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    Working Principle of Scanning Electron Microscope: January 2018

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    aleeza
    This document discusses the working principle of a scanning electron microscope (SEM). It describes the key components of an SEM, including the electron gun, electromagnetic lenses, scanning coils, sample chamber, detectors, and vacuum chamber. It explains how an SEM forms images by scanning a focused beam of electrons across a sample and detecting signals from electrons that interact with the sample. The document also outlines how SEM can be used to characterize textile fibers based on surface features and morphology visible in the SEM images.

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    Working Principle of Scanning Electron Microscope: January 2018

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    aleeza
    35 views34 pages
    This document discusses the working principle of a scanning electron microscope (SEM). It describes the key components of an SEM, including the electron gun, electromagnetic lenses, scanning coils, sample chamber, detectors, and vacuum chamber. It explains how an SEM forms images by scanning a focused beam of electrons across a sample and detecting signals from electrons that interact with the sample. The document also outlines how SEM can be used to characterize textile fibers based on surface features and morphology visible in the SEM images.

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    WORKINGPRINCIPLEOFSCANNINGELECTRONMICROSCOPE

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    This document discusses the working principle of a scanning electron microscope (SEM). It describes the key components of an SEM, including the electron gun, electromagnetic lenses, scanning coils, sample chamber, detectors, and vacuum chamber. It explains how an SEM forms images by scanning a focused beam of electrons across a sample and detecting signals from electrons that interact with the sample. The document also outlines how SEM can be used to characterize textile fibers based on surface features and morphology visible in the SEM images.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
    35 views34 pages

    Working Principle of Scanning Electron Microscope: January 2018

    Uploaded by

    aleeza
    This document discusses the working principle of a scanning electron microscope (SEM). It describes the key components of an SEM, including the electron gun, electromagnetic lenses, scanning coils, sample chamber, detectors, and vacuum chamber. It explains how an SEM forms images by scanning a focused beam of electrons across a sample and detecting signals from electrons that interact with the sample. The document also outlines how SEM can be used to characterize textile fibers based on surface features and morphology visible in the SEM images.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Download as pdf or txt
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    WORKING PRINCIPLE OF SCANNING ELECTRON MICROSCOPE

    Presentation · January 2018

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    Taame Berhanu
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    DIRE DAWA INSTITUTE OF TECHNOLOGY

    DIRE DAWA UNIVERSITY

    WORKING PRINCIPLE OF SCANNING


    ELECTRON MICROSCOPE

    BY : TAAME BERHANU
    2018
    FIBER CHARACTERIZATION USING
    SCANNING ELECTRON MICROSCOPY (SEM)
    OUTLINE
     Introduction
     Components, and working principles of SEM
     Salient futures of SEM
     Data analysis by SEM
     Textile fiber characterization by SEM
     Advantages and limitations of SEM?
    Overall view of SEM
    A. INTRODUCTION
    Designed by Stinzing and Knoll in Germany in the early 25s
    1965.

     Type of electron microscope that images the sample by


    scanning it with high energy beam of electrons .
    What can we study in a SEM?
    o Topography and morphology(texture)
    o Chemistry(chemical composition)
    o Crystallography
    o Orientation of materials
    Comparing light vs electron microscope
    Light microscope Electro microscope
    The source of illumination The ambient light source is Electrons are used to “see”
    light for the microscope light is replaced by an
    electron gun built into the
    column

    The lens type Glass lenses Electromagnetic lenses

    Magnification Magnification is changed by Focal length is charged by


    method moving the lens changing the current through
    the lens

    Viewing the Eyepiece (ocular) Fluorescent screen or


    sample digital camera

    Use of vacuum No vacuum Entire electron path from


    gun to camera must be
    under vacuum
    Comparing TEM vs SEM
    TEM SEM

    Beam focused to fine point;


    Electron Beam Broad, static beams sample is scanned line by
    line

    Accelerating voltage much


    Voltages Needed Accelerating voltage high r lower; not necessary to
    penetrate the specimen

    Wide range of specimens


    Interaction of the
    Specimen must be very thin allowed; simplifies
    beam electrons
    sample preparation

    Electrons must pass through Information needed is


    Imaging and be transmitted by the collected near the surface
    specimen of the specimen
    Transmitted electrons are
    Image Rendering Beam is scanned along the
    collectively focused by the
    surface of the sample to
    objective lens and magnified
    build up the image
    to create a real image
    COMPONENTS
    Tungsten filament
    2400oC
    2. LENSES
     Condenser lens –determines the number of electrons
    in the beam which hit the sample by reducing the
    diameter of the electron beam.
     Objective lenses -changes the position of the point
    at which the electron are focused on the sample.
    3. SCANNING COILS
     Are used to raster/scan the e-beam across the sample
    surface
     The e-beam can be scanned in a rectangular raster across
    the surface of the sample by means of a series of “scan
    coils” situated above the objective lens.

    4. SAMPLE CHAMBER
    A place where the sample was mounted on.
    5. DETECTORS
     detect the secondary and backscattered electrons.

    Have +ve charge


    6. VACUUM CHAMBER

     Used to protect the electronic beam from interference with air.

    7. Aperture
     control the number of electrons which reach the sample.

     control the final convergence angle of the electron beam onto


    the sample
    -ve
    +ve
    SIGNALS FROM THE SAMPLE
    1. Secondary electrons (SE):
    Low energy electrons, high resolution
    Surface signal dependent on curvature
    2. Backscattered electrons (BSE):
    High energy electrons
    “Bulk” signal dependent on atomic number
    3. X-rays: chemistry
    Longer recording times are needed
    Absorbed e- tells the chemistry of the sample
    SCATTERED ELECTRONS
    X-ray
    photon
    HOW THE IMAGE WILL CRATED?
    Adjusted by current flow /voltage flow
    Magnification
    RESOLUTION IS DEPEND UP ON?

     Size of the electron spot &wavelength of the electrons .

     size of the interaction volume (material interacts with the


    electron beam)
    SAMPLE PREPARATION

     1) Remove all water, solvents, or other materials that


    could vaporize while in the vacuum.
     2) Firmly mount all the samples.

     3) Non-metallic samples, such as plants,

    and ceramics, should be coated with


    electrically conductive materials.
    Image disturbance and causes
    Image disturbance Cause
    Lack of sharpness  Improper accelerating voltage setting
     Instability of gun emission due to low heat energy
     Improper setting of objective aperture
     Improper focal length
     Too large magnification
     Specimen charge up and magnetization
    Low image quality  Improper accelerating voltage setting
     Improper contrast and brightness
     Improper specimen preparation process
     Improper position relation between specimen and detector
    Noise Improper accelerating voltage setting
    Change up of specimen surface
    Mechanical vibration
    Image distortion & o Electron beam damage
    deformation o Determination of specimen during preparation
    o Specimen charging up
    C. SALIENT FUTURES OF SEM
     High resolution 50 to 100 nm and magnification
    ranging from 20X to approximately 30,000X
     3-D Topographical imaging due to very narrow
    e- beam & large depth of field yielding
     Compatible with PC technologies and softwares
     Fast Analysing
     Store data in digital form
     most powerful and popular for surface
    characterization.
     uses electrons to form image rather than light.
     relatively easy to prepare sample.
    Surface characterization of dry solid materials
     Topography
    The surface features of an object and its texture (hardness,
    reflectivity… etc.)
     Morphology
    The shape and size of the particles making up the object (strength,
    defects in IC and chips...etc.)
     Composition
    The elements and compounds that the object is composed of and the
    relative amounts of them (melting point, reactivity, hardness...etc.)
     Crystallographic Information
    How the grains are arranged in the object (conductivity, electrical
    properties, strength...etc.)
    E. Textile fiber characterization by SEM
    CHARACTERIZATION OF WOOL FIBER BY SEM

     Wool have Cylindrical , irregular, rough surface,


    scale like structure when we see its longitudinal
    structure under SEM.
     Nearly round or circular cross –sectional view

    Longitudinal view Cross-sectional view


    CHARACTERIZATION OF COTTON FIBER BY SEM

     Ribbon like with convolutions longitudinal structure


     Have Elliptical been shaped stracture when we see its cross-sectional view

    Longitudinal view Cross-sectional view


    CHARACTERIZATION OF POLYESTER FIBER
    BY SEM
     uniform diameter & rod like appearance of longitudinal view
     Circular cross-sectional view

    Longitudinal view Cross-sectional view


    Limitations
     Sample must fit into the microscope
    chamber
     Doesn't work with out vacuum
     Sample should coat with electrically
    conductive chemical.
     Sample must be dry solid .
     bulky and complex instruments as a result
    needs special experts.
    Ne----Advantage is listed
    above( future)
    View publication stats

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