AN720

Measuring Temperature Using the Watchdog Timer (WDT)

THEORY
Author: Ian Lao
Microchip Technology Inc. The WDT is an 8-bit timer with an 8-bit prescaler
Chandler, AZ option, driven from a free running on-chip RC oscillator.
This oscillator is completely independent of pins OSC1/
CLKIN, OSC2/CLKOUT, and the INTRC oscillator. As
INTRODUCTION with any RC oscillator, variances in temperature will
affect the frequency of the circuit. Cumulative effects
This application note shows how Microchip Technol- will therefore, show up as a change in the time-out
ogy’s Watchdog Timer (WDT) can be used to acquire period of the WDT.
rough temperature measurements.
By utilizing another timer as a reference, a sample may
Recent advances in sensor technology have allowed be established, whereby changes in the WDT time-out
for the development of many different sensors to mea- period can be measured. Calibrated temperature can
sure temperature. However, almost all of these are then be derived via Equation 1.
implemented as dedicated function sensors.
Microchip has now developed a method of combining EQUATION 1:
both rough temperature sensing and microcontroller
functionality on the same device, without the need for CC = COUNT*Scalar - Offset
external components. CC => calibrated count value
Preliminary analysis of the on-board WDT shows a C => COUNT; number of times TMR0 has rolled over
piece wise linear correlation between temperature and Offset => calibration offset due to voltage variance or
the time-out period of the WDT. The WDT time-out self-heating (determined by testing against a known
period appears to increase for a fixed VDD as tempera- fixed temperature)
ture increases. Tests indicate that this property may be Scalar => calibration scalar due to process or applica-
used for cost effective rough temperature sensing. tion design ("slope" determined by testing 2 known
The WDT module is similar across many families of temperatures)
microcontrollers from Microchip. This allows for a wide Process variations across lots, part families, and differ-
range of different applications to be developed using ent cores are expected. Since the WDT is clocked by
the same technique. an RC oscillator, these differences are expected to
Though actual application results may differ, an accu- influence the "slope" of the piece wise linear WDT
racy of up to +1°C may be seen. The linearity of the response (see Figure 5A and Figure 5B).
WDT is not guaranteed, but has been observed.
HARDWARE REQUIRED
Note: It is up to the user to test the device in the
system to determine accuracy/usability. 1. Voltage/temperature regulated power supply
2. Temperature-compensated oscillator or crystal
clock source

Note: If the INTRC is used for the reference

timer, no external clock components are
required to implement this design. For
greater accuracy, an external temperature-
compensated oscillator may be used.

 2001 Microchip Technology Inc. DS00720C-page 1

AN720
IMPLEMENTATION Firmware
Resources Used Once TMR0 and WDT are configured, both are
released to begin incrementing. A 16-bit register is
This design uses two timers and a 16-bit count register used to count the number of times TMR0 rolls over
to count the number of times TMR0 has rolled over (COUNT). TMR0 is allowed to continue incrementing
since the last WDT time-out. Two calibration constants and rolling over until the WDT times out. This COUNT
are used to negate the effects of self-heating and is then used as the input to Equation 1 to give a result-
process variation/application design. ant calibrated count.
1. Reference Timer (TMR0); Use caution when interrupts other than TMR0 (for
The reference timer may be implemented devices that have interrupts) are active during rough
using the INTRC or an external temperature- temperature measurements, to ensure capturing all
compensated clock source to drive TMR0. TMR0 rollover events. WDT time-outs are asynchro-
2. Measurement Timer (WDT); nous events. Missing a TMR0 rollover will add to the
The WDT is utilized as the measurement timer. error of the reading.
It is configured to use the on-board pre-scaler
A look-up table or algorithm may be used to convert the
that is set to a ratio of 1:8 in this example. A
calibrated count to Fahrenheit or Celsius for display.
ratio of 1:8 was chosen to allow the 16-bit count
register to capture usable TMR0 rollovers with- Figure 1 illustrates the flow diagram for this program.
out overflowing. This ratio also allows for a Appendix A is the source code listing.
granularity in the count register, small enough
to detect changes in temperature. Note: The part must not be put into SLEEP mode
during temperature measurements, as
Note: Users should test their code to determine SLEEP mode disables TMR0.
the appropriate prescaler ratio to use in
their application.

FIGURE 1: FIRMWARE FLOW DIAGRAM

RESET

Configure
TMR0 & WDT
No
WDT? Initialize

Start Timers
Yes

Temp.
No Normal WDT
Testing
WDT? Handler

No TMR0
Rollover?
Yes

WDT
Yes

Time-out
Service
Increment Routine
Counter

Apply count to
calibration equation

DS00720C-page 2  2001 Microchip Technology Inc.

 AN720
CALIBRATION To calculate the offset, the formula is:
Assigned Cal. COUNT Value = COUNT x Scalar - Offset
In using the WDT to measure temperature, calibration
of the microcontroller against system errors is required. Assume Assigned Value = 0
Since the WDT is piece wise linear with temperature, 0 = COUNT x Scalar - Offset
we know that the two major components of error are the Offset = COUNT x Scalar
Scalar (Slope) of the line and the "offset" of the line. Pro-
cess variations in the RC oscillator, which clocks the @ +25°C Offset = Uncal. COUNT x Scalar
WDT and the application design itself, will influence the 1140.0 = 475 x 2.4
value of the Scalar. Variations in operating voltage and Now Scalar = 2.4 and Offset = 1140.0
self-heating will produce similar variations in “offset”
(see Figure 2 through Figure 5B). EXAMPLE 2:
In order to calibrate a part to measure temperature,
To make a calibrated COUNT calculation @ 55°C:
both of these coefficients must be determined and
stored in memory for future use. Two dedicated mem- CC = COUNT x Scalar - Offset
ory locations (normally near the end of memory) are @ +55°C 192 = 555.0 x 2.4 - 1140.0
used to store them. Users should write their application
program to include a calibration mode that uses the
SOURCES OF ERROR
WDT temperature measurement mechanism, but out-
puts the uncalibrated count values onto the port pins. When taking temperature measurements, errors may
This program is then run against two known calibration be introduced into the calculations. The most common
temperatures. The difference in count values divided sources of errors are:
by the difference in known temperatures is the Scalar.
1. Insufficient soak time;
By assigning a calibrated COUNT value to one of the
A certain amount of time is required for any
two known calibration temperatures and solving
system to stabilize. The varying materials
Equation 1, the "offset" can be determined. In-Circuit
used typically require time to reach thermal
Serial Programming™ (ICSP) mode or Serial
equilibrium.
EEPROM can then be used to store the two calibration
values. 2. Insufficient acquisition time;
Total acquisition time is typically represented
All of the sources of error mentioned under that head- by the equation:
ing should also be taken into consideration when cali-
TAq = TSoak + TSample
brating.
TAq => acquisition time. Total time to make a
EXAMPLE 1: calibrated measurement.
TSoak => soak time to reach thermal equilibrium
Calibration example assuming:
TSample => time required to capture a number of
1. Fixed temperature-compensated VDD uncalibrated COUNTS and average the result of
2. Fixed temperature-compensated the raw data through a "debounce" algorithm
reference oscillator 3. Calibration errors;
3. Area of temperature interest: +25°C - +75°C Errors may be introduced by incorrectly deter-
4. Measured uncalibrated COUNTS @ +25°C mining the Scalar or Offset values. Both of
Calibration Point 1: COUNT = 475 decimal these equation terms are based on controlled
5. Measured uncalibrated COUNTS @ +75°C known temperatures.
Calibration Point 2: COUNT = 595 decimal 4. Sample error;
Since temperature does not change quickly
To calculate the Scalar (Slope), the formula is:
(i.e., in the milliseconds), typical applications
will apply an algorithm similar to "debounce"
Cal Point 2 - Cal Point 1
Scalar = that will filter out momentary spikes and steps
Temp Cal Point 2 - Temp Cal Point 1
in temperature readings.
5. Power supply;
595 - 475
Scalar = = 2.4 COUNT/°C Variances in power supply voltage will effect
+75°C - +25°C
the INTRC, external oscillator and WDT RC
Scalar = 2.4 COUNT/°C oscillator.
6. Reference oscillator;
Variances in the reference oscillator due to
process, voltage or temperature will affect
TMR0.

 2001 Microchip Technology Inc. DS00720C-page 3

AN720
COMMON USES EXPERIMENTAL DATA
Many designs typically use rough temperature data as The data in Figure 2 was collected using a sample of 8
trip points to indicate over-heating or operation below typical production PIC12C509A parts from the same
recommended minimum temperature specifications. manufacturing lot. A test board containing all eight
Other uses may include but are not limited to: parts was then given a soak time of thirty minutes at
1. Rough calibration of other hardware/systems/ each tested temperature. Five hundred uncalibrated
processes raw data COUNTS were then recorded and averaged
for each tested temperature to produce Figure 2.
2. Temperature hysteresis measurements
• Voltage was supplied and measured via a Top-
ward 3303D DC power supply and Fluke model
87 DMM, respectively.
• A Hart Scientific High Precision Bath Model 7025
with Hart Scientific Black Stack Temperature
Probe model 2560 provided the various different
temperatures.
• Data was captured using Hyperterminal running
on a Windows 95 configured PC.

FIGURE 2: UNCALIBRATED COUNT DATA (VDD = 5.0V)

605
585
counts

565
545
(counts)

525 Part 1
Un-calibrated

505 Part 2
485
Uncalibrated

Part 3
465
Part 4
445
Part 5
425
405 Part 6
385 Part 7
Part 8
0
-20

-10

10

20

30

40

50

60

70

Temp (°C)
Temp

DS00720C-page 4  2001 Microchip Technology Inc.

 AN720
Figure 3A illustrates the effect of variation in power
supply voltage on both the offset and slope of the
uncalibrated count data in Figure 2. Note for this exam-
ple, the data from all eight samples was averaged to
reduce complexity in the graph.

FIGURE 3A: RAW COUNT VARIANCE DUE TO POWER SUPPLY

Uncalibrated counts
1000.0000
950.0000
900.0000
Uncalibrated (counts)

850.0000 2.5 VDC

800.0000 3.0 VDC
750.0000
3.5 VDC
700.0000
650.0000 4.0 VDC
600.0000 4.5 VDC
550.0000 5.0 VDC
500.0000
450.0000
400.0000
10

20

30

40

50

60

70
-20

-10

Temp (°C)

 2001 Microchip Technology Inc. DS00720C-page 5

AN720
Figure 3B shows a subset of the power supply variance
data from Figure 3A. In Figure 3B, the temperature is
fixed at 25°C and the data has been expanded to show
the data from each unit individually.

FIGURE 3B: VARIANCE DUE TO POWER SUPPLY, BY UNIT

Uncalibrated Counts at 25°C

800

750 Part 1
Uncalibrated (counts)

Part 2
700 Part 3
Part 4
650
Part 5
600 Part 6
Part 7
550 Part 8

500
2.5 3 3.5 4 4.5 5
Power Supply Voltage

DS00720C-page 6  2001 Microchip Technology Inc.

 AN720
Figure 4 illustrates the standard deviation of the five
hundred uncalibrated count data points collected to
generate the uncalibrated count averages listed in
Figure 2. The three parts with the greatest deviation
are listed.

FIGURE 4: ACROSS RAW DATA POINTS (VDD = 5.0V)

Data Spread
points (counts)

30
datapoints

25
data

20
Real Units
rawraw

part2
of 500

15 part5
Std deviation500

part6
of

10
Std deviation

0
10

20

30

40

50

60

70

80

90

100

110
0
-20

-10

Temperature
Temperature (°C)

 2001 Microchip Technology Inc. DS00720C-page 7

AN720
Figure 5A and Figure 5B illustrate the calculated uncal-
ibrated “COUNTS per degree C” and “OFFSET” for
each of the eight tested parts.

FIGURE 5A: COUNTS/°C

COUNT/deg
COUNTS/Degree C
°C (V D D = 5.0V)

2.5

2.45
count/(°C)
COUNT/deg C

2.4

2.35

2.3
1 2 3 4 5 6 7 8
part

DS00720C-page 8  2001 Microchip Technology Inc.

 AN720
FIGURE 5B: OFFSET

OFFSET (VDD = 5.0V)

1300

1280
offset

1260

1240

1220
1 2 3 4 5 6 7 8
part

CONCLUSION MEMORY USAGE

The temperature dependence of the WDT timer oscilla- 101 words, program memory
tor is useful as a rough temperature measurement sys- 11 bytes, data memory
tem, however, variations due to process differences and
power supply will also have a significant effect on the
WDT. Therefore, temperature calibration of each sys-
tem for the slope and offset of the WDT/temperature
function will be required to obtain reasonable accuracy.

 2001 Microchip Technology Inc. DS00720C-page 9

AN720

Software License Agreement

The software supplied herewith by Microchip Technology Incorporated (the “Company”) for its PICmicro® Microcontroller is
intended and supplied to you, the Company’s customer, for use solely and exclusively on Microchip PICmicro Microcontroller prod-
ucts.
The software is owned by the Company and/or its supplier, and is protected under applicable copyright laws. All rights are reserved.
Any use in violation of the foregoing restrictions may subject the user to criminal sanctions under applicable laws, as well as to civil
liability for the breach of the terms and conditions of this license.
THIS SOFTWARE IS PROVIDED IN AN “AS IS” CONDITION. NO WARRANTIES, WHETHER EXPRESS, IMPLIED OR STATU-
TORY, INCLUDING, BUT NOT LIMITED TO, IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICU-
LAR PURPOSE APPLY TO THIS SOFTWARE. THE COMPANY SHALL NOT, IN ANY CIRCUMSTANCES, BE LIABLE FOR
SPECIAL, INCIDENTAL OR CONSEQUENTIAL DAMAGES, FOR ANY REASON WHATSOEVER.

APPENDIX A: SOURCE CODE

MPASM 02.30 Released TSTAT2~1.ASM 9-15-1999 13:06:10 PAGE 1

LOC OBJECT CODE LINE SOURCE TEXT

VALUE

00001
;*************************************************************************************
00002 ;This program demonstrates how the WDT and TMR0(reference timer) may be used for
00003 ;rough temperature measurements. No filtering/debounce or algorithm is applied on
00004 ;the raw data. The raw un-calibrated COUNTS are output to a PIC16C54C for transmittal
00005 ;to a PC. GP<1:0> are used for data communication and GP3 is used as an output
;enable.
00006 ;In typical applications, users will need to add code to cover WDT time out when not
00007 ;taking rough temperature measurements. WDT tracking register WDTSTAT bit 0 used to
00008 ;indicate if WDT timeouts are being used for rough temp measurements or in the normal
00009 ;application.
00010 ;
00011 ;
00012 ; Program: TSTAT2~1.ASM
00013 ; Revision Date: 9/7/99 Compatibility with MPlab 4.11
00014 ;
00015 ;
00016 ;
00017
;*************************************************************************************
00018
00019
00020 LIST P=PIC12C509A;, F=INHX8M
00021 #include "P12C509A.INC"
00001 LIST
00002 ; P12C509A.INC Standard Header File, Version 1.00 Microchip Technology, Inc.
00108 LIST
00022
0FFF 0FFE 00023 __CONFIG _MCLRE_OFF & _CP_OFF & _WDT_ON & _IntRC_OSC
00024
00025 ;;
00026 ; declare registers
00027
00028 ;Note *
00029 ; All core program variables in page 0
00030 ;
00031
00032 cblock 0x07 ;bank 0

DS00720C-page 10  2001 Microchip Technology Inc.

 AN720
00033
00000007 00034 T_COUNT:2 ;counter for # of times tmr0 rolls (lo/hi byte)
00000009 00035 SCREEN ;screen register for tmr0 roll over
0000000A 00036 DUMP ;holding register
0000000B 00037 BIT_COUNT ;# of bits to be sent
0000000C 00038 WDTSTAT ;status register of wdt being used in
00039 ;temperature or normal application mode
00040
0000000D 00041 TEMP6 ;temp register used by routines
0000000E 00042 TEMP7 ;
0000000F 00043 TEMP8 ;
00044
00045 endc
00046 ;
00047 ;
00048 ;;
00049
0000 00050 org 0x00

 2001 Microchip Technology Inc. DS00720C-page 11

AN720
MPASM 02.30 Released TSTAT2~1.ASM 9-15-1999 13:06:10 PAGE 2

LOC OBJECT CODE LINE SOURCE TEXT

VALUE

0000 0025 00051 movwf OSCCAL ;load osc calibration for IntRC
0001 0C01 00052 movlw b’00000001’ ;clear bus driver latch
0002 0026 00053 movwf GPIO ;
0003 0CFF 00054 movlw b’11111111’ ;disable bus drivers
0004 0006 00055 tris GPIO ;
0005 04A3 00056 bcf STATUS,PA0 ;set bank pointers to page 0
0006 04A4 00057 bcf FSR,5 ;set address map to page 0
0007 04C4 00058 bcf FSR,6
0008 0A09 00059 goto Resetvector
00060
00061 ;;
00062 ; main memory
00063
00064
00065 ;reset vector
0009 00066 Resetvector ;
00067
0009 0C8B 00068 movlw b’10001011’ ;load option register word
000A 0002 00069 option ;
00070
00071 ;check for power on reset
000B 0783 00072 btfss STATUS,NOT_TO ;must test condition of TO=1
000C 0A1B 00073 goto Wdtest ;to tell if power on reset.
00074 ;there is no sleep mode support.
00075 ;if not a POR, must be a WDT reset.
00076 ;jump to the POR or WDT routines.
00077
00078 ;;
00079 ;power on reset handler
000D 00080 P_reset ;initializtion routine
00081
000D 0C00 00082 movlw 0x00 ;clear counters for measurement
000E 0027 00083 movwf T_COUNT ;
000F 0028 00084 movwf T_COUNT+1 ;
0010 002C 00085 movwf WDTSTAT ;clear wdt tracking register
00086
00087
0011 050C 00088 bsf WDTSTAT,0 ;set tracking register bit 0 to
00089 ;indicate that wdt timeouts are being
00090 ;used for rough temp measurements.
00091 ;This register is typically set elsewhere
00092 ;in a real application but for the
00093 ;purposes of this example, is set here.
00094
00095
00096 ;init timers
0012 0004 00097 clrwdt ;initialize wdt
0013 0C00 00098 movlw 0x00 ;initialize timer0
0014 0021 00099 movwf TMR0 ;and allow to free run
00100
0015 0A16 00101 goto $+1 ;delay to let tmr0 go past
0016 0A17 00102 goto $+1 ;screen point
0017 0A18 00103 goto $+1 ;

DS00720C-page 12  2001 Microchip Technology Inc.

 AN720
MPASM 02.30 Released TSTAT2~1.ASM 9-15-1999 13:06:10 PAGE 3

LOC OBJECT CODE LINE SOURCE TEXT

VALUE

0018 0A19 00104 goto $+1 ;

0019 0A1A 00105 goto $+1 ;
00106
001A 0A57 00107 goto Countimer ;branch to counting routine
00109 ;;
00110 ;test what type of interupt
001B 00111 Wdtest
00112 ;test for wdt in temp measure or normal mode
001B 070C 00113 btfss WDTSTAT,0 ;test wdt mode tracking bit.
00114 ;if =1 then is in temperature mode.
00115 ;if =0 then is in normal app mode.
001C 0A64 00116 goto Nontempwdt ;vector to normal app wdt handler here.
00117 ;
00118
00119 ;wdt temperature handler
001D 00120 Wdtvector
00121 ;print raw uncalibrated data
00122
001D 00123 Raw
001D 0C00 00124 movlw b’00000000’ ;zero communications bus and wait
001E 0026 00125 movwf GPIO ;to transfer data
001F 0CFF 00126 movlw b’11111111’ ;while looking for output enables
0020 0006 00127 tris GPIO ;
00128
00129
0021 00130 OE ;test to see if output is enabled
00131
0021 0004 00132 clrwdt
0022 0206 00133 movf GPIO,W ;sample portb
0023 0E08 00134 andlw b’00001000’ ;mask unwanted bits
0024 002A 00135 movwf DUMP ;move to temporary register for test
0025 0C08 00136 movlw b’00001000’ ;do test
0026 008A 00137 subwf DUMP,W ;
0027 0743 00138 btfss STATUS,Z ;test carry bit to see if OE.
0028 0A21 00139 goto OE ;cannot proceed to send data if no OE
00140 ;
00141
0029 00142 Print ;setup for xfering data
00143
0029 0C00 00144 movlw b’00000000’ ;clear data latch
002A 0026 00145 movwf GPIO ;
002B 0CFD 00146 movlw b’11111101’ ;set tris register
002C 0006 00147 tris GPIO ;
002D 0C11 00148 movlw 0x11 ;setup bit counter
002E 002B 00149 movwf BIT_COUNT ;to send 2 bytes of data
00150 ;
00151
002F 00152 Clock_en ;once clock setup, check for
00153 ;complete sending of all 2 bytes
00154
002F 02EB 00155 decfsz BIT_COUNT,F ;test if 16 bits sent
0030 0A32 00156 goto Senddata ;

 2001 Microchip Technology Inc. DS00720C-page 13

AN720
MPASM 02.30 Released TSTAT2~1.ASM 9-15-1999 13:06:10 PAGE 4

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VALUE

0031 0A62 00157 goto Softreset ;reinit to take another measurement

00158 ;
00159
00160
0032 00161 Senddata ;must figure out whether sending upper or
00162 ;lower byte
00163
0032 0C09 00164 movlw 0x09 ;test if upper byte or lower byte
0033 008B 00165 subwf BIT_COUNT,W ;
0034 0603 00166 btfsc STATUS,C ;check to see iv value is zero
0035 0A37 00167 goto Lower_8 ;jump to send lo byte
0036 0A47 00168 goto Upper_8 ;jump to send hi byte
00169 ;
00170
0037 00171 Lower_8
00172
0037 00173 Test_lo ;check for clock strobe from receiving
00174 ;unit. Clock must be lo. Then go hi.
00175
0037 0004 00176 clrwdt
0038 0206 00177 movf GPIO,W ;test for clock lo to see if ready
0039 002A 00178 movwf DUMP ;put in temp register
003A 060A 00179 btfsc DUMP,0 ;
003B 0A37 00180 goto Test_lo ;
00181 ;
00182
003C 00183 Test_hi ;check for clock strobe. Send only on lo to
00184 ;hi clock transition
00185
003C 0004 00186 clrwdt
003D 0206 00187 movf GPIO,W ;test for clock hi to see if send
003E 002A 00188 movwf DUMP ;put in temp register
003F 070A 00189 btfss DUMP,0 ;
0040 0A3C 00190 goto Test_hi ;
00191 ;
00192
0041 00193 Lower_8_send ;xmit data 1 bit at a time by rotating thru
00194 ;carry and checking it’s value
00195
0041 0426 00196 bcf GPIO,1 ;reset data line
0042 0327 00197 rrf T_COUNT,F ;rotate into carry to test for 1 or 0
0043 0603 00198 btfsc STATUS,C ;test for 1 or 0
0044 0526 00199 bsf GPIO,1 ;clear sending bit
0045 0000 00200 nop
00201 ;
00202
00203
0046 0A2F 00204 goto Clock_en ;return to send next data bit
00205 ;
00206 ;
00207
00208
0047 00209 Upper_8

DS00720C-page 14  2001 Microchip Technology Inc.

 AN720
MPASM 02.30 Released TSTAT2~1.ASM 9-15-1999 13:06:10 PAGE 5

LOC OBJECT CODE LINE SOURCE TEXT

VALUE

00210
00211
0047 00212 Test_lo_u ;check for clock strobe from receiving
00213 ;unit. Clock must be lo. Then go hi.
00214
0047 0004 00215 clrwdt
0048 0206 00216 movf GPIO,W ;test for clock lo to see if ready
0049 002A 00217 movwf DUMP ;put in temp register
004A 060A 00218 btfsc DUMP,0 ;
004B 0A47 00219 goto Test_lo_u ;
00220 ;
00221
004C 00222 Test_hi_u ;check for clock strobe. Send only on lo to
00223 ;hi clock transition
00224
004C 0004 00225 clrwdt
004D 0206 00226 movf GPIO,W ;test for clock hi to see if send
004E 002A 00227 movwf DUMP ;put in temp register
004F 070A 00228 btfss DUMP,0 ;
0050 0A4C 00229 goto Test_hi_u ;
00230 ;
00231
0051 00232 Upper_8_send ;xmit data 1 bit at a time by rotating thru
00233 ;carry and checking it’s value
00234
0051 0426 00235 bcf GPIO,1 ;reset data line
0052 0328 00236 rrf T_COUNT+1,F ;rotate into carry to test for 1 or 0
0053 0603 00237 btfsc STATUS,C ;test for 1 or 0
0054 0526 00238 bsf GPIO,1 ;clear sending bit
0055 0000 00239 nop
00240 ;
00241
00242
0056 0A2F 00243 goto Clock_en ;return to send next data
00244 ;
00245 ;
00246
00247
00248
00249 ;;
00250 ;counting routine
0057 00251 Countimer
00252
00253 ;test to see if timer0 rolls over
0057 00254 Tmr0_byte ;count the number of tmr0’s
00255
0057 0201 00256 movf TMR0,W ;copy tmr0 value to working register
0058 0029 00257 movwf SCREEN ;
0059 0C0A 00258 movlw 0x0A ;load masking value
005A 0089 00259 subwf SCREEN,W ;subtraction to screen for FF -> 0
00260 ;transition in tmr0
005B 0603 00261 btfsc STATUS,C ;test carry flag for
005C 0A57 00262 goto Tmr0_byte ;loop back and test for FF -> 0

 2001 Microchip Technology Inc. DS00720C-page 15

AN720
MPASM 02.30 Released TSTAT2~1.ASM 9-15-1999 13:06:10 PAGE 6

LOC OBJECT CODE LINE SOURCE TEXT

VALUE

00263
00264 ;increment count lo byte
005D 02A7 00265 incf T_COUNT,F ;incr count (lo byte) once for every
00266 ;tmr0 roll over
005E 0743 00267 btfss STATUS,Z ;test zero flag to see if need to
00268 ;increment hi byte of count (16 bit counter)
005F 0A57 00269 goto Tmr0_byte ;loop back and test until wdt reset
00270
00271 ;increment count hi byte
0060 02A8 00272 incf T_COUNT+1,F ;incr count (hi byte) once for every
00273 ;T_COUNT roll over
0061 0A57 00274 goto Tmr0_byte ;loop back and test until wdt reset
00275
00276
00277 ;;
00278 ;soft reset routine
0062 00279 Softreset ;clear conditions and reset for another
00280 ;rough temperature measurement
00281
0062 0004 00282 clrwdt ;clear the wdt
0063 0A0D 00283 goto P_reset ;return to reset checks
00284
00285
00286 ;;
00287 ;non-temp measurement mode wdt handler
0064 00288 Nontempwdt
0064 0A64 00289 goto $ ;normal mode wdt timeout handler.
00290 ;since only running in rough temp measure
00291 ;mode, routine is just a place holder.
00292
00293
00294 ;;
00295 end

MEMORY USAGE MAP (’X’ = Used, ’-’ = Unused)

0000 : XXXXXXXXXXXXXXXX XXXXXXXXXXXXXXXX XXXXXXXXXXXXXXXX XXXXXXXXXXXXXXXX

0040 : XXXXXXXXXXXXXXXX XXXXXXXXXXXXXXXX XXXXX----------- ----------------
0FC0 : ---------------- ---------------- ---------------- ---------------X

All other memory blocks unused.

Program Memory Words Used: 101

Program Memory Words Free: 923

Errors : 0
Warnings : 0 reported, 0 suppressed
Messages : 0 reported, 0 suppressed

DS00720C-page 16  2001 Microchip Technology Inc.

“All rights reserved. Copyright © 2001, Microchip Technology Trademarks
Incorporated, USA. Information contained in this publication
regarding device applications and the like is intended through The Microchip name, logo, PIC, PICmicro, PICMASTER, PIC-
suggestion only and may be superseded by updates. No rep- START, PRO MATE, KEELOQ, SEEVAL, MPLAB and The
resentation or warranty is given and no liability is assumed by Embedded Control Solutions Company are registered trade-
Microchip Technology Incorporated with respect to the accu- marks of Microchip Technology Incorporated in the U.S.A. and
racy or use of such information, or infringement of patents or other countries.
other intellectual property rights arising from such use or oth-
Total Endurance, ICSP, In-Circuit Serial Programming, Filter-
erwise. Use of Microchip’s products as critical components in
Lab, MXDEV, microID, FlexROM, fuzzyLAB, MPASM,
life support systems is not authorized except with express
MPLINK, MPLIB, PICDEM, ICEPIC, Migratable Memory,
written approval by Microchip. No licenses are conveyed,
FanSense, ECONOMONITOR, SelectMode and microPort
implicitly or otherwise, under any intellectual property rights.
are trademarks of Microchip Technology Incorporated in the
The Microchip logo and name are registered trademarks of
U.S.A.
Microchip Technology Inc. in the U.S.A. and other countries.
All rights reserved. All other trademarks mentioned herein are
Serialized Quick Term Programming (SQTP) is a service mark
the property of their respective companies. No licenses are
of Microchip Technology Incorporated in the U.S.A.
conveyed, implicitly or otherwise, under any intellectual prop-
erty rights.” All other trademarks mentioned herein are property of their
respective companies.

© 2001, Microchip Technology Incorporated, Printed in the

U.S.A., All Rights Reserved.

Microchip received QS-9000 quality system

certification for its worldwide headquarters,
design and wafer fabrication facilities in
Chandler and Tempe, Arizona in July 1999. The
Company’s quality system processes and
procedures are QS-9000 compliant for its
PICmicro® 8-bit MCUs, KEELOQ® code hopping
devices, Serial EEPROMs and microperipheral
products. In addition, Microchip’s quality
system for the design and manufacture of
development systems is ISO 9001 certified.

 2001 Microchip Technology Inc. DS00720C - page 17

 WORLDWIDE SALES AND SERVICE
AMERICAS New York ASIA/PACIFIC (continued)
150 Motor Parkway, Suite 202
Corporate Office Korea
Hauppauge, NY 11788
2355 West Chandler Blvd. Microchip Technology Korea
Tel: 631-273-5305 Fax: 631-273-5335
Chandler, AZ 85224-6199 168-1, Youngbo Bldg. 3 Floor
Tel: 480-792-7200 Fax: 480-792-7277 San Jose Samsung-Dong, Kangnam-Ku
Technical Support: 480-792-7627 Microchip Technology Inc. Seoul, Korea
Web Address: http://www.microchip.com 2107 North First Street, Suite 590 Tel: 82-2-554-7200 Fax: 82-2-558-5934
San Jose, CA 95131
Rocky Mountain Singapore
Tel: 408-436-7950 Fax: 408-436-7955
2355 West Chandler Blvd. Microchip Technology Singapore Pte Ltd.
Chandler, AZ 85224-6199 Toronto 200 Middle Road
Tel: 480-792-7966 Fax: 480-792-7456 6285 Northam Drive, Suite 108 #07-02 Prime Centre
Mississauga, Ontario L4V 1X5, Canada Singapore, 188980
Atlanta Tel: 905-673-0699 Fax: 905-673-6509 Tel: 65-334-8870 Fax: 65-334-8850
500 Sugar Mill Road, Suite 200B
Taiwan
Atlanta, GA 30350
Microchip Technology Taiwan
Tel: 770-640-0034 Fax: 770-640-0307 ASIA/PACIFIC 11F-3, No. 207
Austin Australia Tung Hua North Road
Analog Product Sales Microchip Technology Australia Pty Ltd Taipei, 105, Taiwan
8303 MoPac Expressway North Suite 22, 41 Rawson Street Tel: 886-2-2717-7175 Fax: 886-2-2545-0139
Suite A-201 Epping 2121, NSW
Austin, TX 78759 Australia
Tel: 512-345-2030 Fax: 512-345-6085 Tel: 61-2-9868-6733 Fax: 61-2-9868-6755 EUROPE
Boston China - Beijing Denmark
2 Lan Drive, Suite 120 Microchip Technology Beijing Office Microchip Technology Denmark ApS
Westford, MA 01886 Unit 915 Regus Business Centre
Tel: 978-692-3848 Fax: 978-692-3821 New China Hong Kong Manhattan Bldg. Lautrup hoj 1-3
Boston No. 6 Chaoyangmen Beidajie Ballerup DK-2750 Denmark
Analog Product Sales Beijing, 100027, No. China Tel: 45 4420 9895 Fax: 45 4420 9910
Unit A-8-1 Millbrook Tarry Condominium Tel: 86-10-85282100 Fax: 86-10-85282104
France
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Concord, MA 01742 Microchip Technology Shanghai Office Parc d’Activite du Moulin de Massy
Tel: 978-371-6400 Fax: 978-371-0050 Room 701, Bldg. B 43 Rue du Saule Trapu
Chicago Far East International Plaza Batiment A - ler Etage
333 Pierce Road, Suite 180 No. 317 Xian Xia Road 91300 Massy, France
Itasca, IL 60143 Shanghai, 200051 Tel: 33-1-69-53-63-20 Fax: 33-1-69-30-90-79
Tel: 630-285-0071 Fax: 630-285-0075 Tel: 86-21-6275-5700 Fax: 86-21-6275-5060
Germany
Dallas Hong Kong Arizona Microchip Technology GmbH
4570 Westgrove Drive, Suite 160 Microchip Asia Pacific Gustav-Heinemann Ring 125
Addison, TX 75001 RM 2101, Tower 2, Metroplaza D-81739 Munich, Germany
Tel: 972-818-7423 Fax: 972-818-2924 223 Hing Fong Road Tel: 49-89-627-144 0 Fax: 49-89-627-144-44
Dayton Kwai Fong, N.T., Hong Kong
Germany
Two Prestige Place, Suite 130 Tel: 852-2401-1200 Fax: 852-2401-3431
Analog Product Sales
Miamisburg, OH 45342 India Lochhamer Strasse 13
Tel: 937-291-1654 Fax: 937-291-9175 Microchip Technology Inc. D-82152 Martinsried, Germany
Detroit India Liaison Office Tel: 49-89-895650-0 Fax: 49-89-895650-22
Tri-Atria Office Building Divyasree Chambers
Italy
32255 Northwestern Highway, Suite 190 1 Floor, Wing A (A3/A4)
Arizona Microchip Technology SRL
Farmington Hills, MI 48334 No. 11, O’Shaugnessey Road
Centro Direzionale Colleoni
Tel: 248-538-2250 Fax: 248-538-2260 Bangalore, 560 025, India
Palazzo Taurus 1 V. Le Colleoni 1
Tel: 91-80-2290061 Fax: 91-80-2290062
Los Angeles 20041 Agrate Brianza
18201 Von Karman, Suite 1090 Japan Milan, Italy
Irvine, CA 92612 Microchip Technology Intl. Inc. Tel: 39-039-65791-1 Fax: 39-039-6899883
Tel: 949-263-1888 Fax: 949-263-1338 Benex S-1 6F
United Kingdom
3-18-20, Shinyokohama
Mountain View Arizona Microchip Technology Ltd.
Kohoku-Ku, Yokohama-shi
Analog Product Sales 505 Eskdale Road
Kanagawa, 222-0033, Japan
1300 Terra Bella Avenue Winnersh Triangle
Tel: 81-45-471- 6166 Fax: 81-45-471-6122
Mountain View, CA 94043-1836 Wokingham
Tel: 650-968-9241 Fax: 650-967-1590 Berkshire, England RG41 5TU
Tel: 44 118 921 5869 Fax: 44-118 921-5820

01/30/01

All rights reserved. © 2001 Microchip Technology Incorporated. Printed in the USA. 2/01 Printed on recycled paper.
Information contained in this publication regarding device applications and the like is intended through suggestion only and may be superseded by
updates. It is your responsibility to ensure that your application meets with your specifications. No representation or warranty is given and no liability is
assumed by Microchip Technology Incorporated with respect to the accuracy or use of such information, or infringement of patents or other intellectual
property rights arising from such use or otherwise. Use of Microchip’s products as critical components in life support systems is not authorized except with
express written approval by Microchip. No licenses are conveyed, implicitly or otherwise, except as maybe explicitly expressed herein, under any intellec-
tual property rights. The Microchip logo and name are registered trademarks of Microchip Technology Inc. in the U.S.A. and other countries. All rights
reserved. All other trademarks mentioned herein are the property of their respective companies.

DS00720C-page 18  2001 Microchip Technology Inc.