Tlv915X 4.5-Mhz, Rail-To-Rail Input/Output, Low Offset Voltage, Low Noise Op Amp
Tlv915X 4.5-Mhz, Rail-To-Rail Input/Output, Low Offset Voltage, Low Noise Op Amp
Tlv915X 4.5-Mhz, Rail-To-Rail Input/Output, Low Offset Voltage, Low Noise Op Amp
www.ti.com TLV9151,
SBOS986C – OCTOBER TLV9152,
2019 – REVISED TLV9154
DECEMBER 2020
SBOS986C – OCTOBER 2019 – REVISED DECEMBER 2020
TLV915x 4.5-MHz, Rail-to-Rail Input/Output, Low Offset Voltage, Low Noise Op Amp
1 Features 3 Description
• Low offset voltage: ±125 µV The TLV915x family (TLV9151, TLV9152, and
• Low offset voltage drift: ±0.3 µV/°C TLV9154) is a family of 16-V, general purpose
• Low noise: 10.5 nV/√ Hz at 1 kHz operational amplifiers. These devices offer
• High common-mode rejection: 120 dB exceptional DC precision and AC performance,
including rail-to-rail output, low offset (±125 µV, typ),
• Low bias current: ±10 pA
low offset drift (±0.3 µV/°C, typ), and 4.5-MHz
• Rail-to-rail input and output bandwidth.
• Wide bandwidth: 4.5-MHz GBW
• High slew rate: 20 V/µs Convenient features such as wide differential input-
voltage range, high output current (±75 mA), high
• Low quiescent current: 560 µA per amplifier
slew rate (20 V/μs), and low noise (10.5 nV/√ Hz)
• Wide supply: ±1.35 V to ±8 V, 2.7 V to 16 V make the TLV915x a robust, low-noise operational
• Robust EMIRR performance: EMI/RFI filters on amplifier for industrial applications.
input pins
• Differential and common-mode input voltage range The TLV915x family of op amps is available in
to supply rail standard packages and is specified from –40°C to
125°C.
• Industry standard packages:
– Single in SOT-23-5, SC70-5, and SOT553 Device Information
– Dual in SOIC-8, SOT-23-8, TSSOP-8, PART NUMBER (1) PACKAGE BODY SIZE (NOM)
VSSOP-8, WSON-8, and X2QFN-10 SOT-23 (5) 2.90 mm × 1.60 mm
– Quad in SOIC-14, TSSOP-14, WQFN-14, and SOT-23 (6) 2.90 mm × 1.60 mm
TLV9151
WQFN-16 SC70 (5) 2.00 mm × 1.25 mm
An©IMPORTANT
Copyright NOTICEIncorporated
2020 Texas Instruments at the end of this data sheet addresses availability, warranty, changes, use in safety-critical
Submit Document applications,
Feedback 1
intellectual property matters and other important disclaimers. UNLESS OTHERWISE NOTED, this document contains PRODUCTION
DATA. Product Folder Links: TLV9151 TLV9152 TLV9154
TLV9151, TLV9152, TLV9154
SBOS986C – OCTOBER 2019 – REVISED DECEMBER 2020 www.ti.com
Table of Contents
1 Features............................................................................1 8 Application and Implementation.................................. 33
2 Applications..................................................................... 1 8.1 Application Information............................................. 33
3 Description.......................................................................1 8.2 Typical Applications.................................................. 33
4 Revision History.............................................................. 2 9 Power Supply Recommendations................................35
5 Pin Configuration and Functions...................................4 10 Layout...........................................................................35
6 Specifications................................................................ 11 10.1 Layout Guidelines................................................... 35
6.1 Absolute Maximum Ratings ..................................... 11 10.2 Layout Example...................................................... 36
6.2 ESD Ratings .............................................................11 11 Device and Documentation Support..........................37
6.3 Recommended Operating Conditions ...................... 11 11.1 Device Support........................................................37
6.4 Thermal Information for Single Channel .................. 11 11.2 Documentation Support.......................................... 37
6.5 Thermal Information for Dual Channel .....................12 11.3 Related Links.......................................................... 37
6.6 Thermal Information for Quad Channel ................... 12 11.4 Receiving Notification of Documentation Updates.. 37
6.7 Electrical Characteristics ..........................................13 11.5 Support Resources................................................. 37
6.8 Typical Characteristics.............................................. 17 11.6 Trademarks............................................................. 38
7 Detailed Description......................................................24 11.7 Electrostatic Discharge Caution.............................. 38
7.1 Overview................................................................... 24 11.8 Glossary.................................................................. 38
7.2 Functional Block Diagram......................................... 24 12 Mechanical, Packaging, and Orderable
7.3 Feature Description...................................................25 Information.................................................................... 39
7.4 Device Functional Modes..........................................32
4 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision B (May 2020) to Revision C (December 2020) Page
• Updated the numbering format for tables, figures and cross-references throughout the document ..................1
• Changed SOT-23 (5) package status on Device Information from Preview to Active ....................................... 1
• Changed SC70 (5) package status on Device Information from Preview to Active ...........................................1
• Changed SOT-23 (6) package status on Device Information from Preview to Active ....................................... 1
• Changed SOT-23 (8) package status on Device Information from Preview to Active ....................................... 1
• Changed VSSOP (8) package status on Device Information from Preview to Active ....................................... 1
• Changed SOIC (14) package status on Device Information from Preview to Active ......................................... 1
• Changed TSSOP (14) package status on Device Information from Preview to Active ......................................1
• Changed X2QFN (14) package status on Device Information from Preview to Active ......................................1
• Removed preview notation on SOT-23-5 (DBV), SC70-5 (DCK) SOT-23-6 (DBV), and SOT-23-8 (DDF)
packages in Pin Configurations and Functions ..................................................................................................4
• Removed preview notation on SOIC-14 (D) package in Pin Configurations and Functions ..............................4
• Removed preview notation on TSSOP-14 (PW) package in Pin Configurations and Functions ....................... 4
• Removed preview notation on X2QFN-14 (RUC) package in Pin Configurations and Functions ..................... 4
• Changed WSON (8) package status on Device Information from Preview to Active .........................................1
• Removed preview notation on SOIC-8 (D), TSSOP-8 (PW), and WSON-8 (DSG) packages in Pin
Configurations and Functions ............................................................................................................................ 4
• Added Typical Characteristics section in Specifications section.......................................................................17
OUT 1 5 V+ IN+ 1 5 V+
V± 2 V± 2
A. DRL package is preview only. Figure 5-2. TLV9151 DCK 5-Pin SC70 and SOT-553
Figure 5-1. TLV9151 DBV and DRL Package(1) 5-Pin Top View
SOT-23 Top View
OUT 1 6 V+
V± 2 5 NC
+IN 3 4 ±IN
Not to scale
A. DRL package is preview only.
Figure 5-3. TLV9151S DBV and DRL Package(1) 6-Pin SOT-23 and SOT-563 Top View
OUT1 1 8 V+
OUT1 1 8 V+
IN1± 2 7 OUT2
IN1± 2 7 OUT2
Thermal
IN1+ 3 6 IN2±
Pad
IN1+ 3 6 IN2±
V± 4 5 IN2+
V± 4 5 IN2+
Not to scale
Not to scale
A. DGK package is preview only.
Figure 5-4. TLV9152 D, DDF, DGK, and PW A. Connect thermal pad to V–. See Packages with and Exposed
Package(1) 8-Pin SOIC, SOT-23-8, TSSOP, and Thermal Pad section for more information.
VSSOP Top View Figure 5-5. TLV9152 DSG Package(1) 8-Pin WSON
With Exposed Thermal Pad Top View
IN1+
OUT1 1 10 V+
IN1± 2 9 OUT2
V± 1 9 IN1±
IN1+ 3 8 IN2±
10
V± 4 7 IN2+
SHDN1 2 8 OUT1
SHDN1 5 6 SHDN2
5
Figure 5-6. TLV9152S DGS Package(1) 10-Pin
IN2+ 4 6 OUT2
VSSOP Top View
Not to scale
IN2±
Figure 5-7. TLV9152S RUG Package 10-Pin X2QFN
Top View
OUT1
OUT4
IN1±
IN4±
OUT1 1 14 OUT4
IN1± 2 13 IN4±
IN1+ 3 12 IN4+
16
15
14
13
V+ 4 11 V± IN1+ 1 12 IN4+
IN2+ 5 10 IN3+ V+ 2 11 V±
Thermal
IN2± 6 9 IN3± IN2+ 3 Pad 10 IN3+
8
Not to scale
OUT2
NC
NC
OUT3
SOIC and TSSOP Top View Not to scale
OUT4
IN1± 1 12 IN4±
14
13
IN1+ 2 11 IN4+
V+ 3 10 V±
IN2+ 4 9 IN3+
6
IN2± 5 8 IN3±
OUT2
OUT3
Not to scale
Figure 5-10. TLV9154 RUC Package 14-Pin X2QFN With Exposed Thermal Pad Top View
OUT1
OUT4
IN1±
IN4±
16
15
14
13
IN1+ 1 12 IN4+
V+ 2 11 V±
Thermal
IN2+ 3 Pad 10 IN3+
IN2± 4 9 IN3±
8
OUT2
SHDN12
SHDN34
OUT3
Not to scale
Figure 5-11. TLV9154S RTE Package(1) 16-Pin WQFN With Exposed Thermal Pad Top View
6 Specifications
6.1 Absolute Maximum Ratings
over operating ambient temperature range (unless otherwise noted) (1)
MIN MAX UNIT
Supply voltage, VS = (V+) – (V–) 0 20 V
Common-mode voltage (3) (V–) – 0.5 (V+) + 0.5 V
Signal input pins Differential voltage (3) VS + 0.2 V
Current (3) –10 10 mA
Output short-circuit (2) Continuous
Operating ambient temperature, TA –55 150 °C
Junction temperature, TJ 150 °C
Storage temperature, Tstg –65 150 °C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device
reliability.
(2) Short-circuit to ground, one amplifier per package.
(3) Input pins are diode-clamped to the power-supply rails. Input signals that may swing more than 0.5 V beyond the supply rails must be
current limited to 10 mA or less.
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
(2) This package option is preview for TLV9151.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
(2) This package option is preview for TLV9152.
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
(2) This package option is preview for TLV9154.
FREQUENCY RESPONSE
Gain-bandwidth
GBW 4.5 MHz
product
SR Slew rate VS = 16 V, G = +1, CL = 20 pF 21 V/μs
To 0.01%, VS = 16 V, VSTEP = 10 V , G = +1, CL = 20 pF 2.5
To 0.01%, VS = 16 V, VSTEP = 2 V , G = +1, CL = 20 pF 1.5
tS Settling time μs
To 0.1%, VS = 16 V, VSTEP = 10 V , G = +1, CL = 20 pF 2
To 0.1%, VS = 16 V, VSTEP = 2 V , G = +1, CL = 20 pF 1
Phase margin G = +1, RL = 10 kΩ 60 °
Overload recovery
VIN × gain > VS 400 ns
time
Total harmonic 0.00021
THD+N VS = 16 V, VO = 3 VRMS, G = 1, f = 1 kHz
distortion + noise %
OUTPUT
VS = 16 V, RL = no
5 10
load(2)
VS = 16 V, RL = 10 kΩ 50 55
SHDN pin input bias VS = 2.7 V to 40 V, (V+) ≥ SHDN ≥ (V–) + 0.9 V 500
nA
current (per pin) VS = 2.7 V to 40 V, (V–) ≤ SHDN ≤ (V–) + 0.7 V 150
(1) Disable time (tOFF) and enable time (tON) are defined as the time interval between the 50% point of the signal applied to the SHDN pin
and the point at which the output voltage reaches the 10% (disable) or 90% (enable) level.
(2) Specified by characterization only.
33 50
30
27 40
24
Population (%)
Population (%)
21
30
18
15
20
12
9
10
6
3
0 0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0
-600
-480
-360
-240
-120
120
240
360
480
Offset Voltage (µV) 600 D001 Offset Voltage Drift (µV/C) D002
Figure 6-1. Offset Voltage Production Distribution Figure 6-2. Offset Voltage Drift Distribution
900 400
700 300
500
200
Offset Voltage (µV)
300
100
100
0
-100
-100
-300
-500 -200
-700 -300
-900 -400
-40 -20 0 20 40 60 80 100 120 140 -40 -20 0 20 40 60 80 100 120 140
Temperature (°C) D004 Temperature (°C) D003
VCM = V+ VCM = V–
Figure 6-3. Offset Voltage vs Temperature Figure 6-4. Offset Voltage vs Temperature
800 800
600 600
400 400
Offset Voltage (µV)
200 200
0 0
-200 -200
-400 -400
-600 -600
-800 -800
-8 -6 -4 -2 0 2 4 6 8 4 4.5 5 5.5 6 6.5 7 7.5 8
VCM D005
VCM D005
TA = 25°C TA = 25°C
Figure 6-5. Offset Voltage vs Common-Mode Voltage Figure 6-6. Offset Voltage vs Common-Mode Voltage (Transition
Region)
800 800
600 600
400 400
Offset Voltage (µV)
0 0
-200 -200
-400 -400
-600 -600
-800 -800
-8 -6 -4 -2 0 2 4 6 8 -8 -6 -4 -2 0 2 4 6 8
VCM D006
VCM D007
TA = 125°C TA = –40°C
Figure 6-7. Offset Voltage vs Common-Mode Voltage Figure 6-8. Offset Voltage vs Common-Mode Voltage
600 100 200
90 Gain (dB) 175
500 Phase ( )
400 80 150
300 70 125
Offset Voltage (µV)
200 60 100
Gain (dB)
Phase ( )
50 75
100
40 50
0
30 25
-100
20 0
-200
10 -25
-300
0 -50
-400 -10 -75
-500 -20 -100
-600 100 1k 10k 100k 1M 10M
2 4 6 8 10 12 14 16 18 Frequency (Hz) C002
Supply Voltage (V) D008
CL = 20 pF
Figure 6-9. Offset Voltage vs Power Supply
Figure 6-10. Open-Loop Gain and Phase vs Frequency
80 6
G= 1
70 G=1 4.5
Input Bias and Offset Current (pA)
60 G = 10
G = 100 3
Closed-Loop Gain (dB)
50 G = 1000
1.5
40
0
30
-1.5
20
-3
10
-4.5
0 IB
-6 IB+
-10
IOS
-20 -7.5
100 1k 10k 100k 1M 10M -8 -7 -6 -5 -4 -3 -2 -1 0 1 2 3 4 5 6 7 8
Frequency (Hz) Common Mode Voltage (V) D010
C001
Figure 6-11. Closed-Loop Gain vs Frequency Figure 6-12. Input Bias Current vs Common-Mode Voltage
150 V+
IB
125 V+ 1V
IB+
Input Bias and Offset Current (pA)
100 IOS V+ 2V
V+ 3V
V +5V 90
V +4V 75
V +3V
60
45
V +2V
30
V +1V
15
V
0 10 20 30 40 50 60 70 80 90 100 0
Output Current (mA) D012 100 1k 10k 100k 1M 10M
Frequency (Hz)
Figure 6-15. Output Voltage Swing vs Output Current (Sinking) C003
165
125
120
160
115
PMOS (VCM V+ 1.5 V)
110 NMOS (VCM V+ 1.5 V) 155
105
100 150
95
145
90
85 140
-40 -20 0 20 40 60 80 100 120 140 -40 -20 0 20 40 60 80 100 120 140
Temperature (°C) D015 Temperature (°C) D016
f = 0 Hz f = 0 Hz
Figure 6-17. CMRR vs Temperature (dB) Figure 6-18. PSRR vs Temperature (dB)
0.2
0
10
-0.2
-0.4
-0.6
-0.8
-1 1
Time (1s/div) 1 10 100 1k 10k 100k
Frequency (Hz) C017
C019
Figure 6-19. 0.1-Hz to 10-Hz Noise Figure 6-20. Input Voltage Noise Spectral Density vs Frequency
-32 -20
RL = 10 k
-40 -30
RL = 2 k
-48 RL = 604 -40
RL = 128
-56 -50
THD+N (dB)
THD+N (dB)
-64 -60
-72 -70
-80
-80
-90
-88
RL = 10 k
-100 RL = 2 k
-96
-110 RL = 604
-104 RL = 128
-120
-112 1m 10m 100m 1 10
100 1k 10k Amplitude (Vrms) C023
Frequency (Hz) C012
BW = 80 kHz, f = 1 kHz
BW = 80 kHz, VOUT = 1 VRMS
Figure 6-22. THD+N vs Output Amplitude
Figure 6-21. THD+N Ratio vs Frequency
580 700
570 675
560 650
Quiescent current (µA)
550 625
540 600
530 575
520 550
510 525
500 500
490 475
480 450
2 4 6 8 10 12 14 16 18 -40 -20 0 20 40 60 80 100 120 140
Supply Voltage (V) D021
Temperature (°C) D022
140 700
VS = 4 V
650
135 600
550
130 500
450
400
125
350
300
120
250
200
115
-40 -20 0 20 40 60 80 100 120 140 150
Temperature (°C) 100 1k 10k 100k 1M 10M
D023
Frequency (Hz) C013
Figure 6-25. Open-Loop Voltage Gain vs Temperature (dB)
Figure 6-26. Open-Loop Output Impedance vs Frequency
60 80
70
50
60
40
Overshoot (%)
Overshoot (%)
50
30 40
30
20
RISO = 0 , Positive Overshoot 20 RISO = 0 , Positive Overshoot
10 RISO = 0 , Negative Overshoot RISO = 0 , Negative Overshoot
RISO = 50 , Positive Overshoot 10 RISO = 50 , Positive Overshoot
RISO = 50 , Negative Overshoot RISO = 50 , Negative Overshoot
0 0
0 500 1000 1500 2000 2500 3000 3500 4000 4500 5000 0 500 1000 1500 2000 2500 3000 3500 4000 4500 5000
Cap Load (pF) C007
Cap Load (pF) C008
Figure 6-27. Small-Signal Overshoot vs Capacitive Load Figure 6-28. Small-Signal Overshoot vs Capacitive Load
60
Input
Output
50
Phase Margin (Degree)
Amplitude (2V/div)
40
30
20
10
0 500 1000 1500 2000 2500 3000 3500 4000 4500 5000 Time (20us/div)
Cap Load (pF) C009 C016
Input Input
Output Output
Voltage (5V/div)
Voltage (5V/div)
Time (100ns/div) Time (100ns/div)
C018 C018
G = –10 G = –10
Figure 6-31. Positive Overload Recovery Figure 6-32. Negative Overload Recovery
Input
Output
Amplitude (5mV/div)
Amplitude (5mV/div)
Input
Output
Figure 6-33. Small-Signal Step Response, Rising Figure 6-34. Small-Signal Step Response, Falling
Input
Output
Amplitude (2V/div)
Amplitude (2V/div)
Input
Output
CL = 20 pF, G = 1 CL = 20 pF, G = 1
Figure 6-35. Large-Signal Step Response (Rising) Figure 6-36. Large-Signal Step Response (Falling)
100
Large Signal Step Response (2V/div)
80
60
Input
-70
14
-80
12
10 -90
8 -100
6
-110
4
-120
2
0 -130
1k 10k 100k 1M 10M 100 1k 10k 100k 1M 10M
Frequency (Hz) Frequency (Hz) C014
C020
Figure 6-39. Maximum Output Voltage vs Frequency Figure 6-40. Channel Separation vs Frequency
110
100
90
Gain(dB)
80
70
60
50
40
1M 10M 100M 1G
Frequency (Hz) C004
7 Detailed Description
7.1 Overview
The TLV915x family (TLV9151, TLV9152, and TLV9154) is a family of 16-V general purpose operational
amplifiers.
These devices offer excellent DC precision and AC performance, including rail-to-rail input/output, low offset
(±125 µV, typ), low offset drift (±0.3 µV/°C, typ), and 4.5-MHz bandwidth.
Wide differential and common-mode input-voltage range, high output current (±80 mA), high slew rate (21 V/µs),
low power operation (560 µA, typ) and shutdown functionality make the TLV915x a robust, high-speed, high-
performance operational amplifier for industrial applications.
7.2 Functional Block Diagram
90
80
EMIRR (dB)
70
60
50
40
30
1M 10M 100M 1G
Frequency (Hz) C004
VOUT
3V
Operation
16 V TA = 100°C
PD = 0.39W
JA = 138.7°C/W 0V Output
TJ = 138.7°C/W × 0.39W + 100°C High-Z
TJ = 154.1°C (expected)
150°C
TLV9151
Temperature 140ºC
IOUT = 30 mA +
RL 3V
+ VIN 100 –
– 3V
55 33
50 30
45 27
40 24
Overshoot (%)
Overshoot (%)
35 21
30 18
25 15
20 12
RISO = 0 :, Positive Overshoot RISO = 0 :, Positive Overshoot
15 RISO = 0 :, Negative Overshoot 9 RISO = 0 :, Negative Overshoot
10 RISO = 50 :, Positive Overshoot 6 RISO = 50 :, Positive Overshoot
RISO = 50 :, Negative Overshoot RISO = 50 :, Negative Overshoot
5 3
0 40 80 120 160 200 240 280 320 360 0 40 80 120 160 200 240 280 320 360
Cap Load (pF) C008
Cap Load (pF) C007
Figure 7-3. Small-Signal Overshoot vs Capacitive Figure 7-4. Small-Signal Overshoot vs Capacitive
Load (10-mV Output Step, G = 1) Load (10-mV Output Step, G = –1)
For additional drive capability in unity-gain configurations, improve capacitive load drive by inserting a small
resistor, RISO, in series with the output, as shown in Figure 7-5. This resistor significantly reduces ringing and
maintains DC performance for purely capacitive loads. However, if a resistive load is in parallel with the
capacitive load, then a voltage divider is created, thus introducing a gain error at the output and slightly reducing
the output swing. The error introduced is proportional to the ratio RISO / RL, and is generally negligible at low
output levels. A high capacitive load drive makes the TLV915x well suited for applications such as reference
buffers, MOSFET gate drives, and cable-shield drives. The circuit shown in Figure 7-5 uses an isolation resistor,
RISO, to stabilize the output of an op amp. RISO modifies the open-loop gain of the system for increased phase
margin.
+Vs
Vout
Riso
+
+ Cload
Vin -Vs
±
IN-
PMOS
PMOS
NMOS
IN+
NMOS
V-
Input
Output
Amplitude (2V/div)
Time (20us/div)
C016
RF
+
–
+VS
VDD
TLV915x
R1 100
IN–
–
RS IN+ 100
+
Power Supply RL
ID ESD Cell
+
VIN
–
VSS
+
–
–VS
TVS
Figure 7-8. Equivalent Internal ESD Circuitry Relative to a Typical Circuit Application
An ESD event is very short in duration and very high voltage (for example; 1 kV, 100 ns), whereas an EOS event
is long duration and lower voltage (for example; 50 V, 100 ms). The ESD diodes are designed for out-of-circuit
ESD protection (that is, during assembly, test, and storage of the device before being soldered to the PCB).
During an ESD event, the ESD signal is passed through the ESD steering diodes to an absorption circuit
(labeled ESD power-supply circuit). The ESD absorption circuit clamps the supplies to a safe level.
Although this behavior is necessary for out-of-circuit protection, excessive current and damage is caused if
activated in-circuit. A transient voltage suppressors (TVS) can be used to prevent against damage caused by
turning on the ESD absorption circuit during an in-circuit ESD event. Using the appropriate current limiting
resistors and TVS diodes allows for the use of device ESD diodes to protect against EOS events.
0.00002% 0.00312% 0.13185% 2.145% 13.59% 34.13% 34.13% 13.59% 2.145% 0.13185% 0.00312% 0.00002%
1 1 1 1 1 1 1 1 1 1 1 1
-61 -51 -41 -31 -21 -1 +1 +21 +31 +41 +51 +61
Figure 7-9 shows an example distribution, where µ, or mu, is the mean of the distribution, and where σ, or
sigma, is the standard deviation of a system. For a specification that exhibits this kind of distribution,
approximately two-thirds (68.26%) of all units can be expected to have a value within one standard deviation, or
one sigma, of the mean (from µ – σ to µ + σ).
Depending on the specification, values listed in the typical column of the Electrical Characteristics table are
represented in different ways. As a general rule of thumb, if a specification naturally has a nonzero mean (for
example, like gain bandwidth), then the typical value is equal to the mean (µ). However, if a specification
naturally has a mean near zero (like input offset voltage), then the typical value is equal to the mean plus one
standard deviation (µ + σ) in order to most accurately represent the typical value.
You can use this chart to calculate approximate probability of a specification in a unit; for example, for TLV915x,
the typical input voltage offset is 125 µV, so 68.2% of all TLV915x devices are expected to have an offset from –
125 µV to 125 µV. At 4 σ (±500 µV), 99.9937% of the distribution has an offset voltage less than ±500 µV, which
means 0.0063% of the population is outside of these limits, which corresponds to about 1 in 15,873 units.
Specifications with a value in the minimum or maximum column are assured by TI, and units outside these limits
will be removed from production material. For example, the TLV915x family has a maximum offset voltage of 675
µV at 25°C, and even though this corresponds to about 5 σ (≈1 in 1.7 million units), which is extremely unlikely,
TI assures that any unit with larger offset than 675 µV will be removed from production material.
For specifications with no value in the minimum or maximum column, consider selecting a sigma value of
sufficient guardband for your application, and design worst-case conditions using this value. For example, the 6-
σ value corresponds to about 1 in 500 million units, which is an extremely unlikely chance, and could be an
option as a wide guardband to design a system around. In this case, the TLV915x family does not have a
maximum or minimum for offset voltage drift, but based on Figure 6-2 and the typical value of 0.3 µV/°C in the
Electrical Characteristics table, it can be calculated that the 6 σ value for offset voltage drift is about 1.8 µV/°C.
When designing for worst-case system conditions, this value can be used to estimate the worst possible offset
across temperature without having an actual minimum or maximum value.
However, process variation and adjustments over time can shift typical means and standard deviations, and
unless there is a value in the minimum or maximum specification column, TI cannot assure the performance of a
device. This information should be used only to estimate the performance of a device.
7.3.9 Packages With an Exposed Thermal Pad
The TLV915x family is available in packages such as the WSON-8 (DSG) and WQFN-16 (RTE) which feature an
exposed thermal pad. Inside the package, the die is attached to this thermal pad using an electrically conductive
compound. For this reason, when using a package with an exposed thermal pad, the thermal pad must either be
connected to V– or left floating. Attaching the thermal pad to a potential other than V– is not allowed, and
performance of the device is not assured when doing so.
7.3.10 Shutdown
The TLV915xS devices feature one or more shutdown pins (SHDN) that disable the op amp, placing it into a low-
power standby mode. In this mode, the op amp typically consumes about 20 µA. The SHDN pins are active high,
meaning that shutdown mode is enabled when the input to the SHDN pin is a valid logic high.
The SHDN pins are referenced to the negative supply rail of the op amp. The threshold of the shutdown feature
lies around 800 mV (typical) and does not change with respect to the supply voltage. Hysteresis has been
included in the switching threshold to ensure smooth switching characteristics. To ensure optimal shutdown
behavior, the SHDN pins should be driven with valid logic signals. A valid logic low is defined as a voltage
between V– and V– + 0.4 V. A valid logic high is defined as a voltage between V– + 1.2 V and V– + 20 V. The
shutdown pin circuitry includes a pull-down resistor, which will inherently pull the voltage of the pin to the
negative supply rail if not driven. Thus, to enable the amplifier, the SHDN pins should either be left floating or
driven to a valid logic low. To disable the amplifier, the SHDN pins must be driven to a valid logic high. The
maximum voltage allowed at the SHDN pins is V– + 20 V. Exceeding this voltage level will damage the device.
The SHDN pins are high-impedance CMOS inputs. Channels of single and dual op amp packages are
independently controlled, and channels of quad op amp packages are controlled in pairs. For battery-operated
applications, this feature may be used to greatly reduce the average current and extend battery life. The typical
enable time out of shutdown is 30 µs; disable time is 3 µs. When disabled, the output assumes a high-
impedance state. This architecture allows the TLV915xS family to operate as a gated amplifier, multiplexer, or
programmable-gain amplifier. Shutdown time (tOFF) depends on loading conditions and increases as load
resistance increases. To ensure shutdown (disable) within a specific shutdown time, the specified 10-kΩ load to
midsupply (VS / 2) is required. If using the TLV915xS without a load, the resulting turnoff time significantly
increases.
LOAD 12 V
+ TLV9151
VOUT
–
RSHUNT
ILOAD 100 m
LM7705
RF
360 k
RG 7.5 k
The load current (ILOAD) produces a voltage drop across the shunt resistor (RSHUNT). The load current is set from
0 A to 1 A. To keep the shunt voltage below 100 mV at maximum load current, the largest shunt resistor is
defined using Equation 2.
Using Equation 2, RSHUNT is calculated to be 100 mΩ. The voltage drop produced by ILOAD and RSHUNT is
amplified by the TLV9151 to produce an output voltage of 0 V to 4.9 V. The gain needed by the TLV9151 to
produce the necessary output voltage is calculated using Equation 3.
Using Equation 3, the required gain is calculated to be 49 V/V, which is set with resistors RF and RG. Equation 4
is used to size the resistors, RF and RG, to set the gain of the TLV9151 to 49 V/V.
RF
Gain 1
RG (4)
Choosing R F as 360 kΩ, R G is calculated to be 7.5 kΩ. R F and R G were chosen as 360 kΩ and 7.5 kΩ because
they are standard value resistors that create a 49:1 ratio. Other resistors that create a 49:1 ratio can also be
used. Figure 8-2 shows the measured transfer function of the circuit shown in Figure 8-1.
8.2.1.3 Application Curves
5
3
Output (V)
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
ILOAD (A)
CAUTION
Supply voltages larger than 16 V can permanently damage the device; see the Absolute Maximum
Ratings.
Place 0.1-µF bypass capacitors close to the power-supply pins to reduce errors coupling in from noisy or high-
impedance power supplies. For more detailed information on bypass capacitor placement, refer to the Layout
section.
10 Layout
10.1 Layout Guidelines
For best operational performance of the device, use good PCB layout practices, including:
• Noise can propagate into analog circuitry through the power pins of the circuit as a whole and op amp itself.
Bypass capacitors are used to reduce the coupled noise by providing low-impedance power sources local to
the analog circuitry.
– Connect low-ESR, 0.1-µF ceramic bypass capacitors between each supply pin and ground, placed as
close to the device as possible. A single bypass capacitor from V+ to ground is applicable for single-
supply applications.
• Separate grounding for analog and digital portions of circuitry is one of the simplest and most-effective
methods of noise suppression. One or more layers on multilayer PCBs are usually devoted to ground planes.
A ground plane helps distribute heat and reduces EMI noise pickup. Make sure to physically separate digital
and analog grounds paying attention to the flow of the ground current.
• In order to reduce parasitic coupling, run the input traces as far away from the supply or output traces as
possible. If these traces cannot be kept separate, crossing the sensitive trace perpendicular is much better as
opposed to in parallel with the noisy trace.
• Place the external components as close to the device as possible. As illustrated in Figure 10-2, keeping RF
and RG close to the inverting input minimizes parasitic capacitance.
• Keep the length of input traces as short as possible. Always remember that the input traces are the most
sensitive part of the circuit.
• Consider a driven, low-impedance guard ring around the critical traces. A guard ring can significantly reduce
leakage currents from nearby traces that are at different potentials.
• Cleaning the PCB following board assembly is recommended for best performance.
• Any precision integrated circuit may experience performance shifts due to moisture ingress into the plastic
package. Following any aqueous PCB cleaning process, baking the PCB assembly is recommended to
remove moisture introduced into the device packaging during the cleaning process. A low temperature, post
cleaning bake at 85°C for 30 minutes is sufficient for most circumstances.
VIN +
RG VOUT
RF
NC NC
Use a low-ESR,
RG
ceramic bypass
GND ±IN V+ capacitor
V± NC GND
VS± GND
VOUT
Ground (GND) plane on another layer
Use low-ESR,
ceramic bypass
capacitor
Note
These files require that either the TINA software (from DesignSoft™) or TINA-TI software be installed.
Download the free TINA-TI software from the TINA-TI folder.
11.6 Trademarks
TINA-TI™ are trademarks of Texas Instruments, Inc and DesignSoft, Inc.
TINA™ and DesignSoft™ are trademarks of DesignSoft, Inc.
TI E2E™ is a trademark of Texas Instruments.
Bluetooth® is a registered trademark of Bluetooth SIG, Inc.
All trademarks are the property of their respective owners.
11.7 Electrostatic Discharge Caution
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may
be more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
11.8 Glossary
TI Glossary This glossary lists and explains terms, acronyms, and definitions.
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