop. The open-circuit test gives the reverse pov.er losses and
reverse current.
C-l.3 As the waveshape of the forward current is different from that in

actual service, the measured value of forward power losses has to be
corrected according to the following formula:
P I= C,P
where
P 1=actual value of forward power losses,

P = measured value of forward power losses,
- (%)‘3 + (2-)2
n= number of cells in series per arm,

c:,,,= threshold voltage of the cells (see below ),
40 = rated direct current,
fLl = rms value of alternating current at rated service, and
fL = rms value of alternating current on the measuring
connection.
22
SHORT’ CIRCUIT OPEN CIRCUIT SHORT CIRCUIT
Al = ac ammeter.
A2 = Moving coil ammeter ( low voltage drop ).
A, = Moving coil ammeter with rectifier for measuring the average reverse current.
VI = ac voltmeter.
k2; = Electra-dynamic wattmeter.
NOTE- Amme&zrs,voltmeters and wattmeters used in this connection diagram shall be of an accuracy class
not inferior to 1.5 [ se$S : 1248-1968 Specification for direct acting electrical indicating instruments (Jirst reuisiun )].
FIG. 10 CONNECTIONDIAGRAM
IS':2!511-1963
The threshold voltage U,, is the voltage which has to be overcome

before any appreciable curretlt flows in the forward direction. It only
needs to be known with f 20 percent accuracy for the calculation of the
correction factor ( scc also Fig. 8 ):
C-l.4 The forward voltage drop is measured during the short-circuit test
with the voltmeter V,. As the voltmeter VI indicates the rms value, the
average forward voltage drop is obtained by dividing the indicated voltage
by 2.22 for both the single-phase and the three-phase bridge connections.
C-l.5 When desirable, the forward power losses in single-phase connection
can be measured with sinusoidal current by connecting a resistor in series

on the ac &de of the connection shown in Fig. 10, left. The resistor shall

absorb a voltage about 5 times the voltage drop of the stack. When such
a resistor is used, the voltage measured by the voltmeter !‘I is no longer
sinusoidal and the true average value can only be obtained by using
an instrument indicating average value. The measured value of power
loss is the correct value and does not need any correction as suigested
in C-1.3.
C-l.6 The milliammeter A3 indicates twice the average reverse current.
AS the waveshape can vary, a moving coil instrument with a rectifier shall
be used to get the average value.
NOTE- In this measurement the capacitive current component is included. This
component might influence
the measured value considerably and is less significant
than the ohmic componentof the reversecurrent.
24

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SUPPLIED BY BOOK SUPPLY BUREAU TO L&T LIMIED ECC DIVISION

UDYOG VIHAR GURGAON FOR INTERNAL USE AT THIS LOCATION ONLY

SUPPLIED BY BOOK SUPPLY BUREAU TO L&T LIMIED ECC DIVISION

-INDIAN STANDARDS INSTITUTION

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0.7 This standard is intended chiefly. to cover the technical provisions

1.1 This standard applies to polycrystalline semi-conductor rectifier stacks

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FIG 2 RECTIFIERSTACK( UNIT )

FI$. 3 RECTIFIER\STACK ASSEMBLY

1%: 2511- 1963

2.7 Rectifying Element-A circuit element bounded by one positive

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FIG. 7 ARM OF A RECTIFIERCONNECTION

2.13 Average Reverse Current-The average value of the current in

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2.26 Positive Creep Effect - A gradual increase in the reverse current

SUPPLIED BY BOOK SUPPLY BUREAU TO L&T LIMIED ECC DIVISION

UDYOG VIHAR GURGAON FOR INTERNAL USE AT THIS LOCATION ONLY

of cells by referring to the rating of a reference stack, composed of the

SUPPLIED BY BOOK SUPPLY BUREAU TO L&T LIMIED ECC DIVISION

SUPPLIED BY BOOK SUPPLY BUREAU TO L&T LIMIED ECC DIVISION

ITEM CONNECTION NAME PULSE

Single-phase bridge connection 2

Voltage-doubler bridge connec-

ITEX CONNECTION NAME Pasm

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UDYOG VIHAR GURGAON FOR INTERNAL USE AT THIS LOCATION ONLY

a Two-pulse voltage multiplier 2

11 Double three-phase star (with

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5.2 The code designation as given in Appendix B shall also be marked on

5.3 Where suitable, the forward direction of stacks forming rectifying

6. VOLTAGE-CURRENT CHARACTERISTIC CURVES, DATA AND

6.1.3 Characteristic curves shall preferably be given for rectifying

6.1.5 Unless otherwise specified, the characteristic curves for rectifier

SUPPLIED BY BOOK SUPPLY BUREAU TO L&T LIMIED ECC DIVISION

FIG. 8 CHARACTERISTIC CURVES

6.2 Power Losses

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UDYOG VIHAR GURGAON FOR INTERNAL USE AT THIS LOCATION ONLY

FIG. 9 %i!RVICE TIME

permanent change in its characteristics, the manufacturer shall state, if

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with a minimum of 2 060 V for a period of one minute. UP is the peak

8.3 Forward Voltage Drop Test

8.4 Reverse Leakage Test

SUPPLIED BY BOOK SUPPLY BUREAU TO L&T LIMIED ECC DIVISION

UDYOG VIHAR GURGAON FOR INTERNAL USE AT THIS LOCATION ONLY

8.5 High Voltage Test

8.6 Output Voltage Test

8.7 Conversion Efficiency Test

8.8 Load Test

8.8.1 At the commencement of the test the conditions shall be as

88.2 Where rectifiers have been specified for operation at other

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A-l. BASIS OF RATING

A-1.1.2 Since the forward resistance decreases with increasing cell

A-1.1.4 In general, standard cell ratings will give a substantially